China
GRG Metrology & Test Group Co.,
No. 1301 Guanguang Road, Xinlan Community, Guanlan Street, Longhua District, Shenzhen, 518110, People's Republic of China, Shenzhen, China
A2LA|2861.01ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
6
Locations
1
Contact this laboratory
Register record
- A2LACollected
- 2861.01Active
Certificates and scope
1A2LA
ISO/IEC 17025
Active2861.01
Accredited scope, certificate 2861.01
| Discipline | Method | Matrix | Range |
|---|---|---|---|
| electrical | MIC Article 2, Paragraph 1 Item (11)-3; MIC Article 2, Paragraph 1 Item (11)-4; MIC Article 2, Paragraph 1 Item (11)-7; MIC Article 2, Paragraph 1 Item (11)-8; MIC Article 2, Paragraph 1 Item (11)-11; MIC Article 2, Paragraph 1 Item (11)-19; MIC Article 2, Paragraph 1 Item (11)-21; MIC Article 2, Paragraph 1 Item (11)-30; MIC Article 2, Paragraph 1 Item (11)-34; MIC Article 2, Paragraph 1 Item (19); MIC Article 2, Paragraph 1 Item (19)-2; MIC Article 2, Paragraph 1 Item (19)-3; MIC Article 2, Paragraph 1 Item (19)-3-2; MIC Article 2, Paragraph 1 Item (21)-3; MIC Article 2, Paragraph 1 Item (54); MIC Article 2, Paragraph 1 Item (54)-6; ARIB STD T-33; ARIB STD T-66; ARIB STD T-71; IEEE Std. C95.3; EN 62311; IEC 62311; EN 62479; IEC 62479; BS EN 62479; EN 50364; BS EN 50364; EN 50385; BS EN 50385; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 62209-1; IEC 62209-1; BS EN 62209-1; EN 62209-2; IEC 62209-2; BS EN 62209-2; IEC/IEEE 62209-1528; BS IEC/IEEE 62209-1528; EN 50360; BS EN 50360; EN 50566; BS EN 50566; MIC Article 14-2; ARIB STD T-56; EN 62311; IEC 62311; BS EN 62311; IEEE Std. C95.1; IEEE Std 1528:2013; AS/NZS 2772.2; KDB 616217 D04; KDB 865664 D01; KDB 865664 D02; KDB 941225 D01; KDB 941225 D05; KDB 941225 D06; RSS-102 (Issue 6); RSS-102.SAR.MEAS; IEC 62368-1; EN 62368-1; BS EN 62368-1; AS/NZS 62368.1; UL 62368-1; (EU) 2019/1782; EN 50563; EN 50564; IEC 62301; EN 62301; AS/NZS 62301; IEC 61851-1; EN 61851-1; BS EN IEC 61851-1; IEC 61851-23; EN 61851-23; BS EN 61851-23; IEC 61851-24; EN 61851-24; BS EN 61851-24; IEC 62477-1; EN IEC 62477-1; IEC 62109-1 | - | - |
| electrical | - | - | - |
| electrical | ISED RSS-GEN; RSS-119; RSS-130; RSS-132; RSS-133; RSS-135; RSS-139; RSS-192; RSS-195; RSS-197; RSS-199; RSS-210; RSS-216; RSS-247; RSS-248; RSS-310; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance 3,4; CTIA-01.20-Test-Methodology-SISO-Anechoic-Chamber 3; CTIA-01.22-Test-Methodology-SISO-Millimeter-Wave3; CTIA-01.40-Test-Methodology-MIMO-Multi-Probe-Anechoic-Chamber3; CTIA-01.50-Wireless-Technology-3GPP-Radio-Access-Technologies3; CTIA-01.52-Wireless-Technology-Non-3GPP-Radio-Access-Technologies3; CTIA-01.72-Near-Field-Phantoms3; CTIA and WiFi Alliance Test Plan for RF Performance Evaluation of Wi-Fi Mobile Converged Devices3; ANSI/IEEE Std. 149; TR-398; 3GPP R38.827; ETSI TS 138 151; 3GPP TS38.151; 3GPP TR 37.902; ETSI TR 137 902; 3GPP TS 25.144; ETSI TS 125 144; 3GPP TS 34.114; ETSI TS 134 114; 3GPP TS 37.544; ETSI TS 137 544; ETSI EN 301 908-13; ETSI EN 301 908-2; EN 300 220-1; EN 300 220-2; EN 300 220-3-1; EN 300 220-3-2; EN 300 220-4; EN 300 328; EN 300 330; EN 300 422-1; EN 300 422-2; EN 300 440; EN 301 357; EN 301 511; EN 301 893; EN 301 908-1; EN 301 908-2; EN 301 908-13; EN 301 908-25; EN 302 208; EN 302 502; EN 303 413; EN 303 417; EN 303 687; ETSI TS 138.101-1; 3GPP TS 38.101-1; ETSI TS 138.101-3; 3GPP TS 38.101-3; ETSI TS 138.521-1; 3GPP TS 38.521-1; ETSI TS 138.521-3; 3GPP TS 38.521-3; ETSI TS 136.521-1; 3GPP TS 36.521-1; ETSI TS 151.010-1; 3GPP TS 51.010-1; ETSI TS 134 121-1; 3GPP TS 34.121-1; AS/NZS 4268; AS/CA S042.1; AS/ACIF S042.3; AS/CA S042.4 | - | - |
| electrical | CISPR 32; EN 55032; ICES-001; ICES-003; ICES-005; ICES-006; AS/NZS CISPR 32; VCCI-CISPR 32: 2016; BS EN 55032; CISPR 11; EN 55011; AS CISPR 11; BS EN 55011; CISPR 14-1; EN IEC 55014-1; BS EN IEC 55014-1; AS/NZS CISPR 14-1; J55014-1; CISPR 15; EN IEC 55015; BS EN IEC 55015; IEC 61000-3-2; EN IEC 61000-3-2; AS/NZS 61000-3-2; BS EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; AS/NZS 61000-3-3; BS EN 61000-3-3; EN 61000-3-11; EN IEC 61000-3-11; IEC 61000-3-11; BS EN IEC 61000-3-11; EN 61000-3-12; IEC 61000-3-12; BS EN 61000-3-12; IEC 61000-4-2; EN 61000-4-2; AS/NZS 61000-4-2; BS EN 61000-4-2 | - | to 6 GHz |
| electrical | IEC 60529; EN 60529; IEC 60068-2-2; EN 60068-2-2; IEC 60068-2-78; EN 60068-2-78; IEC 60068-2-52; EN 60068-2-52; IEC 60695-2-11; EN 60695-2-11; IEC 60695-11-20; EN 60695-11-20; IEC 60695-2-20; EN 60695-2-20; IEC 60695-11-5; EN 60695-11-5 | - | - |
| - | IEC 61000-4-3; EN 61000-4-3; EN IEC 61000-4-3; AS/NZS 61000-4-3; BS EN IEC 61000-4-3; IEC 61000-4-4; EN 61000-4-4; AS/NZS 61000-4-4; BS EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; AS/NZS 61000-4-5; BS EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; AS/NZS 61000-4-6; BS EN 61000-4-6; IEC 61000-4-8; EN 61000-4-8; AS/NZS 61000-4-8; BS EN 61000-4-8; IEC 61000-4-11; EN 61000-4-11; EN IEC 61000-4-11; AS/NZS 61000-4-11; BS EN IEC 61000-4-11; IEC 61000-4-29; EN IEC 61000-4-29; BS EN 61000-4-29; IEC 61000-4-34; EN 61000-4-34; BS EN 61000-4-34; EN IEC 61000-6-1; IEC 61000-6-1; AS/NZS 61000-6-1; BS EN IEC 61000-6-1; EN IEC 61000-6-2; IEC 61000-6-2; AS/NZS 61000-6-2; BS EN IEC 61000-6-2; EN IEC 61000-6-3; IEC 61000-6-3; AS/NZS 61000-6-3; BS EN IEC 61000-6-3; EN IEC 61000-6-4; IEC 61000-6-4; AS/NZS 61000-6-4; BS EN IEC 61000-6-4; EN 55035; CISPR 35; AS/NZS CISPR 35; BS EN 55035; CISPR 14-2; AS/NZS CISPR 14-2; EN IEC 55014-2; BS EN IEC 55014-2; EN 300 386; EN 61547; BS EN 61547; EN IEC 61851-21-2; BS EN IEC 61851-21-2; IEC 61851-21-2; EN 301 489-1; EN 301 489-3; EN 301 489-9; EN 301 489-17; EN 301 489-19; EN 301 489-52; EN IEC 61326-1; BS EN IEC 61326-1; CISPR 25; ISO 11452-2; ISO 11452-4; ISO 11452-8; ISO 11452-9; ECE R10 .06; EN 50498; ISO 7637-2; ISO 7637-3; ISO 16750-2 | - | - |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.
Labs with overlapping accredited scope in China
- Guangdong Anbotek Testing Co.,HuizhouA2LAShares 2 accredited test methodsCISPR 32RSS-119
- Guangdong Zhonghan Testing Technology Co.,ShenzhenA2LAShares 2 accredited test methodsEN 62311IEC 60529
- DEKRA Testing and Certification (Shanghai)ShanghaiA2LAShares 1 accredited test methodIEC 60529
- Eurofins TA Technology (Shanghai) Co.,Shanghai 201201A2LAShares 1 accredited test methodEN 62311
- SGS-CSTC Standards Technical Services Co., Ltd. Shenzhen BranchShenzhen, GuangdongA2LAShares 1 accredited test methodEN 62311
Accreditation data collected from the A2LA register on .
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