United States
SGS North America
14 Culnen Drive, Lower Level, 08876, Branchburg, NJ, United States
A2LA|1935.03ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
2
Locations
10
Contact this laboratory
Register record
- A2LACollected
- 1935.03Active
Certificates and scope
1A2LA
ISO/IEC 17025
Active1935.03
Accredited scope, certificate 1935.03
| Discipline | Method | Matrix | Range |
|---|---|---|---|
| electrical | - | - | - |
| electrical | CTIA Test Plan for Wireless Device Over-the-Air Performance 1, 2; CTIA-01.20-Test-Methodology-SISO-Anechoic-Chamber 2; CTIA 01.40 Test Methodology, MIMO Multi-Probe Anechoic Chamber 2; CTIA-01.51-Location-Based-Technologies; Verizon OTA Verizon OTA Performance Test Plan; Verizon Location Determination Test Plan; Verizon LTE-LBS Performance Test Plan; Verizon OTA Radiated Performance for CDMA and LTE MM Test Plan; Verizon LTE OTA Radiated Performance Test Plan; Verizon 5G_NR_FR1_RFOTA_TestPlan; DISH UE Requirements Specification; TMO Radiated Performance TRD (T-Mobile); 3GPP TR 25.914; 3GPP TS 37.544; 3GPP TS 34.114 | Wireless device | - |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.
Location
Other Locations
9 other sites in this organization
Labs with overlapping accredited scope in United States
- Element Materials Technology Washington DCColumbia, MD · ~240 kmA2LAShares 1 accredited materialWireless device
- Advanced Test Management and Certification Labs,Lexington, KY · ~891 kmA2LAShares 1 accredited materialWireless device
- Element Materials Technology San Jose, CASan Jose, CA · ~4,048 kmA2LAShares 1 accredited materialWireless device
Accreditation data collected from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.