Crystal Instruments Corporation
2090 Duane Ave, 95054, Santa Clara, CA, United States
Visit website- Scope lines
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- A2LA certificate
- 1
- Site in our directory
- 1
What this lab is accredited for
We could not match the method references in this lab’s scope to published test standard numbers. The full scope as published is below.
Only this lab. Searches the method, matrix and range of each of the 3 scope lines.
A2LA certificate 7526.01 · 3 lines
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | ISO/IEC 17025:2017; ANSI/NCSLI Z540-1-1994 | - | to 100 mV |
| 2 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 7526.01) 12/04/2025 Page 2 of 2
Parameter/Range
Frequency CMC1,2 Comments
AC Voltage – Measure
and Generate cont.
>1 to 10 V
(5 to 10) Hz
>10 Hz to 20 kHz
(>20 to 50) kHz
0.27 % + 0.0025 V
0.044 % + 0.0026 V
0.11 % + 0.0039 V
Fluke 8845A,
Keithley
DMM6500
II. Thermodynamics
Parameter/Range
Frequency CMC1,2 Comments
Frequency – Measure and
Measuring Equipment
(10 to <2000) Hz
(2 to 45) kHz
0.0079 % + 0.0019 Hz
0.0069 % + 0.000 47 kHz
Fluke 8845A,
Keithley
DMM6500
_________________________
1 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
2 In the statement of CMC, percentages are defined as the percentage of reading. | ||
| 3 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
Labs with overlapping accredited scope in United States
- SIMCO Electronics - Silicon ValleySanta Clara, CA · under 1 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Trescal, Inc. - Silicon Valley, CASan Jose, CA · ~6 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Pacific Calibration ServiceCampbell, CA · ~8 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- HCT AmericaMilpitas, CA · ~10 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- International Process SolutionsSan Carlos, CA · ~32 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.