United Kingdom
Hi Gain Ltd T/A Phasix ESD
Unit 17, Focus 303 Business Park, Focus Way, SP10 5NY, Andover, United Kingdom
UKAS|4670ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
2
Locations
1
Contact this laboratory
Register record
- UKASCollected
- 4670Active
Certificates and scope
1UKAS
ISO/IEC 17025
Active4670
Accredited scope, certificate 4670
| Discipline | Method | Matrix | Range |
|---|---|---|---|
| Materials Testing | EIA/JESD22-A114-F:2008; AEC - Q100-002 Rev D:2003; AEC - Q100-002 Rev E:2013; AEC - Q101-001 Rev A:2005; MIL-STD-883G METHOD 3015.7; MIL-STD-883H METHOD 3015.8; MIL-STD-883J METHOD 3015.9; ANSI/ESDA/JEDEC-JS-001-2010; ANSI/ESDA/JEDEC-JS-001-2011; ANSI/ESDA/JEDEC-JS-001-2012; ANSI/ESDA/JEDEC-JS-001-2014; ANSI/ESDA/JEDEC-JS-001-2017; ANSI/ESDA/JEDEC-JS-001-2023; ANSI/ESDA/JEDEC-JS-001-2024 | Packaged electronic components; Semi-conductor devices | to 8 kV |
| Materials Testing | AEC - Q100-011 Rev B:2003; AEC - Q100-011 Rev C1:2013; AEC - Q100-011 Rev D:2019; AEC - Q101-005:2005; JESD22-C101C:2004; JESD22-C101D:2008; JESD22-C101E:2009; JESD22-C101F:2013; ANSI-ESDA-JEDEC JS-002-2014; ANSI-ESDA-JEDEC JS-002-2018; ANSI-ESDA-JEDEC JS-002-2022; ANSI-ESDA-JEDEC JS-002-2025; EIA/JESD22-A115-A:1997; EIA/JESD22-A115-C:2010; AEC - Q100-003 Rev E:2003; AEC - Q101-002 Rev A:2005; ISO/IEC 17025:2017 | Packaged electronic components; Semi-conductor devices | to 2 kV |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.
Location
Accreditation data collected from the UKAS register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the UKAS entry linked above.