Shenzhen CTA Testing Technology Co.,
Room 106, Building 1, Yibaolai Industrial Park, Qiaotou Community, Fuhai Street, Bao'an District, Shenzhen, People's Republic of China, Shenzhen, China
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Register record
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- 6534.01Active
Accredited standards
22Our reading of the A2LA scope: each standard once, with its official name where we have checked it. Click a standard to see the scope line it comes from, word for word.
IEC 61000 series
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
EN
EN 50364Name not checked yet
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
EN 50383Name not checked yet
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
EN 50384Name not checked yet
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
EN 50385Name not checked yet
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
EN 50663Generic standard for assessment of low power electronic and electrical equipment related to human exposure restrictions for electromagnetic fields (10 MHz - 300 GHz)
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
EN 50665Name not checked yet
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
CISPR
CISPR 11Industrial, scientific and medical equipment - Radio-frequency disturbance characteristics - Limits and methods of measurementCertificate says EN 55011. Probably the same standard; not checked against the EN document.
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
CISPR 15Limits and methods of measurement of radio disturbance characteristics of electrical lighting and similar equipmentCertificate says EN 55015, IEC 55015. Probably the same standard; not checked against the EN document.
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirementsCertificate says EN 55032. Probably the same standard; not checked against the EN document.
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
IEC
IEC 62311Assessment of electronic and electrical equipment related to human exposure restrictions for electromagnetic fields (0 Hz to 300 GHz)Certificate says EN 62311. Probably the same standard; not checked against the EN document.
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
IEC 62368-1Audio/video, information and communication technology equipment - Part 1: Safety requirements
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
IEC 62479Assessment of the compliance of low power electronic and electrical equipment with the basic restrictions related to human exposure to electromagnetic fields (10 MHz to 300 GHz)
IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54
Other standards
ANSI C63.4American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz
ANSI C63.4:2014; FCC MP-5:1986; ANSI C63.10-2020; FCC KDB 905462 D02 (v02)
ANSI/TIA-603-EName not checked yet
ANSI/TIA-603-E; TIA-102.CAAA-E; ANSI C63.26:2015
FCC PART 15Radio Frequency Devices
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11
Scope as published by A2LA
6 lines
ISO/IEC 17025
Active6534.01
The scope document we hold says it is valid until 2027-11-30.
Accredited scope, certificate 6534.01
| Line | Discipline | Method | Matrix | Range |
|---|---|---|---|---|
| 1 | electrical | CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP 5:1986); CISPR 32; EN 55032; AS/NZS CISPR 32; BS EN 55032; CISPR 15; BS EN 55015; EN IEC 55015; AS/NZS CISPR 15; ICES-003; IEC 61000-3-2; EN IEC 61000-3-2; IEC 61000-3-3; EN 61000-3-3; CFR 47, FCC Part 18 (using MP-5:1986); CISPR 11; EN 55011; AS CISPR 11; IEC 61000-4-2; EN 61000-4-2; IEC 61000-4-4; EN 61000-4-4; IEC 61000-4-5; EN 61000-4-5; IEC 61000-4-6; EN 61000-4-6; IEC 61000-4-11; EN 61000-4-11 | - | to 40 GHz |
| 2 | - | - | - | - |
| 3 | electrical | IEEE C95.3; IEC 62479; IEC 62311; EN 62479; BS EN 62479; EN IEC 62311; EN 50383; BS EN 50383; EN 50385; BS EN 50385; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN 50384; BS EN 50384; IEEE/ANSI C95.1; KDB 447498 D01; KDB 447498 D02; AS/NZS 2772.2; Radiation Protection Series Publication No. 3; Radiation Protection Series S-1 (Rev. 1); IEC 62368-1; EN IEC 62368-1; AS/NZS 62368.1; UL 62368-1; BS EN 62368-1; Japan MIC Article 2-1 Item (8); MIC Article 2-1 Item (19); MIC Article 2-1 Item (19)-2; MIC Article 2-1 Item (19)-2-2; MIC Article 2-1 Item (19)-2-3; MIC Article 2-1 Item (19)-3; MIC Article 2 Paragraph 1 of Item 11‐3; Article 2 Paragraph 1 of Item 11‐4; Article 2 Paragraph 1 of Item 11‐7; Article 2 Paragraph 1 of Item 11‐8; Article 2 Paragraph 1 of Item 11‐19; Article 2 Paragraph 1 of Item 11‐21; Article 2 Paragraph 1 of Item 54 | - | - |
| 4 | electrical | ANSI C63.4:2014; FCC MP-5:1986; ANSI C63.10-2020; FCC KDB 905462 D02 (v02) | - | to 40000 MHz |
| 5 | electrical | ANSI/TIA-603-E; TIA-102.CAAA-E; ANSI C63.26:2015 | - | to 40000 MHz |
| 6 | electrical | - | - | - |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Labs with overlapping accredited scope in China
- Shenzhen Tongzhou Testing Co.,ShenzhenA2LAShares 3 accredited test methodsANSI C63.4:2014ANSI/TIA-603-ECISPR 32
- Shenzhen UnionTrust Quality and Technology Co.,Shenzhen, GuangdongA2LAShares 3 accredited test methodsANSI C63.4:2014ANSI/TIA-603-EIEC 62479
- CTC Laboratories, Inc.Shenzhen, GuangdongA2LAShares 2 accredited test methodsANSI C63.4:2014ANSI/TIA-603-E
- Dongguan Nore Testing Center Co.,Dongguan, GuangdongA2LAShares 2 accredited test methodsANSI C63.4:2014ANSI/TIA-603-E
- Guangdong Anbotek Testing Co.,HuizhouA2LAShares 2 accredited test methodsANSI/TIA-603-ECISPR 32
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.