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United States

Eurofins EAG Materials Science - NJ

104 Windsor Center Drive, Suite 101, 08520, East Windsor, NJ, United States

A2LA|2797.05ISO/IEC 17025Register refreshed 2026-09-25
Certificates
1
Scope items
2
Standards
7
Locations
1

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Register record

A2LARefreshed
2797.05Active

Accredited standards

7

Our reading of the A2LA scope: each standard once, with its official name where we have checked it. Click a standard to see the scope line it comes from, word for word.

ASTM E827Name not checked yet
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 14237Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 15472Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 17560Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 18114Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 21270Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

ISO 24237Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
As written on the certificate · Line 1 (A2LA 2797.05)

ISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STD

Scope as published by A2LA

2 lines
A2LA

ISO/IEC 17025

Active

2797.05

The scope document we hold says it is valid until 2027-08-31.

View scope

Accredited scope, certificate 2797.05

LineDisciplineMethodMatrixRange
1chemicalISO 17560; ISO 14237; ISO 18114; ISO 15472; ISO 24237; ASTM E827; ISO 21270; SEMI F60; SEMI F19; SEMATECH 90120403B-STD; SEMATECH 91060573B-STDMetal-
2chemical---

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

104 Windsor Center Drive, Suite 101, East Windsor, NJ, 08520, US

40.26822, -74.54096

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