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Japan

FIME JAPAN Co.,

ST Building 6F, 1-2-4, ShibaKoen, Minato-ku, Tokyo, 105-0011, Japan, Tokyo, Japan

A2LA|6036.01ISO/IEC 17025Register refreshed 2026-09-25
Certificates
1
Scope items
4
Standards
0
Locations
1

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Register record

A2LARefreshed
6036.01Active

Accredited standards

We could not match the method references in this lab’s scope to published test standard numbers. The full scope as published is below.

Scope as published by A2LA

4 lines
A2LA

ISO/IEC 17025

Active

6036.01

The scope document we hold says it is valid until 2026-11-30.

View scope

Accredited scope, certificate 6036.01

LineDisciplineMethodMatrixRange
1electricalISO/IEC 17025:2017; EMV Contactless Interface Specification; NFC Forum Analog Technical Specification; NFC Forum Digital Protocol Technical Specification; NFC Forum LLCP Technical Specification; NFC Forum SNEP Technical SpecificationPayment Cards; Smart Cards; Mobile Cards; Mobile Handsets; Payment Terminals; Tags-
2electricalNFC Forum Type2 Tag Technical Specification; NFC Forum Test Cases for Type2 Tag; Type2 Tag Operation; NFC Forum Type3 Tag Technical Specification; NFC Forum Test Cases for Type3 Tag; Type3 Tag Operation; NFC Forum Type4 Tag Technical Specification; NFC Forum Test Cases for Type4 Tag; Type4 Tag Operation; NFC Forum Type5 Tag Technical Specification; NFC Forum Test Cases for Type5 Tag; Type5 Tag Operation; NFC Forum Analog Technical Specification; NFC Forum Test Cases for Tag Performance; EMV Integrated Circuit Card Specifications for Payment Systems Book 1 to 4; EMV Contactless Interface Specification; EMVCo Contactless Type Approval PCD Analogue Test Bench and Test Case Requirements; EMVCo Contactless Type Approval PCD Digital Test Cases; EMVCo Contactless Type Approval PCD Pre-Validation Test; EMV Contactless Specifications for Payment Systems Book C-2 Kernel 2 Specification; EMV Contactless Specifications for Payment Systems Book C-4 Kernel 4 Specification; EMV Contactless Specifications for Payment Systems Book C-5 Kernel 5 Specification; EMV Contactless Specifications for Payment Systems Book C-6 Kernel 6 Specification--
3electricalMasterCard PayPass Performance Measurement; MasterCard PayPass Test Procedure for Performance Testing; MasterCard Acceptance Devices Approval Process Contactless Integration Testing for Acceptance Devices; MasterCard PayPass – Combination Test + Addendum to Combination Test Procedure; MasterCard Contactless Reader Specification; JCB Contactless IC Terminal Specification; JCB Contactless Terminal Functional Test Plan for JCB Proprietary; American Express Expresspay Terminal Specification; Discover Global Network D-PAS Connect Terminal Application Contactless Specification; Discover Global Network: D-PAS Connect/C6 Terminal Application Contactless Functional Test Plan; Discover Network Test Plan for Contactless Payment Devices (PCD & PICC) - Cross Testing Part--
4electrical
For the tests to which this accreditation applies, please refer to the laboratory’s Electrical Scope of Accreditation. Accredited Laboratory A2LA has accredited FIME JAPAN CO., LTD. Tokyo, Japan for technical competence in the field of Electrical Testing This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017). Presented this 14th day of November 2024. _______________________ Mr. Trace McInturff, Vice President, Accreditation Services For the Accreditation Council Certificate Number 6036.01 Valid to November 30, 2026

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

ST Building 6F, 1-2-4, ShibaKoen, Minato-ku, Tokyo, 105-0011, Japan, Tokyo, JP

35.67686, 139.76389

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Accreditation data refreshed from the A2LA register on .

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