Microwave Factory Calibration Laboratory
815-1, Tatemachi, Hachiouji-shi, Tokyo, 193-0985, Japan, Tokyo, Japan
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Register record
- A2LARefreshed
- 3577.01Active
Accredited standards
We could not match the method references in this lab’s scope to published test standard numbers. The full scope as published is below.
Scope as published by A2LA
6 lines
ISO/IEC 17025
Active3577.01
The scope document we hold says it was valid until 2026-05-31. That date has passed, so our copy may be out of date. We downloaded it from the A2LA register on 2026-03-14. Check the A2LA register for the current scope.
Accredited scope, certificate 3577.01
| Line | Discipline | Method | Matrix | Range |
|---|---|---|---|---|
| 1 | electrical | (A2LA Cert. No. 3577.01) 06/10/2024 Page 1 of 5
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017
MICROWAVE FACTORY CALIBRATION LABORATORY
815-1, Tatemachi, Hachiouji-shi,
Tokyo 193-0985
JAPAN
Mr. Masanori Sakurai Phone: + 81 42 673 3535
sakurai@mwf.co.jp
CALIBRATION
Valid To: May 31, 2026 Certificate Number: 3577.01
In recognition of the successful completion of the A2LA evaluation process (including an assessment of
the organization’s compliance with A2LA’s Calibration Program Requirements), accreditation is granted
to this laboratory to perform the following calibrations
1, 4, 5:
I. Electrical – DC/Low Frequency
Parameter/Equipment
Range
CMC2, 3 (±)
Comments
DC Voltage – Measure
(0 to 32.999) mV
(33.000 to 77.999) mV
(78.000 to 119.999) mV
(120.00 to 329.99) mV
(0.330 00 to 1.199 99) V
(1.2000 to 11.9999) V
(12.000 to 119.999) V
(120.00 to 329.99) V
2.5 µV
77 µV/V
35 µV/V
24 µV/V
13 µV/V
11 µV/V
13 µV/V
14 µV/V
Agilent 3458A | ||
| 2 | electrical | (A2LA Cert. No. 3577.01) 06/10/2024 Page 2 of 5
Parameter/Equipment
Range
CMC2, 3 (±)
Comments
DC Voltage – Generate
(0 to 32.9999) mV
(33.000 to 77.999) mV
(78.000 to 119.999) mV
(120.000 to 329.999) mV
(330.00 to 779.99) mV
(0.780 00 to 3.299 99) V
(3.3000 to 7.7999) V
(7.8000 to 32.9999) V
(33.000 to 77.999) V
(78.000 to 329.999) V
2.8 µV
84 µV/V
40 µV/V
30 µV/V
15 µV/V
11 µV/V
14 µV/V
11 µV/V
18 µV/V
16 µV/V
Fluke 5520A
Rsource ≈ 50 Ω
Rsource ≈ 50 Ω
Rsource ≈ 50 Ω
Rsource ≈ 50 Ω
Resistance – Measure
(0 to 11.9999) Ω
(12.000 to 32.9999) Ω
(33.000 to 119.999) Ω
(120.00 to 1199.99) Ω
(1.2000 to 11.9999) kΩ
(12.000 to 119.999) kΩ
(120.00 to 1100.00) kΩ
0.3 mΩ
86 µΩ/Ω
38 µΩ/Ω
18 µΩ/Ω
18 µΩ/Ω
18 µΩ/Ω
43 µΩ/Ω
Agilent 3458A | ||
| 3 | electrical | (A2LA Cert. No. 3577.01) 06/10/2024 Page 3 of 5
Parameter/Range
Frequency
CMC2, 3 (±)
Comments
AC Voltage – Measure
(12.000 to 32.999) mV
(33.000 to 119.999) mV
(120.00 to 329.99) mV
(0.330 00 to 1.199 99) V
(1.2000 to 3.2999) V
(3.3000 to 11.9999) V
(12.000 to 32.999) V
(33.000 to 119.999) V
(120.00 to 329.99) V
(0.600 00 to 1.199 99) V
(1.2000 to 3.2000) V
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
100 Hz to 20 kHz
100 Hz to 20 kHz
0.031 %
0.021 %
0.025 %
0.017 %
0.025 %
0.017 %
0.038 %
0.033 %
0.057 %
0.039 %
0.11 %
Agilent 3458A
100 mV range, SSM
mode
1 V range, SSM mode
10 V range, SSM
mode
100 V range, SSM
mode
1000 V range, SSM
mode
1 V range, ANA mode
10 V range, ANA
mode
AC Voltage – Generate
(1.650 to 47.999) mV
(48.000 to 119.99) mV
(120.00 to 329.999) mV
(330.00 to 779.99) mV
(0.780 00 to 3.2999) V
(3.3000 to 7.7999) V
(7.8000 to 32.9999) V
(33.000 to 329.999) V
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
1 kHz
0.032 %
0.028 %
0.018 %
0.027 %
0.019 %
0.027 %
0.019 %
0.021 %
Fluke 5520A
Test sources < 48 mV
are obtained using a
200:1 custom
attenuator driven by
Fluke 5520A set for
200x the desired
voltage,
Rsource ≈ 50 Ω
Rsource ≈ 50 Ω
Rsource ≈ 50 Ω | ||
| 4 | electrical | - | - | 1 to 10000000 Hz |
| 5 | - | (A2LA Cert. No. 3577.01) 06/10/2024 Page 5 of 5
2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC Uncertainty due to the behavior of the customer’s device and to influences
from the circumstances of the specific calibration.
3 The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured value
in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a
percent or fraction of the reading plus a fixed floor specification.
4 This laboratory only offers commercial calibration services on API product families . The scope
parameters, ranges and CMC uncertainties are specific to the API product families only.
5 This scope meets A2LA’s P112 Flexible Scope Policy.
6 The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter. | ||
| 6 | - | ISO/IEC 17025:20 17; R205 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.