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United Kingdom

Hi Gain Ltd T/A Phasix ESD

Unit 17, Focus 303 Business Park, Focus Way, SP10 5NY, Andover, United Kingdom

UKAS|4670ISO/IEC 17025Register refreshed 2026-09-25
Certificates
1
Scope items
2
Standards
0
Locations
1

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Register record

UKASRefreshed
4670Active

Accredited standards

We found no published test standard numbers in this lab’s scope (labs often list in-house methods instead). The full scope as published is below.

Scope as published by UKAS

2 lines
UKAS

ISO/IEC 17025

Active

4670

View scope

Accredited scope, certificate 4670

LineDisciplineMethodMatrixRange
1Materials TestingEIA/JESD22-A114-F:2008; AEC - Q100-002 Rev D:2003; AEC - Q100-002 Rev E:2013; AEC - Q101-001 Rev A:2005; MIL-STD-883G METHOD 3015.7; MIL-STD-883H METHOD 3015.8; MIL-STD-883J METHOD 3015.9; ANSI/ESDA/JEDEC-JS-001-2010; ANSI/ESDA/JEDEC-JS-001-2011; ANSI/ESDA/JEDEC-JS-001-2012; ANSI/ESDA/JEDEC-JS-001-2014; ANSI/ESDA/JEDEC-JS-001-2017; ANSI/ESDA/JEDEC-JS-001-2023; ANSI/ESDA/JEDEC-JS-001-2024Packaged electronic components; Semi-conductor devicesto 8 kV
2Materials TestingAEC - Q100-011 Rev B:2003; AEC - Q100-011 Rev C1:2013; AEC - Q100-011 Rev D:2019; AEC - Q101-005:2005; JESD22-C101C:2004; JESD22-C101D:2008; JESD22-C101E:2009; JESD22-C101F:2013; ANSI-ESDA-JEDEC JS-002-2014; ANSI-ESDA-JEDEC JS-002-2018; ANSI-ESDA-JEDEC JS-002-2022; ANSI-ESDA-JEDEC JS-002-2025; EIA/JESD22-A115-A:1997; EIA/JESD22-A115-C:2010; AEC - Q100-003 Rev E:2003; AEC - Q101-002 Rev A:2005; ISO/IEC 17025:2017Packaged electronic components; Semi-conductor devicesto 2 kV

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

Unit 17, Focus 303 Business Park, Focus Way, Andover, SP10 5NY, GB

51.20783, -1.47935

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