Registers refreshed 2026-11-08.See refresh dates
China

Honor Compliance and Testing Center of Honor Device Co.,

Jiawei Industrial Park, No. 2, Jinsheng 4th Rd, Laokeng Community, Longtian Subdistrict, Pingshan District, Shenzhen, Guangdong, People's Republic of China, Shenzhen, Guangdong, China

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Scope as published by A2LA

6 lines
A2LA

ISO/IEC 17025

Withdrawn

6656.01

View scope

Accredited scope, certificate 6656.01

LineMethodMatrixRange
1IEC/EN/BS EN 62209-1; IEC/EN/BS EN 62209-2; IEC/EN/BS EN 62209-3; IEC/IEEE/ EN/BS EN 62209-1528; EN/BS EN 50360; EN/BS EN 50566; EN/BS EN 50385; EN/BS EN 50663; EN/BS EN 50665; EN/ BS EN 50364; IEC/EN/BS EN 62232; IEC/EN/BS EN 62311; IEC/EN/BS EN 62479; ICNIRP Guideline; IEC PAS/PD IEC 63184; IEC PAS 63446; IEC/IEEE/BS 62704-1; IEC/IEEE/BS 62704-3; IEC/IEEE/BS 62704-4; IEC/IEEE/EN/BS EN 63195-1; IEC/IEEE/EN/BS EN 63195-2; PD IEC/TR 63424-1; IEC TR/BS PD IEC 63170; IEEE/ANSI C95.1; IEEE C95.3; IEEE 1528; IEEE 1528a; KDB 447498 D01; KDB 447498 D02; KDB 865664 D01; KDB 941225; KDB 616217; Safety Code 6; RSS-102; RSS-102.SAR.MEAS; RSS-102.NS.MEAS; RSS-102.IPD.MEAS; RSS-102.NS.SIM; SPR-002; RSS-216; SPR-001; SPR-004; SPR-APD; SPR-003; BIS IS/IEC 62209-1; BIS IS/IEC 62209-2; BIS IS/IEC 62209-3; BIS IS/IEC 62311; BIS IS/IEC 62479; ARPANSA standard; AS/NZS 2772.2; Radiocommunications Equipment (General) Rules; CFR 47, FCC Part 15 Subpart C/E (using ANSI C63.10); FCC Part 15 Subpart E with DFS (Using KDB 905462 D02 (v02)); KDB Publication 789033; KDB Publication 905462; ISO/IEC 17025:2017-to 40 GHz
2CFR 47, FCC Parts 22 (using ANSI C63.26 ); CFR 47, FCC Parts 24 (using ANSI C63.26); CFR 47, FCC Parts 25 (below 3GHz, using ANSI C63.26); CFR 47, FCC Parts 27 (using ANSI C63.26); CFR 47, FCC Parts 90 (using ANSI C63.26); CFR 47 FCC Parts 96 (Excluding end user Device Additional Requirement of part 96.47, using ANSI C63.26); ITU-R SM 329-12; ANSI/TIA-603-E; Canada RSS-GEN; RSS-130; RSS-132; RSS-133; RSS-139; RSS-140; RSS-192; RSS-195; RSS-197; RSS-198; RSS-199; RSS-210; RSS-216; RSS-247; RSS-248; European Union (EU) EN 300 328; EN 301 893; EN 300 330; EN 300 440; EN 303 413; EN 303 417; EN 303 345-1; EN 303 345-3; EN 303 687; EN 301 511; EN 301 908-1; EN 301 908-2; EN 301 908-13; EN 301 908-25 (Excluding FR2); ETSI TS 151 010-1 (3GPP TS 51.010-1); ETSI TS 134 121-1 (3GPP TS 34.121-1); ETSI TS 136 521-1 (3GPP TS 36.521-1); ETSI TS138 521-1 (3GPP TS 38.521-1); ETSI TS138 521-3 (3GPP TS 38.521-3); CFR 47 FCC Part 15, Subpart B (using ANSI C63.4:2014); AS/NZS CISPR 32; EN 55032; BS EN 55032; CISPR 32; VCCI V-3; VCCI CISPR 32; ICES-GEN; ICES-001; ICES-003; Harmonics Current Emissions IEC 61000-3-2; EN 61000-3-2; EN IEC 61000-3-2; BS EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; BS EN 61000-3-3--
3IEC 61000-4-2; EN 61000-4-2; BS EN 61000-4-2; IEC 61000-4-3; EN 61000-4-3; BS EN 61000-4-3; EN IEC 61000-4-3; BS EN IEC 61000-4-3; IEC 61000-4-4; EN 61000-4-4; BS EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; BS EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; BS EN 61000-4-6; EN IEC 61000-4-6; BS EN IEC 61000-4-6; IEC 61000-4-8; EN 61000-4-8; BS EN 61000-4-8; IEC 61000-4-11; EN 61000-4-11; EN IEC 61000-4-11; BS EN IEC 61000-4-11; IEC 61000-6-1; EN 61000-6-1; EN IEC 61000-6-1; BS EN 61000-6-1; BS EN IEC 61000-6-1; IEC 61000-6-3; EN 61000-6-3; EN IEC 61000-6-3; BS EN 61000-6-3; BS EN IEC 61000-6-3; AS/NZS 61000.6.3; CISPR 35; EN 55035; BS EN 55035; EN 301489-1; EN 301489-3; EN 301489-17; EN 301489-19; EN 301 489-52; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1; CTIA Certification Test Plan for 2x2 Downlink MIMO and Transmit Diversity Over-the-Air Performance; CTIA Certification Test Plan for RF Performance Evaluation of Wi-Fi Mobile Converged Devices; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.03-Normative-Reporting-Tables; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.04-Informative-Reporting-Tables; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.20-Test-Methodology-SISO-Anechoic-Chamber; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA 01.40 Test Methodology, MIMO, Static Channel Model, Multi-Probe Anechoic Chamber; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA 01.50 Wireless Technology, 3GPP Radio Access Technologies; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA 01.51 Wireless Technology, Location Based Technologies--
4CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA 01.52 Wireless Technology, Non-3GPP Radio Access Technologies; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.70-Measurement-Uncertainty; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.71-Device-Setup-and-Positioning-Guidelines; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA-01.72-Near-Field-Phantoms; CTIA Certification Test Plan for Wireless Device Over-the-Air Performance1 CTIA 01.73 Supporting Procedures; Version Specific Technical Overview of PTCRB Certification Program Permanent Reference Document NAPRD03; ETSI EN 301 908-2; ETSI EN 301 908-13; ETSI TS 137 144; ETSI TS 137 544; 3GPP TS 34.114; 3GPP TR 25.914; 3GPP TS 25.144; 3GPP TS 37.544; 3GPP TS 37.144; 3GPP TR 37.902; 3GPP TR 38.834; 3GPP TR 37.977; 3GPP TS 38.161; 3GPP TR 38.870; 3GPP TS 38.561--
5ANSI C63.4:2014+2017; ANSI C63.10:2013; FCC KDB 905462 D02 (v02); ANSI/TIA-603-E; TIA-102.CAAA-E; ANSI C63.26:2015; IEEE Std 1528:2013-to 40000 MHz
6

Extracted from the scope document; tables may not line up. View scope for the original.

For the tests to which this accreditation applies, please refer to the laboratory’s Electrical Scope of Accreditation. Accredited Laboratory A2LA has accredited HONOR COMPLIANCE AND TESTING CENTER OF HONOR DEVICE CO., LTD. Shenzhen, People’s Republic of China for technical competence in the field of Electrical Testing This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017). Presented this 9th day of July 2024. _______________________ Mr. Trace McInturff, Vice President, Accreditation Services For the Accreditation Council Certificate Number 6656.01 Valid to June 30th, 2026

Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Accreditation data refreshed from the A2LA register on .

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