PHINIA TECHNOLOGIES HOLDINGS MÉXICO, S DE R.L. DE C.V

(A2LA Cert. No. 2264.01) 6/29/2026 Page 2 of 9 Parameter/Equipment Range CMC2, 5 (±) Comments Angle – Measuring Equipment Up to 90° 0.19° Angle block Pin Gage Diameter (0.025 to 1.75) in 50 µin Laser micrometer Indicators – Test & Dial Up to 1 in (1 to 4) in 120 µin 130 µin Gage blocks Rulers Up to 40 in 0.018 in Gage blocks III. Electrical – DC/Low Frequency Parameter/Equipment Range CMC2, 4 (±) Comments DC Voltage – Measure Up to 100 mV (0.1 to 1) V (1 to 10) V (10 to 100) V (100 to 1000) V 13 µV 69 µV 660 µV 9.0 mV 68 mV HP 34401A DC Voltage – Generate Up to 329.9 mV (0.33 to 3.29) V (3.3 to 32.9) V (33 to 329.9) V (330 to 1020) V 0.0021 % + 1 μV 0.0013 % + 2 μV 0.0013 % + 20 μV 0.0018 % + 150 μV 0.0020 % + 1.5 mV Fluke 5522A/SC600 DC Current – Measure (Up to 10) mA (10 to 100) mA (0.1 to 1) A (1 to 3) A (3 to 30) A 9.1 µA 130 µA 1.3 mA 5.3 mA 23 mA HP 34401A HP 34401A IET DCCS-0.001

(A2LA Cert. No. 2264.01) 6/29/2026 Page 3 of 9 Parameter/Equipment Range CMC2, 4 (±) Comments DC Current – Generate Up to 329.9 μA (0.33 to 3.29) mA (3.3 to 32.9) mA (33 to 329.9) mA (0.33 to 1.09) A (1.1 to 2.9) A (3 to 10.9) A (11 to 20.5) A 0.021 % + 0.02 μA 0.011 % + 0.05 μA 0.011 % + 0.25 μA 0.013 % + 2.5 μA 0.023 % + 40 μA 0.041 % + 40 μA 0.051 % + 500 μA 0.093 % + 750 μA Fluke 5522A/SC600 Resistance – Measure Up to 100 Ω (0.1 to 1) kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ (10 to 100) MΩ 17 mΩ 130 mΩ 1.3 Ω 13 Ω 130 mΩ 58 kΩ 940 kΩ HP 34401A Resistance – Generate (0 to 10.9) Ω (11 to 32.9) Ω (33 to 109.9) Ω (110 to 329.9) Ω 330 Ω to 1.09 kΩ (1.1 to 3.29) kΩ (3.3 to 10.9) kΩ (11 to 32.9) kΩ (33 to 109.9) kΩ (110 to 329.9) kΩ 330 kΩ to 1.09 MΩ (1.1 to 3.29) MΩ (3.3 to 10.9) MΩ (11 to 32.9) MΩ (33 to 109.9) MΩ (110 to 329.9) MΩ (330 to 1100) MΩ 1.7 mΩ 2.6 mΩ 4.7 mΩ 10 mΩ 30 mΩ 100 mΩ 300 mΩ 1.0 Ω 3.0 Ω 11 Ω 35 Ω 510 Ω 1.5 kΩ 10 kΩ 62 kΩ 0.96 MΩ 16 MΩ Fluke 5522A/SC600 AC Voltage – Measure 1 kHz Up to 100 mV (0.1 to 1) V (1 to 10) V (10 to 100) V (100 to 750) V 130 µV 1.2 mV 12 mV 120 mV 0.84 V HP 34401A

(A2LA Cert. No. 2264.01) 6/29/2026 Page 6 of 9 Parameter/Equipment Range CMC2, 4 (±) Comments Capacitance – Generate (220.0 to 399.9) pF (0.4 to 1.09) nF (1.1 to 3.29) nF (3.3 to 10.9) nF (11 to 32.9) nF (33 to 109.9) nF (110 to 329.9) nF (0.33 to 1.09) μF (1.1 to 3.29) μF (3.3 to 10.9) μF (11 to 32.9) μF (33 to 109.9) μF (110 to 329.9) μF (0.33 to 1.09) mF (1.1 to 3.29) mF (3.3 to 10.9) mF (11 to 32.9) mF (33 to 110) mF 3.5 % + 10 pF 1.6 % + 0.01 nF 0.73 % + 0.01 nF 0.62 % + 0.01 nF 0.52 % + 0.1 nF 0.35 % + 0.1 nF 0.36 % + 0.3 nF 0.62 % + 0.001 μF 0.36 % + 0.003 μF 0.37 % + 0.01 μF 0.46 % + 0.03 μF 0.73 % + 0.1 μF 0.49 % + 1 μF 0.72 % + 0.001 mF 0.49 % + 0.003 mF 0.50 % + 0.01 mF 0.85 % + 0.03 mF 1.3 % + 0.1 mF Fluke 5522A/SC600 Oscilloscopes – Level Sine Wave Flatness – Bandwidth DC Signal: 50 Ω Load 1 MΩ Load Square Wave: 50 Ω Load 1 MΩ Load Level Sine Wave Amplitude (50 kHz Reference) Time Marker 250 kHz to 1 GHz (-6.6 to 6.6) V (-130 to 130) V (-6.6 to 6.6) V 10 Hz to 10 kHz (-130 to 130) V 10 Hz to 10 kHz 50 kHz to 100 MHz (100 to 300) MHz (300 to 600) MHz 2 ns to 20 ms 50 ms to 5 s 1.2 Hz 0.29 % + 40 μV 0.058 % + 40 μV 1.3 % + 40 µV 1.5 % + 40 μV 0.47 % + 300 μV 2.2 % + 300 μV 2.4 % + 300 μV 5.8 µs/s 0.58 % + t · 0.1 % Agilent E4400B Fluke 5522A/SC600 t = time in seconds

(A2LA Cert. No. 2264.01) 6/29/2026 Page 8 of 9 Parameter/Equipment Range CMC2, 3, 5 (±) Comments Pressure – Measuring Equipment Hydraulic Pneumatic Vacuum (5 to 300) psi (300 to 1000) psi (1000 to 5000) psi (0 to 300) psi (0 to 12) psi 0.13 psi 0.041 % 0.12 % 0.029 % 0.76 % HPC41-1kPSI Crystal 5KPSIXP2i DPI 611 DPI 611 Torque – Torque Cell & Transducer (5 to 3000) lbf∙in 0.018 % NIST Class F deadweight & load arm Torque Tools (5 to 1200) lbf∙in (10 to 100) lbf∙ft (100 to 1000) lbf∙ft 0.58 % 0.58 % 0.58 % Torque transducer V. Thermodynamics Parameter/Equipment Range CMC2, 5 (±) Comments Temperature – Measuring Equipment (-80 to 200) °C 0.037 °C Fluke 525B w/ RTD Platinum Fluke 5615 Temperature – Measure (-80 to 300) °C 0.037 °C Fluke 525B w/ RTD Platinum Fluke 5615 Temperature Sensors – Type RTD, T/C Types J, K, T (-80 to 200) °C 0.071 °C Fluke 1552A-Ex Temperature measure – Type RTD, T/C Types J, K, T (-80 to 300) °C 0.071 °C Fluke 1552A-Ex

(A2LA Cert. No. 2264.01) 6/29/2026 Page 9 of 9 Parameter/Equipment Range CMC2, 5 (±) Comments Relative Humidity – Measuring Equipment (11 to 95) % RH 2.2 % RH Vaisala NM w/ probe HMP75 VI. Time & Frequency Parameter/Equipment Range CMC2, 3, 5 (±) Comments Frequency – Measuring Equipment (0.01 to 119.9) Hz (120.0 to 1199.9) Hz (1.20 to 11.9) kHz (12.00 to 119.9) kHz (120.0 to 1199.9) kHz (1.20 to 2.00) MHz 0.0048 % + 5 μHz 0.0048 % + 5 μHz 0.0055 % + 5μHz 0.0054 % + 5μHz 0.0048 % + 5 μHz 0.029 % + 5 μHz Fluke 5522A/SC600 Frequency – Measure 0.1 Hz to 225 MHz 180 mHz HP 53131A ___________________________________________ 1 This laboratory offers commercial calibration service 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavio r of the customer’s device and to influences from the circumstances of the specific calibration. 3 In the statement of CMC, % is read as a percentage of reading unless otherwise noted. 4 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification. 5 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter. 6 This scope meets A2LA’s P112 Flexible Scope Policy.