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Taiwan

Eurofins EAG Materials Science Taiwan

5F-2 No. 31 PuDing Rd., HsinChu, 30072, Republic of China Taiwan, HsinChu, Taiwan

A2LA|2797.10ISO/IEC 17025Register refreshed 2026-09-25
Certificates
1
Scope items
2
Standards
3
Locations
1

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Register record

A2LARefreshed
2797.10Active

Accredited standards

3

Our reading of the A2LA scope: each standard once, with its official name where we have checked it. Click a standard to see the scope line it comes from, word for word.

ISO 14237Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
As written on the certificate · Line 1 (A2LA 2797.10)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1617; SOP 8/F1; SOP 8/F2; SOP 8/F3; SOP 8/F4; SOP 8/F5; SOP 8/F6

ISO 17560Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
As written on the certificate · Line 1 (A2LA 2797.10)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1617; SOP 8/F1; SOP 8/F2; SOP 8/F3; SOP 8/F4; SOP 8/F5; SOP 8/F6

ISO 18114Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
As written on the certificate · Line 1 (A2LA 2797.10)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1617; SOP 8/F1; SOP 8/F2; SOP 8/F3; SOP 8/F4; SOP 8/F5; SOP 8/F6

Scope as published by A2LA

2 lines
A2LA

ISO/IEC 17025

Active

2797.10

The scope document we hold says it is valid until 2027-06-30.

View scope

Accredited scope, certificate 2797.10

LineDisciplineMethodMatrixRange
1chemicalISO 17560; ISO 14237; ISO 18114; SEMI MF1617; SOP 8/F1; SOP 8/F2; SOP 8/F3; SOP 8/F4; SOP 8/F5; SOP 8/F6Metal-
2chemical---

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

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Accreditation data refreshed from the A2LA register on .

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