Xingsheng Certification Service (Hefei) Co.,
Room B02, Quality Control Building B, Huntkey Science Park, No.716, Qingtan Road, Economic and Technological Development Zone, Hefei, Anhui, People's Republic of China, Hefei, Anhui, China
- Accredited standards
- 21
- A2LA certificate
- 1
- Site in our directory
- 1
What this lab is accredited for
Our reading of the A2LA scope: each standard once, with its official name where we have checked it.
Only this lab. Searches the 21 standard numbers and the 17 official names we hold. When no standard matches, it searches the method text of every scope line.
IEC 61000 series13
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)+1 national
National versions in the same scope
AS/NZS 61000.3.2identical to it
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection+1 national
National versions in the same scope
AS/NZS 61000.3.3identical to it
IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test+1 national
National versions in the same scope
AS/NZS 61000.4.2probably the same standard; matched by number only
IEC 61000-4-3Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test+1 national
National versions in the same scope
AS/NZS 61000.4.3probably the same standard; matched by number only
IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test+1 national
National versions in the same scope
AS/NZS 61000.4.4probably the same standard; matched by number only
IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test+1 national
National versions in the same scope
AS/NZS 61000.4.5probably the same standard; matched by number only
IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields+1 national
National versions in the same scope
AS/NZS 61000.4.6probably the same standard; matched by number only
IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test+1 national
National versions in the same scope
AS/NZS 61000.4.8probably the same standard; matched by number only
IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase+1 national
National versions in the same scope
AS/NZS 61000.4.11probably the same standard; matched by number only
IEC 61000-6-1Electromagnetic compatibility (EMC) - Part 6-1: Generic standards - Immunity standard for residential, commercial and light-industrial environments
IEC 61000-6-2Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity standard for industrial environments
IEC 61000-6-3Electromagnetic compatibility (EMC) - Part 6-3: Generic standards - Emission standard for equipment in residential environments
IEC 61000-6-4Electromagnetic compatibility (EMC) - Part 6-4: Generic standards - Emission standard for industrial environments
ETSI4
ETSI EN 301 489-1
ETSI EN 301 489-3
ETSI EN 301 489-17
ETSI EN 301 489-19
Other standards4
CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements+2 national
National versions in the same scope
AS/NZS CISPR 32identical to it
VCCI-CISPR 32probably the same standard; matched by number only
CISPR 35Electromagnetic compatibility of multimedia equipment - Immunity requirements+1 national
National versions in the same scope
AS/NZS CISPR 35probably the same standard; matched by number only
FCC PART 15Radio Frequency Devices
ICES-001Industrial, Scientific and Medical (ISM) Equipment
CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP-5:1986); ICES-001; ICES-003; CISPR 32; BS EN/EN 55032; VCCI-CISPR 32; AS/NZS CISPR 32; IEC 61000-3-2; BS EN/EN 61000-3-2; AS/NZS 61000.3.2; IEC 61000-3-3; BS EN/EN 61000-3-3; AS/NZS 61000.3.3; IEC 61000-4-2; BS EN/EN 61000-4-2; AS/NZS 61000.4.2; IEC 61000-4-3; BS EN/EN 61000-4-3; AS/NZS 61000.4.3; IEC 61000-4-4; BS EN/EN 61000-4-4; AS/NZS 61000.4.4; IEC 61000-4-5; BS EN/EN 61000-4-5; AS/NZS 61000.4.5; IEC 61000-4-6; BS EN/EN 61000-4-6; AS/NZS 61000.4.6; IEC 61000-4-8; BS EN/EN 61000-4-8; AS/NZS 61000.4.8; IEC 61000-4-11; BS EN/EN 61000-4-11; AS/NZS 61000.4.11
CISPR 35; BS EN/EN 55035; AS/NZS CISPR 35; IEC 61000-6-1; EN IEC/ EN/ BS EN IEC 61000-6-1; IEC 61000-6-2; EN IEC/ EN/ BS EN IEC 61000-6-2; IEC 61000-6-3; EN IEC/ EN/ BS EN IEC 61000-6-3; IEC 61000-6-4; EN IEC/ EN/ BS EN IEC 61000-6-4; ETSI EN 301 489-1; ETSI EN 301 489-3; ETSI EN 301 489-17; ETSI EN 301 489-19; FCC Part 15B; ANSI C63.4:2014; FCC Part 18; FCC MP-5:1986
Read from the A2LA scope document we downloaded on 2026-08-05. Register refreshed 2026-10-23.
Scope as published by A2LA
3 lines
ISO/IEC 17025
Active7253.02
The scope document we hold says it is valid until 2028-03-31.
Accredited scope, certificate 7253.02
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | CFR 47, FCC Part 15 Subpart B (using ANSI C63.4:2014); CFR 47, FCC Part 18 (using MP-5:1986); ICES-001; ICES-003; CISPR 32; BS EN/EN 55032; VCCI-CISPR 32; AS/NZS CISPR 32; IEC 61000-3-2; BS EN/EN 61000-3-2; AS/NZS 61000.3.2; IEC 61000-3-3; BS EN/EN 61000-3-3; AS/NZS 61000.3.3; IEC 61000-4-2; BS EN/EN 61000-4-2; AS/NZS 61000.4.2; IEC 61000-4-3; BS EN/EN 61000-4-3; AS/NZS 61000.4.3; IEC 61000-4-4; BS EN/EN 61000-4-4; AS/NZS 61000.4.4; IEC 61000-4-5; BS EN/EN 61000-4-5; AS/NZS 61000.4.5; IEC 61000-4-6; BS EN/EN 61000-4-6; AS/NZS 61000.4.6; IEC 61000-4-8; BS EN/EN 61000-4-8; AS/NZS 61000.4.8; IEC 61000-4-11; BS EN/EN 61000-4-11; AS/NZS 61000.4.11 | - | - |
| 2 | CISPR 35; BS EN/EN 55035; AS/NZS CISPR 35; IEC 61000-6-1; EN IEC/ EN/ BS EN IEC 61000-6-1; IEC 61000-6-2; EN IEC/ EN/ BS EN IEC 61000-6-2; IEC 61000-6-3; EN IEC/ EN/ BS EN IEC 61000-6-3; IEC 61000-6-4; EN IEC/ EN/ BS EN IEC 61000-6-4; ETSI EN 301 489-1; ETSI EN 301 489-3; ETSI EN 301 489-17; ETSI EN 301 489-19; FCC Part 15B; ANSI C63.4:2014; FCC Part 18; FCC MP-5:1986 | - | to 40000 MHz |
| 3 | ISO/IEC 17025:2017 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Labs with overlapping accredited scope in China
- DEKRA Testing and Certification (Suzhou) Co.,Suzhou, Jiangsu ProvinceA2LAShares 1 accredited test methodICES-001
- Dongguan Nore Testing Center Co.,Dongguan, GuangdongA2LAShares 1 accredited test methodICES-001
- DongGuan ShuoXin Electronic Technology Co.,GuangDongA2LAShares 1 accredited test methodICES-001
- EMTEK (Dongguan) Co.,Dongguan, GuangdongA2LAShares 1 accredited test methodICES-001
- EMTEK (NINGBO) Co.,Ningbo, ZhejiangA2LAShares 1 accredited test methodICES-001
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.