HCT Co.,
74, Seoicheon-ro 578 Beon-gil, Majang-Myeon, Icheon-Si, Gyeonggi-Do, 17383, South Korea, Icheon-Si, Gyeonggi-Do, South Korea
Free. We check which accredited labs can do it, starting with this one, and reply within two working days with who can do it, how fast, and roughly what it costs.
Only the laboratory you pick gets your contact details. We ask the others without them.
Contact this laboratory
Work at HCT Co.,?
Claim this profile to keep it accurate.
Register record
- A2LARefreshed
- 4114.01Active
Accredited standards
28Our reading of the A2LA scope: each standard once, with its official name where we have checked it. Click a standard to see the scope line it comes from, word for word.
IEC 61000 series
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-3Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity testCertificate says EN 61000-4-3. Probably the same standard; not checked against the EN document.
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
IEC 61000-4-39Electromagnetic compatibility (EMC) - Part 4-39: Testing and measurement techniques - Radiated fields in close proximity - Immunity test
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
ISO
ISO 178Plastics - Determination of flexural properties
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 179-1Plastics - Determination of Charpy impact properties - Part 1: Non-instrumented impact test
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 180Plastics - Determination of Izod impact strength
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 527-1Plastics - Determination of tensile properties - Part 1: General principles
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 7637-2Road vehicles - Electrical disturbances from conduction and coupling - Part 2: Electrical transient conduction along supply lines only
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 7637-3Road vehicles - Electrical disturbances from conduction and coupling - Part 3: Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 8256Plastics - Determination of tensile-impact strength
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 10605Road vehicles - Test methods for electrical disturbances from electrostatic discharge
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 11452 series
ISO 11452-2Road vehicles - Component test methods for electrical disturbances from narrowband radiated electromagnetic energy - Part 2: Absorber-lined shielded enclosure
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 11452-4Road vehicles - Component test methods for electrical disturbances from narrowband radiated electromagnetic energy - Part 4: Harness excitation methods
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 11452-8Road vehicles - Component test methods for electrical disturbances from narrowband radiated electromagnetic energy - Part 8: Immunity to magnetic fields
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
ISO 11452-9Road vehicles - Component test methods for electrical disturbances from narrowband radiated electromagnetic energy - Part 9: Portable transmitters
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
Other standards
ANSI C63.10Name not checked yet
CFR 47, FCC Part 95 (using ANSI C63.26:2015); CFR 47, FCC Part 96 (using ANSI C63.26:2015); CFR 47, FCC Part 97 (using ANSI C63.26:2015); CFR 47, FCC Part 101 (using ANSI C63.26:2015); ANSI C63.10-2013; ANSI C63.10-2020; KDB 905462 D02 (v02)
ANSI C63.26Name not checked yet
ANSI C63.26-2015; IEEE Std 1528-2013; ANSI C63.19-2011; ANSI C63.19-2019
CISPR 14-1Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 1: Emission
CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39
CISPR 25Vehicles, boats and internal combustion engines - Radio disturbance characteristics - Limits and methods of measurement for the protection of on-board receivers
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
IEC 60601-1-2Medical electrical equipment - Part 1-2: General requirements for basic safety and essential performance - Collateral Standard: Electromagnetic disturbances - Requirements and tests
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
IEC 62368-1Audio/video, information and communication technology equipment - Part 1: Safety requirements
CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256
Scope as published by A2LA
7 lines
ISO/IEC 17025
Active4114.01
The scope document we hold says it is valid until 2027-08-31.
Accredited scope, certificate 4114.01
| Line | Discipline | Method | Matrix | Range |
|---|---|---|---|---|
| 1 | electrical | CISPR 11:2015+AMD1:2016+AMD2:2019; CISPR 14-1; CISPR 14-1:2016; CISPR 32; IEC 61000-3-2; IEC 61000-3-2:2005+AMD1:2008+AMD2:2009; IEC 61000-3-3; IEC 61000-4-2; IEC 61000-4-2:2008; IEC 61000-4-3; IEC 61000-4-3:2006+AMD1:2007+AMD2:2010; IEC 61000-4-4; IEC 61000-4-5:2014+AMD1:2017; IEC 61000-4-6; IEC 61000-4-6:2013; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-11:2004+AMD1:2017; IEC 61000-4-39 | - | to 40 GHz |
| 2 | electrical | CISPR 25; ISO 10605; ISO 11452-2; ISO 11452-9; ISO 11452-8; ISO 11452-4; ISO 7637-2:2004; ISO 7637-2; ISO 7637-3; ECE Regulation No.10 (Annex 7, 8, 9 (Appendix 3, 4), 10); IEC/EN 60601-1-2; EN 62368-1:2014+A11:2017; EN IEC 62368-1:2020+A11:2020; EN IEC 62368-1:2024+A11:2024; IEC 62368-1:2014; IEC 62368-1:2018; IEC 62368-1:2023; AS/NZS 62368.1:2018; AS/NZS 62368.1:2022; ISO 527; ISO 178; ISO 179; ISO 180; ISO 8256 | - | - |
| 3 | - | - | - | - |
| 4 | - | - | - | - |
| 5 | electrical | CFR 47, FCC Part 95 (using ANSI C63.26:2015); CFR 47, FCC Part 96 (using ANSI C63.26:2015); CFR 47, FCC Part 97 (using ANSI C63.26:2015); CFR 47, FCC Part 101 (using ANSI C63.26:2015); ANSI C63.10-2013; ANSI C63.10-2020; KDB 905462 D02 (v02) | - | to 325000 MHz |
| 6 | electrical | ANSI C63.26-2015; IEEE Std 1528-2013; ANSI C63.19-2011; ANSI C63.19-2019 | - | to 325000 MHz |
| 7 | electrical | - | - | - |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
74, Seoicheon-ro 578 Beon-gil, Majang-Myeon, Icheon-Si, Gyeonggi-Do, 17383, South Korea, Icheon-Si, Gyeonggi-Do, KR
37.28088, 127.44291
Open in MapsAccreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.