CROSS TECHNOLOGIES, INC - LEXINGTON

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 1 of 18 SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 CROSS TECHNOLOGIES, INC 354 Riverchase Way Lexington, SC 29072 Connie Foster Phone: 800 327 7727 CALIBRATION Valid To: September 30, 2026 Certificate Number: 1741.12 In recognition of the successful completion of the A2LA evaluation process (including an assessment of the organization’s compliance with A2LA’s Calibration Program Requirements), accreditation is granted to this laboratory to perform the following calibrations 1, 8: I. Chemical Parameter/Equipment Range CMC2, 5 (±) Comments pH Meters3 – Fixed Points 4 pH 7 pH 10 pH 0.03 pH 0.03 pH 0.04 pH Standard pH solutions Conductivity Meters3 10 µS/cm 100 µS/cm 1000 µS/cm 1413 µS/cm 10 000 µS/cm 0.56 µS/cm 2.2 µS/cm 5.2 µS/cm 4.7 µS/cm 46 µS/cm Standard conductivity solutions Refractometers3 (5, 10, 25, 40, 60) % Brix 0.033 % + 0.6R Brix Sucrose solutions II. Dimensional Parameter/Equipment Range CMC2, 5 (±) Comments Pin Gage3 – Class Z & Class ZZ Up to 1 in 110 µin Micrometer

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 2 of 18 Parameter/Equipment Range CMC2, 5 (±) Comments Calipers3 Up to 40 in (4.5 + 9.9L) µin + 0.6R Gage blocks Micrometers3 (Outside & Depth) Up to 40 in (4.5 + 9.9L) µin + 0.6R Gage blocks Inside Micrometers3 Up to 40 in (4.5 + 9.9L) µin + 0.6R Gage blocks Thickness Gages3 Up to 4 in (6.4 + 3.1L) µin + 0.6R Gage blocks Coating Thickness Gages3 Up to 63 mils 0.1 mils Coating thickness standards Cylindrical Measure – Plain Rings Pins, Plain Plugs, Discs, Spheres – External Diameter Up to 10 in Up to 10 in (17 + 4.6L) µin (13 + 2.9L) µin P & W Labmaster TM w/ XX master rings P & W LabmasterTM w/ gage blocks Thread Plugs - Major Diameter Pitch Diameter Up to 4 in Up to 4 in (26 + 3.5L) µin (97 + 0.1L) µin P & W LabmasterTM w/ gage blocks Micrometer End Standards Up to 12 in (13 + 3L) µin P & W LabmasterTM w/ gage blocks Linear Indicators3 – Dial, test & LVDT Up to 4 in (3.0 + 9.4L) µin + 0.6R Gage blocks Height Gages3 Up to 20 in (20 to 48) in (52 + 7.9L) µin + 0.6R (18 + 9.6L) µin + 0.6R Gage blocks

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 3 of 18 Parameter/Equipment Range5 CMC2, 5 (±) Comments Steel Rules3 Up to 72 in Up to 10 in (1.5 + 10L) µin + 0.6R 370 µin Gage blocks Vision machine Tape Measures3 Up to 25 ft (1.5 + 10L) µin + 0.6R Gage blocks Angle Indicators & Protractors3 30°, 45°, 60°, 75°, 90° 0.03° Angle block set Levels – Bubble & Precision (Vial Sensitivity) Up to 10 degrees 7 arcsec + 0.6R Surface plate w/ gage blocks Feeler/Thickness Gages3 Up to 1 in 110 µin Micrometer Radius Gages Up to 2 in 370 µin Vision machine Fixture Gages3 – Localized Flatness 0.002 in 40 µin Dial indicator Surface Plates3 – Grades AA, A, & B Repeatability Flatness 0.002 in Up to 60 DL in (> 60 to 120) DL in 40 µin (31 + 0.2DL) µin (30 + 0.3DL) µin Repeat-o-meter Federal level systems Optical Comparators3 – Magnification X – Y Linearity Angle 10× to 250× Up to 8 in (> 8 to 12) in Up to 90 o 0.014 in 160 µin 270 µin 0.1 o Grid plate, glass master & scale Angle block set

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 5 of 18 IV. Electrical – DC/Low Frequency Parameter/Equipment Range CMC2, 4, 6 (±) Comments DC Voltage – Measure3 Up to 100 mV 100 mV to 1 V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 6) kV (6 to 7) kV 7.8 µV/V + 0.2 µV 3.4 µV/V + 0.3 µV 3.4 µV/V + 0.5 µV 4.7 µV/V + 30 µV 4.8 µV/V + 0.5 mV 1.3 % 2.4 % Fluke 8588A Fluke 80K-6 & DMM Fluke 80K-40 & DMM DC Voltage – Generate3 (0 to 330) mV (0 to 3.3) V (0 to 33) V (30 to 330) V (100 to 1000) V 25 µV/V + 1 µV 14 µV/V + 2 µV 15 µV/V + 20 µV 22 µV/V + 150 µV 22 µV/V + 1.5 mV Fluke 5522A DC Current – Measure3 (0 to 10) µA (10 to 100) µA (0.1 to 1.0) mA (1 to 10) mA (10 to 100) mA (0.1 to 1.0) A (1 to 10) A (1 to 30) A (1 to 50) A 29 µA/A + 0.4 nA 10 µA/A + 0.4 nA 10 µA/A + 4 nA 15 µA/A + 40 nA 58 µA/A + 1 µA 0.014 % + 0.1mA 0.024 % + 0.4 mA 0.056 % + 4.4 mA 0.31 % Fluke 8588A Empro shunt w/ DMM DC Current– Generate3 Clamp-On Meters 3 – Non-Toroidal (0 to 330) µA (0 to 3.3) mA (0 to 33) mA (0 to 330) mA (0 to 1.1) A (1.1 to 3) A (0 to 11) A (11 to 21) A (20.5 to 1000) A 0.018 % + 0.02 µA 0.012 % + 0.05 µA 0.012 % + 0.25 µA 0.012 % + 2.5 µA 0.024 % + 40 µA 0.046 % + 40 µA 0.06 % + 500 µA 0.12 % + 750 µA 0.65 % + 0.5 A Fluke 5522A Fluke 5522A w/5500 coil

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 13 of 18 Thermocouple Simulation & Measure3 – Type B Type E Type J Type K Type N Type R Type S Type T (600 to 800) °C (800 to 1820) °C (-250 to -100) °C (-100 to 650) °C (650 to 1000) °C (-210 to -100) °C (-100 to 760) °C (760 to 1200) °C (-200 to -100) °C (-100 to 1000) °C (1000 to 1372) °C (-200 to -100) °C (-100 to 410) °C (410 to 1300) °C (0 to 250) °C (250 to 1000) °C (1000 to 1767) °C (0 to 250) °C (250 to 1400) °C (1400 to 1767) °C (-250 to -150) °C (-150 to 0) °C (0 to 400) °C 0.53 °C 0.43 °C 0.61 °C 0.21 °C 0.26 °C 0.33 °C 0.21 °C 0.28 °C 0.40 °C 0.32 °C 0.48 °C 0.50 °C 0.29 °C 0.35 °C 0.70 °C 0.42 °C 0.50 °C 0.58 °C 0.46 °C 0.57 °C 0.76 °C 0.30 °C 0.21 °C Fluke 5522A Electrical Calibration of RTD’s3 – Generate Measure (-200 to 200) °C (200 to 600) °C (600 to 850) °C (-200 to 200) °C (200 to 600) °C (600 to 850) °C 0.19 °C 0.31 °C 0.43 °C 0.19 °C 0.31 °C 0.43 °C Beamex MC2-MF

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 17 of 18 Parameter/Equipment Range CMC 2, 5, 6 (±) Comments Totalize Meters – Distance Measure Mechanical Counter/Totalizers3 Up to 200 ft Up to 999 999 counts 0.64 % 0.02 % + 0.6R Monarch PLT200 w/ 10cm wheel Speed/RPM– Measuring Equipment (2.5 to 100 000) RPM 0.000 24 % + 0.6R Keysight 33500B VII. Thermodynamics Parameter/Equipment Range CMC 2, 7 (±) Comments Relative Humidity – Measure3 (10 to 80) % RH 1.5 % RH Rotronic HP22A w/ HC2 Probe Temperature – Measure3 (-196 to 420) °C 0.06 °C Fluke 1524 w/5615-12 Probe Temperature – Measuring Equipment 3 (-45 to 140) °C (-15 to 350) °C 0.18 °C 0.15 °C Fluke 9170 Fluke 9009 w/ Ext Probe Infrared Thermometry – Measuring Equipment3 35 °C (35 to 100) °C (100 to 200) °C (200 to 350) °C (350 to 500) °C 0.86 °C 1 °C 1.2 °C 1.7 °C 2.3 °C Fluke 4181 Spectral band (8 to 14) µm Emissivity 0.95

(A2LA Cert. No. 1741.12) Revised 08/19/2024 Page 18 of 18 VIII. Time & Frequency Parameter/Equipment Range CMC2 (±) Comments Timers & Stopwatches3 (1 to 3600) s 0.2 s Monarch PLT 200 Frequency – Measure3 Up to 350 MHz 0.06 µHz/Hz Keysight 53210A Frequency – Measuring Equipment3 0.01 Hz to 2 MHz 3.1 parts in 106 + 5 µHz Fluke 5522A ______________________________________________________________ 1 This laboratory offers commercial calibration and field calibration services, where noted. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavi or of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects su ch as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC. 4 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 5 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches; R is the numerical value of the resolution of the device, DL is the diagonal length of the device in inches, and t is time in seconds. 6 In the statement of CMC, percentages are percent of reading, unless otherwise indicated. 7 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter. 8 This scope meets A2LA’s P112 Flexible Scope Policy. 9 This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for the types of dimensional tests listed above and is considered equivalent to that of a calibration.