Eddyfi Canada

(A2LA Cert. No. 2734.03) 05/23/2025 Page 5 of 8 Parameter/Equipment Range5 CMC2, 4, 5 (±) Comments Receiver – Ultrasound Instrumentation3 (cont) Linearity of Time Delays Gain Linearity Phased Array Conventional Channel Gain Variation Phased Array Conventional Linearity of Vertical Display Equivalent Input Noise Up to 20 µs (0 to 70) dB (0 to 70) dB < 1.5 dB (Zetec) < 1.5 dB (Zetec) 28 dB rel. < 80 nV/√Hz 0.014 % 0.29 dB 0.27 dB 0.40 dB 0.38 dB 0.36 % 3.3 nV/√Hz Agilent 33250A, Tektronix TDS-3032 (A, B, or C), MDO3032, MDO32, ZETEC attenuator 10040260, ZETEC 10040371 (ZIF), ZETEC 10059869 (IPEX) Transmitter – Ultrasound Instrumentation3 Voltage Phased Array Conventional Rise Time Phased Array Conventional Duration Phased Array Conventional Linearity of Time Delays (35 to75) V (50 to 200) V Up to 50 ns Up to 50 ns (25 to 500) ns (25 to 500) ns Up to 20 µs 2.0 % 2.6 % 0.57 ns 0.34 ns 0.51 ns 0.48 ns 0.051 % Agilent 33250A, Tektronix TDS-3032 (A, B, or C), MDO3032, MDO32, ZETEC 10040371 (ZIF), ZETEC 10059869 (IPEX) 50 ohms/10W load

(A2LA Cert. No. 2734.03) 05/23/2025 Page 7 of 8 Parameter/Equipment Range5 CMC2, 4, 5 (±) Comments Receiver – Ultrasound Instrumentation3 (cont) Linearity of Time Delays Gain Linearity Phased Array Conventional Channel Gain Variation Phased Array Conventional Linearity of Vertical Display Equivalent Input Noise Phased Array Conventional Up to 20 µs (0 to 70) dB (0 to 70) dB < 1.5 dB (Zetec) < 1.5 dB (Zetec) 28 dB rel. < 80 nV/√Hz 0.088 % 0.29 dB 0.27 dB 0.41 dB 0.37 dB 1.2 % 9.0 nV/√Hz 28 nV/√Hz Agilent 33250A, Tektronix TDS-3032 (A, B, or C), MDO3032, MDO32, ZETEC attenuator 10040260, ZETEC 10040371 (ZIF), ZETEC 10059869 (IPEX) Transmitter – Ultrasound Instrumentation3 Voltage Phased Array Conventional Rise Time Phased Array Conventional Duration Phased Array Conventional Linearity of Time Delays (10 to 75) V (20 to 200) V Up to 50 ns Up to 50 ns (25 to 500) ns (25 to 500) ns Up to 20 µs 2.2 % 2.7 % 0.57 ns 0.34 ns 0.49 ns 0.57 ns 0.056 % Agilent 33250A, Tektronix TDS-3032 (A, B, or C), MDO3032, MDO32, ZETEC 10040371 (ZIF) ZETEC 10059869 (IPEX) 50 ohms/10W load ____________________________________________

(A2LA Cert. No. 2734.03) 05/23/2025 Page 8 of 8 1 This laboratory offers commercial and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g., resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC. 4 In the statement of CMC, percentages represent percent of reading unless otherwise noted. 5 References to decibels (dB) refer to dB in voltage. 6 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 7 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter. 8 This scope meets A2LA’s P112 Flexible Scope Policy.