Grand Rapids Metrology

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 2 of 17 Parameter/Equipment Range CMC2, 4 (±) Comments Gage Balls (0.125 to 1) in (20 + 7D) µin P&W Labmaster TM, gage block masters Gage Blocks (0.005 to 12) in (3.9 + 3.0L) µin P&W Labmaster TM, gage block masters Height Gages 3 Up to 40 in (600 + 41L) µin Gage blocks, surface plate Snap Gages (0.25 to 8) in (18 + 7L) µin P&W Labmaster TM, master rings Bore Gage Up to 8 in 58 µin Master rings Micrometers3 – Outside Up to 12 in (12 to 60) in (55 + 8L) µin (530 + 5L) µin Gage blocks Optical Comparator 3 – Axis Linearity Magnification Angle Up to 12 in (10, 20, 50, 100, 125, 250) x Up to 90° (260 + 0.5L) µin (620 + 0.5L) µin 0.3° Glass master scales, angle blocks Rules & Tape Measures 3 Up to 100 ft 0.6R in Gage blocks Thread Plugs – Pitch Diameter: (0.3 to 80 TPI) Major Diameter Up to 4 in Up to 4 in (88 + 6D) µin (13 + 8D) µin P&W Labmaster TM, gage block masters, thread wire masters TPI = Threads per Inch

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 3 of 17 Parameter/Equipment Range CMC2, 4 (±) Comments Thread Wires Up to 0.500 in diameter (31 + 6D) µin P&W Labmaster TM, gage block masters, plug gage masters Protractors Up to 360° 0.08° Sine plate, gage blocks Surface Plates 3 – Flatness Repeatability Up to 144 in Up to 144 in (72 + 0.3L) µin 49 µin Planekator Repeat-o-meter II. Electrical – DC/Low Frequency Parameter/Equipment Range CMC 2, 5, 6 (±) Comments DC Voltage – Generate 3 (0 to 330) mV 330 mV to 3.3 V (3.3 to 33) V (33 to 330) V (100 to 1000) V 20 µV/V + 1 µV 11 µV/V + 2 µV 12 µV/V + 20 µV 18 µV/V + 150 µV 18 µV/V + 1.5 mV Fluke 5522A DC Voltage – Measure3 (0 to 100) mV 100 mV to 1 V (1 to 10) V (10 to 100) V (100 to 1000) V (1 to 9) kV 14 µV/V + 3 µV 7 µV/V + 0.3 µV 6 µV/V + 0.05 µV 10 µV/V + 0.3 µV 9 µV/V + 0.1 µV 0.12 % Hewlett Packard 3458A opt 002 Vitrek 4700 DC Current – Measure 3 (0 to 100) nA 100 nA to 1 µA (1 to 10) µA (10 to 100) µA 100 µA to 1 mA (1 to 10) mA (10 to 100) mA 100 mA to 1 A 59 µA/A + 0.4 nA 90 µA/A + 0.04 nA 66 µA/A + 0.01 nA 29 µA/A + 0.008 nA 25 µA/A + 0.005 µA 25 μA/A + 5 μA 40 μA/A + 5 μA 120 μA/A + 10 μA Hewlett Packard 3458A opt 002

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 4 of 17 Parameter/Equipment Range CMC2, 5, 6 (±) Comments DC Current – Measure 3 (cont) (1 to 10) A (10 to 100) A (100 to 500) A (500 to 1000) A (1000 to 1500) A 0.29 % 0.29 % 1.4 % 2.9 % 4.3 % Empro shunt w/ Agilent 3458A DC Current – Generate 3 (0 to 330) μA (0 to 3.3) mA (0 to 33) mA (0 to 330) mA (0 to 1.1) A (1.1 to 3) A (0 to 11) A (11 to 20.5) A (20.5 to 150) A (150 to 1000) A 0.26 % + 0.02 µA 0.029 % + 0.05 µA 0.011 % + 0.25 µA 0.024 % + 2.5 µA 0.024 % + 40 µA 0.039 % + 40 µA 0.055 % + 500 µA 0.10 % + 750 µA 0.9 % 0.89 % Fluke 5522A Fluke 5522A w/ 5500A/coil Resistance – Generate 3 (0 to 11) Ω (11 to 33) Ω (33 to 110) Ω (110 to 330) Ω (0.33 to 1.1) kΩ (1.1 to 3.3) kΩ (3.3 to 11) kΩ (11 to 33) kΩ (33 to 110) kΩ (110 to 330) kΩ (0.33 to 1.1) MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ (110 to 330) MΩ (0.33 to 1.1) GΩ 100 MΩ to 1 TΩ 41 µΩ/Ω + 0.001 Ω 30 µΩ/Ω + 0.0015 Ω 29 µΩ/Ω + 0.0014 Ω 28 µΩ/Ω + 0.002 Ω 28 µΩ/Ω + 0.002 Ω 28 µΩ/Ω + 0.02 Ω 28 µΩ/Ω + 0.02 Ω 28 µΩ/Ω + 0.2 Ω 28 µΩ/Ω + 0.2 Ω 32 µΩ/Ω + 2 Ω 33 µΩ/Ω + 2 Ω 60 µΩ/Ω + 30 Ω 0.013 % + 50 Ω 0.025 % + 2.5 kΩ 0.051 % + 3 kΩ 0.30 % + 100 kΩ 1.5 % + 500 kΩ 2.4 % Fluke 5522A IET HRRS-5kV Resistance – Measure 3 (0 to 10) Ω (10 to 100) Ω 100 Ω to 1 kΩ (1 to 10) kΩ (10 to 100) kΩ 100 kΩ to 1 MΩ 22 µΩ/Ω + 50 µΩ 18 µΩ/Ω + 0.5 µΩ 11 µΩ/Ω + 0.5 mΩ 11 µΩ/Ω + 5 mΩ 11 µΩ/Ω + 50 mΩ 19 µΩ/Ω + 2 Ω Hewlett Packard 3458A opt 002

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 5 of 17 Parameter/Equipment Range CMC2, 6 (±) Comments Resistance – Measure 3 (cont) (1 to 10) MΩ (10 to 100) MΩ 100 MΩ to 1 GΩ 61 µΩ/Ω + 100 Ω 0.052 % + 1 kΩ 0.52 % + 10 kΩ Hewlett Packard 3458A opt 002 Parameter/Range Frequency CMC2, 6 (±) Comments Capacitance – Generate 3 (220 to 399.9) pF (0.4 to 1.0999) nF (1.1 to 3.2999) nF (3.3 to 10.9999) nF (11 to 32.9999) nF (33 to 109.999) nF (110 to 329.999) nF (0.33 to 1.099 99) μF (1.1 to 3.299 99) μF (3.3 to 10.9999) μF (11 to 32.9999) μF (33 to 109.999) μF (110 to 329.999) μF (0.33 to 1.099 99) mF (1.1 to 3.299 99) mF (3.3 to 10.9999) mF (11 to 32.9999) mF (33 to 110) mF (10 to 10 000) Hz (10 to 10 000) Hz (10 to 3000) Hz (10 to 1000) Hz (10 to 1000) Hz (10 to 1000) Hz (10 to 1000) Hz (10 to 600) Hz (10 to 300) Hz (10 to 150) Hz (10 to 120) Hz (10 to 80) Hz (0 to 50) Hz (0 to 20) Hz (0 to 6) Hz (0 to 2) Hz (0 to 0.6) Hz (0 to 0.2) Hz 0.41 % + 10 pF 0.39 % + 0.01 nF 0.39 % + 0.01 nF 0.20 % + 0.01 nF 0.19 % + 0.01 nF 0.19 % + 0.01 nF 0.19 % + 0.03 nF 0.56 % + 1 nF 0.26 % + 3 nF 0.20 % + 10 nF 0.31 % + 30 nF 0.35 % + 100 nF 0.35 % + 300 nF 0.35 % + 1 μF 0.35 % + 3 μF 0.35 % + 10 μF 0.60 % + 30 μF 0.43 % + 100 μF Fluke 5522A AC Voltage – Generate 3 (1 to 33) mV (33 to 330) mV (10 to 45) Hz 45 Hz to 10 kHz (10 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 500) kHz (10 to 45) Hz (45 Hz to 10 kHz) (10 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 500) kHz 0.10 % + 6 µV 0.042 % + 6 µV 0.046 % + 6 µV 0.12 % + 6 µV 0.39 % + 12 µV 0.95 % + 50 µV 0.042 % + 8 µV 0.032 % + 8 µV 0.033 % + 8 µV 0.046 % + 8 µV 0.094 % + 32 µV 0.22 % + 70 µV Fluke 5522A

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 6 of 17 Parameter/Range Frequency CMC2, 6 (±) Comments AC Voltage – Generate 3 (cont) (0.33 to 3.3) V (3.3 to 33) V (33 to 330) V (330 to 1020) V (10 to 45) Hz 45 Hz to 10 kHz (10 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 500) kHz (10 to 45) Hz 45 Hz to 10 kHz (10 to 20) kHz (20 to 50) kHz (50 to 100) kHz 45 Hz to 1 kHz (1 to 10) kHz (10 to 20) kHz (20 to 50) kHz (50 to 100) kHz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10 kHz 0.041 % + 50 µV 0.031 % + 60 µV 0.034 % + 60 µV 0.041 % + 50 µV 0.078 % + 130 µV 0.26 % + 600 µV 0.24 % + 650 µV 0.031 % + 600 µV 0.037 % + 600 µV 0.045 % + 600 µV 0.098 % + 1.6 mV 0.020 % + 2 mV 0.022 % + 6 mV 0.027 % + 6 mV 0.032 % + 6 mV 0.22 % + 50 mV 0.031 % + 10 mV 0.026 % + 10 mV 0.031 % + 10 mV Fluke 5522A AC Voltage – Measure 3 Up to 10 mV 10 mV to 10 V (10 to 100) V (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 2) MHz (1 to 40) Hz 40 Hz to 1 kHz 0.030 % + 3 µV 0.020 % + 1.1 µV 0.030 % + 1.1 µV 0.10 % + 1.1 µV 0.50 % + 1.1 µV 4.0 % + 2 µV 0.007 % + 0.4 mV 0.007 % + 0.2 mV 0.014 % + 0.2 mV 0.030 % + 0.2 mV 0.080 % + 0.2 mV 0.30 % + 1.0 mV 1.0 % + 1.0 mV 1.5 % + 1.0 mV 0.020 % + 4 mV 0.020 % + 2 mV Hewlett Packard 3458A opt 002

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 7 of 17 Parameter/Range Frequency CMC2, 6 (±) Comments AC Voltage – Measure 3 (cont) (10 to 100) V (100 to 1000) V (0.7 to 9) kV (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (50 to 60) Hz 0.020 % + 2 mV 0.035 % + 2 mV 0.12 % + 2 mV 0.40 % + 10 mV 1.5 % + 10 mV 0.040 % + 40 mV 0.040 % + 20 mV 0.060 % + 20 mV 0.12 % + 20 mV 0.30 % + 20 mV 0.15 % + 0.1 V Hewlett Packard 3458A opt 002 Vitrek 4700 AC Current – Generate 3 (29 to 330) µA (0.33 to 3.3) mA (3.3 to 33) mA (33 to 330) mA (10 to 20) Hz (20 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (10 to 30) kHz (10 to 20) Hz (20 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (10 to 30) kHz (10 to 20) Hz (20 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (10 to 30) kHz (10 to 20) Hz (20 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (10 to 30) kHz 0.23 % + 0.1 µA 0.32 % + 0.1 µA 0.16 % + 0.1 µA 0.35 % + 0.15 µA 0.86 % + 0.2 µA 1.7 % + 0.4 µA 0.21 % + 0.15 µA 0.13 % + 0.15 µA 0.11 % + 0.1 µA 0.21 % + 0.2 µA 0.51 % + 0.3 µA 1.0 % + 0.6 µA 0.19 % + 2 µA 0.10 % + 2 µA 0.053 % + 2 µA 0.090 % + 2 µA 0.21 % + 3 µA 0.41 % + 4 µA 0.19 % + 20 µA 0.10 % + 20 µA 0.053 % + 20 µA 0.12 % + 50 µA 0.23 % + 100 µA 0.46 % + 200 µA Fluke 5522A

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 8 of 17 Parameter/Range Frequency CMC2, 5, 6 (±) Comments AC Current – Generate 3 (cont) (0.33 to 1.1) A (1.1 to 3) A (3 to 11) A (11 to 20.5) A Clamp-On Only: (20.5 to 150) A (150 to 1000) A (20.5 to 150) A (150 to 450) A (10 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (10 to 45) Hz 45 Hz to 1 kHz (1 to 5) kHz (5 to 10) kHz (45 to 100) Hz 100 Hz to 1 kHz (1 to 5) kHz (45 to 100) Hz 100 Hz to 1 kHz (1 to 5) kHz (45 to 65) Hz (45 to 65) Hz (65 to 440) Hz (65 to 440) Hz 0.21 % + 100 µA 0.098 % + 100 µA 0.70 % + 1 mA 3.0 % + 5 mA 0.19 % + 100 µA 0.070 % + 100 µA 0.63 % + 1 mA 2.7 % + 5 mA 0.080 % + 2 mA 0.12 % + 2 mA 3.0 % + 2 mA 0.15 % + 5 mA 0.18 % + 5 mA 3.0 % + 5 mA 0.42 % 0.44 % 1.2 % 1.2 % Fluke 5522A Fluke 5522A w/ 5500A/coil AC Current – Measure3 (0 to 100) µA (1 to 100) mA (0.1 to 1) A (10 to 20) Hz (20 to 45) Hz (45to 100) Hz 100 Hz to 5 kHz (10 to 20) Hz (20 to 45) Hz (45 to 100) Hz 100 Hz to 5 kHz (5 to 20) kHz (20 to 50) kHz (50 to 100) kHz (10 to 20) Hz (20 to 45) Hz 0.40 % + 0.03 µA 0.15 % + 0.03 µA 0.060 % + 0.03 µA 0.060 % + 0.03 µA 0.40 % + 20 µA 0.15 % + 30 µA 0.060 % + 20 µA 0.030 % + 20 µA 0.060 % + 20 µA 0.40 % + 40 µA 0.55 % + 0.15 mA 0.40 % + 200 µA 0.16 % + 200 µA Hewlett Packard 3458A opt 002

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 9 of 17 Parameter/Range Frequency CMC2, 6 (±) Comments AC Current – Measure3 (cont) (0.1 to 1) A (45 to 100) Hz 100 Hz to 5 kHz (5 to 20) kHz (20 to 50) kHz 0.080 % + 200 µA 0.10 % + 200 µA 0.30 % + 200 µA 1.0 % + 400 µA Hewlett Packard 3458A opt 002 Parameter/Range Frequency CMC2, 6 (±) Comments Oscilloscopes3 – Square Wave Signal: (1 kHz Input): 50 Ω Load @ 1 kHz 1 MΩ Load @ 1 kHz DC Volt Amplitude: 50 Ω Load 1 MΩ Load Leveled Sine Wave: Frequency Square Wave Signal: (1 kHz Input): Leveled Sine Wave Amplitude Flatness (Bandwidth) Time Marker Rise Time 1 mV to 6.6 V pk – pk 1 mV to 130 Vpk – pk (0 to 6.6) V (0 to 130) V (0 to 1100) MHz 50 kHz (Reference) 50 kHz to 100 MHz (100 to 300) MHz (300 to 600) MHz (600 to 1100) MHz 50 kHz to 100 MHz (100 to 300) MHz (300 to 600) MHz (600 to 1100) MHz 5 s to 50 ms 20 ms to 1 ns ≥ 300 ps 0.19 % + 40 μV 0.08 % + 40 μV 0.19 % + 40 μV 0.04 % + 40 μV 2.3 μHz/Hz 1.6 % + 300 μV 2.7 % + 300 μV 3.1 % + 300 μV 4.7 % + 300 μV 5.4 % + 300 μV 1.2 % + 100 μV 1.6 % + 100 μV 3.1 % + 100 μV 3.9 % + 100 μV (19 + 1000t) μs/s 1.4 μs/s 79 ps Fluke 5522A SC1100 t = time in seconds

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 10 of 17 Parameter/Equipment Range CMC2 (±) Comments Electrical Calibration of RTD Indicators3 – Pt 385, 100 Ω Pt 385, 200 Ω Pt 385, 500 Ω Pt 385, 1000 Ω Pt 3916, 100 Ω (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 300) °C (300 to 400) °C (400 to 630) °C (630 to 800) °C (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 260) °C (260 to 300) °C (300 to 400) °C (400 to 600) °C (600 to 630) °C (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 260) °C (260 to 300) °C (300 to 400) °C (400 to 600) °C (600 to 630) °C (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 260) °C (260 to 300) °C (300 to 400) °C (400 to 600) °C (600 to 630) °C (-200 to -190) °C (-190 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 260) °C (260 to 300) °C (300 to 400) °C (400 to 600) °C (600 to 630) °C 0.06 °C 0.06 °C 0.09 °C 0.1 °C 0.1 °C 0.2 °C 0.3 °C 0.05 °C 0.05 °C 0.05 °C 0.07 °C 0.2 °C 0.2 °C 0.2 °C 0.2 °C 0.05 °C 0.06 °C 0.06 °C 0.07 °C 0.1 °C 0.1 °C 0.1 °C 0.2 °C 0.04 °C 0.04 °C 0.05 °C 0.06 °C 0.08 °C 0.08 °C 0.09 °C 0.3 °C 0.3 °C 0.06 °C 0.06 °C 0.08 °C 0.09 °C 0.1 °C 0.2 °C 0.2 °C 0.3 °C Fluke 5522A

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 11 of 17 Parameter/Equipment Range CMC2 (±) Comments Electrical Calibration of RTD Indicators3 – (cont) Pt 3926, 100 Ω PtNi 385, 100 Ω Cu 427, 10 Ω (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 300) °C (300 to 400) °C (400 to 630) °C (-80 to 0) °C (0 to 100) °C (100 to 260) °C (-100 to 260) °C 0.06 °C 0.06 °C 0.09 °C 0.2 °C 0.2 °C 0.2 °C 0.1 °C 0.1 °C 0.2 °C 0.4 °C Fluke 5522A Thermocouple Simulation 3 – Type E Type J Type K Type R Type S (-250 to -100) °C (-100 to -25) °C (-25 to 350) °C (350 to 650) °C (650 to 1000) °C (-210 to -100) °C (-100 to -30) °C (-30 to 150) °C (150 to 760) °C (760 to 1200) °C (-200 to 100) °C (-100 to -25) °C (-25 to 120) °C (120 to 1000) °C (1000 to 1372) °C (0 to 250) °C (250 to 400) °C (400 to 1000) °C (1000 to 1767) °C (0 to 250) °C (250 to 1000) °C (1000 to 1400) °C (1400 to 1767) °C 0.52 °C 0.17 °C 0.15 °C 0.17 °C 0.22 °C 0.33 °C 0.17 °C 0.15 °C 0.18 °C 0.24 °C 0.59 °C 0.19 °C 0.17 °C 0.26 °C 0.40 °C 0.63 °C 0.43 °C 0.37 °C 0.43 °C 0.52 °C 0.40 °C 0.39 °C 0.48 °C

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 13 of 17 Parameter/Equipment Range CMC2, 5 (±) Comments Balances 3 (cont) (200 to 1000) g (1000 to 2000) g (2000 to 10 000) g (10 000 to 20 000) g (20 000 to 40 000) g 0.002 % 0.002 % 0.002 % 0.002 % 0.002 % Verification w/ class 1, 3 & F weights Mass, Fixed Points (1, 2, 3, 5) mg (10, 20, 30, 50) mg (100, 200, 300) mg 500 mg 1 g 2 g (3, 4, 5) g (10, 20) g (30, 40) g 50 g 100 g 200 g 300 g (400, 500) g 1 kg (2, 3, 4) kg 5 kg 10 kg 20 kg 25 kg (1/32, 1/16, 1/8) oz (1/4, 1/2) oz (1, 2) oz 4 oz 8 oz 0.001 lb 0.002 lb 0.005 lb 0.01 lb 0.02 lb 0.05 lb 0.1 lb 0.2 lb 1 lb 2 lb (3, 4, 5) lb 10 lb (20, 25) lb 50 lb 0.006 mg 0.006 mg 0.007 mg 0.007 mg 0.01 mg 0.01 mg 0.01 mg 0.02 mg 0.10 mg 0.10 mg 0.10 mg 0.15 mg 20 mg 20 mg 20 mg 22 mg 22 mg 270 mg 250 mg 420 mg 0.000 004 oz 0.000 005 oz 0.000 017 oz 0.000 017 oz 0.000 17 oz 0.000 000 22 lb 0.000 000 15 lb 0.000 000 2 lb 0.000 000 15 lb 0.000 000 22 lb 0.000 000 31 lb 0.000 000 57 lb 0.000 000 75 lb 0.000 021 lb 0.000 013 lb 0.000 035 lb 0.000 044 lb 0.0006 lb 0.000 93 lb Comparison to Class 1 standard weights

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 15 of 17 IV. Thermodynamics Parameter/Equipment Range CMC2, 8 (±) Comments Temperature – Measure 3 (-200 to 0) °C (0 to 350) °C (350 to 704) °C (704 to 1250) °C (-35 to 0) °C (0 to 150) °C (150 to 375) °C 3.6 °C 1.7 °C 3.3 °C 5.8 °C 0.13 °C 0.13 °C 0.14 °C Fluke 744, SLE type T thermocouple Fluke 744, SLE type K thermocouple 1560 black stack, 2560 probe module, SPRT probe Temperature – Thermometers, Temperature Probes, Measuring Equipment 3 (-80 to -35) °C (-35 to 0) °C (0 to 150) °C (150 to 375) °C 0.37 °C 0.13 °C 0.13 °C 0.14 °C 1560 black stack, 2560 probe module, SPRT probe Infrared Temperature Devices 0 °C (35 to 100) °C (100 to 200) °C (200 to 350) °C (350 to 500) °C 0.8 °C 1.0 °C 1.5 °C 2.7 °C 3.5 °C Ice bath Fluke 4181 blackbody calibrator Relative Humidity – Measure (10 to 90) % RH (90 to 98) % RH 1.8 % RH 2.6 % RH Vaisala MI70 w/ HMP77 probe V. Time & Frequency Parameter/Equipment Range CMC 2, 8 (±) Comments Stopwatches & Timers 3 0.1 s to 24 hr (+10 to -10) s/day 0.068 s 0.07 s/day HP 53131A opt 010 timometer 4500 Frequency – Measuring Equipment 3 (0.01 to 119.99) Hz (120.0 to 1199.9) Hz (1.200 to 11.999) kHz (12.00 to 119.99) kHz (120.0 to 1199.9) kHz (1.200 to 2.000) MHz 0.01 % + 5 µHz 0.01 % + 5 µHz 0.01 % + 5 µHz 0.01 % + 5 µHz 0.07 % + 5 µHz 0.2 % + 5 µHz Fluke 5522A

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 16 of 17 SATELLITE LABORATORY GRAND RAPIDS METROLOGY, INC. 28500 Eureka Rd. Romulus, MI 48174 Jennifer Turner Phone: 734 942 0696 I. Mechanical Parameter/Equipment Range CMC2, 5 (±) Comments Analytical Balances 3 3 mg to 300 g 0.61 mg Verification with Class 1 weights Balances3 (300 to 1000) g (1000 to 2000) g (2000 to 10 000) g (10 000 to 20 000) g (20 000 to 40 000) g 0.002 % 0.002 % 0.002 % 0.002 % 0.002 % Verification with Class 1, 3 and F weights Scales 3 (0 to 200 000) lb 0.02 % Verification with Class F weights ______________________________________ 1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g., resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC.

(A2LA Cert. No. 1489.01) Revised 02/27/2026 Page 17 of 17 4 In the statement of CMC, R is the numerical value of the resolution of the device under test in RPM or in pounds-force or in microinches, and L is the numerical value of the nominal length of the device measured in inches. D is the numerical value of the nominal diameter of the device measured in inches. 5 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated. 6 The stated measured values are determined usin g the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a fraction/percentage of the reading plus a fixed floor specification. 7 This scope meets A2LA’s P112 Flexible Scope Policy. 8 The type of instrument or material being calib rated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.