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United States

Eurofins EAG Materials Science - CA

810 Kifer Road, 94086, Sunnyvale, CA, United States

A2LA|2797.01ISO/IEC 17025Register refreshed 2026-09-25
Certificates
1
Scope items
3
Standards
10
Locations
1

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Register record

A2LARefreshed
2797.01Active

Accredited standards

10

Our reading of the A2LA scope: each standard once, with its official name where we have checked it. Click a standard to see the scope line it comes from, word for word.

ASTM E334Name not checked yet
As written on the certificate · Line 1 (A2LA 2797.01)

ISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766

ASTM E766Name not checked yet
As written on the certificate · Line 1 (A2LA 2797.01)

ISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766

ASTM E827Name not checked yet
As written on the certificate · Line 1 (A2LA 2797.01)

ISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766

ASTM E1252Name not checked yet
As written on the certificate · Line 1 (A2LA 2797.01)

ISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766

ISO 14237Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
As written on the certificate · Line 2 (A2LA 2797.01)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237

ISO 15472Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
As written on the certificate · Line 2 (A2LA 2797.01)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237

ISO 17560Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
As written on the certificate · Line 2 (A2LA 2797.01)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237

ISO 18114Surface chemical analysis - Secondary-ion mass spectrometry - Determination of relative sensitivity factors from ion-implanted reference materials
As written on the certificate · Line 2 (A2LA 2797.01)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237

ISO 21270Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
As written on the certificate · Line 1 (A2LA 2797.01)

ISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766

ISO 24237Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
As written on the certificate · Line 2 (A2LA 2797.01)

ISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237

Scope as published by A2LA

3 lines
A2LA

ISO/IEC 17025

Active

2797.01

The scope document we hold says it is valid until 2027-02-28.

View scope

Accredited scope, certificate 2797.01

LineDisciplineMethodMatrixRange
1chemicalISO/IEC 17025:2017; ISO 21270; ASTM E827; ASTM E1252; ASTM E334; ASTM E766Metal-
2materialsISO 17560; ISO 14237; ISO 18114; SEMI MF1528; SEMI MF1366; SEMI MF2139; SEMI MF1366-0305; SEMI MF1517-0304; ISO 15472; ISO 24237--
3chemical---

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

810 Kifer Road, Sunnyvale, CA, 94086, US

37.36883, -122.03635

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