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United States

Defense MicroElectronics Activity - Science & Engineering Gamma Irradiation Test Facility

4234 54th Street, 95652-2100, McClellan, CA, United States

A2LA|1691.01ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
2
Locations
1

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916 999 2912
russell.c.whitney2.civ@mail.mil
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Register record

A2LACollected
1691.01Active

Certificates and scope

1
A2LA

ISO/IEC 17025

Active

1691.01

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Accredited scope, certificate 1691.01

DisciplineMethodMatrixRange
mechanical---
mechanicalMIL-STD-750D Method 1019.4; MIL-STD-750E Method 1019.5; MIL-STD-750-1 Method 1019.5; MIL-STD-750-1A Method 1019.5; MIL-STD-883E Methods 1019.4, 1019.5; MIL-STD-883F Method 1019.6; MIL-STD-883G Method 1019.7; MIL-STD-883H Method 1019.8; MIL-STD-883J Method 1019.9; MIL-STD-883K Method 1019.9; MIL-STD-883-1, Test Method 1019.9; ESA/SCC Basic Specification No. 22900, Issue 2; ESA/SCC Basic Specification No. 22900, Issue 4; ESCC Basic Specification No. 22900, Issue 3; ESCC Basic Specification No. 22900, Issue 4; ESCC Basic Specification No. 22900, Issue 5microcircuits and semiconductors0.3 to 10 MR/hr

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.

Location

4234 54th Street, McClellan, CA, 95652-2100, US

33.12755, -117.28140

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