Northrop Grumman Mission Systems BWI

(A2LA Cert. No. 2418.01) 08/20/2024 Page 2 of 15 Parameter/Equipment Range CMC2,5 (±) Comments Resistance – Generate & Measure, Fixed Points 1 Ω 10 Ω 100 Ω 1 kΩ 10 kΩ 100 kΩ 1 MΩ 10 MΩ 100 MΩ 1 GΩ 0.46 µΩ/Ω 0.18 µΩ/Ω 0.19 µΩ/Ω 0.38 µΩ/Ω 0.16 µΩ/Ω 0.57 µΩ/Ω 0.77 µΩ/Ω 4.0 µΩ/Ω 21 µΩ/Ω 13 µΩ/Ω Reference resistors held under SPC measured with MI 6242D direct current comparator bridge. Resistance – Generate, Fixed Points 1.9 Ω 19 Ω 190 Ω 1.9 kΩ 19 kΩ 190 kΩ 1.9 MΩ 19 MΩ 27 µΩ/Ω 4.9 µΩ/Ω 2.2 µΩ/Ω 2.2 µΩ/Ω 2.2 µΩ/Ω 2.2 µΩ/Ω 4.0 µΩ/Ω 21 µΩ/Ω Fluke 5730A & long scale DMM Resistance – Measure, Fixed Points 1 Ω 1.9 Ω 10 Ω 19 Ω 100 Ω 190 Ω 1 kΩ 1.9 kΩ 10 kΩ 19 kΩ 100 kΩ 190 kΩ 1 MΩ 1.9 MΩ 10 MΩ 19 MΩ 100 MΩ 6.9 µΩ/Ω 6.0 µΩ/Ω 2.8 µΩ/Ω 3.0 µΩ/Ω 0.66 µΩ/Ω 0.54 µΩ/Ω 0.82 µΩ/Ω 0.79 µΩ/Ω 0.56 µΩ/Ω 0.69 µΩ/Ω 0.78 µΩ/Ω 0.68 µΩ/Ω 2.1 µΩ/Ω 1.4 µΩ/Ω 4.4 µΩ/Ω 4.1 µΩ/Ω 13 µΩ/Ω Fluke 5730A calibration ratiometric transfer techniques performed utilizing reference resistors held under SPC, & 8508A

(A2LA Cert. No. 2418.01) 08/20/2024 Page 3 of 15 Parameter/Equipment Range CMC 2,5 (±) Comments Resistance – Generate, Fixed Point 1 Ω 0.08 µΩ/Ω Reference resistor held under SPC DC Current – Measure ± 200 µA ± 2 mA ± 20 mA ± 200 mA ± 2 A ± 3 A ± 5 A ± 10 A 6.3 µA/A 6.1 µA/A 6.1 µA/A 6.1 µA/A 32 µA/A 45 µA/A 36 µA/A 36 µA/A Fluke 5730A calibration direct transfer techniques performed utilizing reference resistors held under SPC, A40B, & 8508A DC Voltage – Generate & Measure (0 to 0.22) V (0.22 to 2.2) V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V 1.6 µV/V + 0.52 µV 1.6 µV/V + 1.1 µV 0.80 µV/V + 6.0 µV 0.80 µV/V + 6.6 µV 1.6 µV/V + 68 µV 2.0 µV/V + 1.1 mV Fluke 5730A & long scale DMM DC Current – Generate (0 to 0.22) mA (0.22 to 2.2) mA (2.2 to 22) mA (22 to 220) mA 220 mA to 2.2 A (2.2 to 11) A 20 µA/A + 2.1 nA 20 µA/A + 13 nA 20 µA/A + 0.13 µA 22 µA/A + 1.3 µA 32 µA/A + 64 µA 100 µA/A + 0.46 mA Fluke 5730A & long scale DMM

(A2LA Cert. No. 2418.01) 08/20/2024 Page 4 of 15 Parameter/Range Frequency CMC2.4.5 (±) Comments AC Current – Measure & Generate, Fixed Points (100 to 200) µA (1 to 2) mA (10 to 20) mA (100 to 200) mA (1 to 2) A (10 to 20) A 10 Hz 20 Hz 40 Hz 1 kHz 5 kHz 10 kHz 10 Hz 20 Hz 40 Hz 1 kHz 5 kHz 10 kHz 10 Hz 20 Hz 40 Hz 1 kHz 5 kHz 10 kHz 10 Hz 20 Hz 40 Hz 1 kHz 5 kHz 10 kHz 40 Hz 1 kHz 5 kHz 10 kHz 40 Hz 1 kHz 5 kHz 10 kHz 0.19 % 100 µA/A 75 µA/A 74 µA/A 78 µA/A 90 µA/A 0.18 % 82 µA/A 50 µA/A 47 µA/A 47 µA/A 47 µA/A 0.16 % 60 µA/A 44 µA/A 32 µA/A 32 µA/A 32 µA/A 0.16 % 58 µA/A 31 µA/A 30 µA/A 30 µA/A 30 µA/A 47 µA/A 44 µA/A 45 µA/A 50 µA/A 76 µA/A 72 µA/A 77 µA/A 93 µA/A Fluke 5730A calibration direct transfer techniques performed utilizing Fluke A40B, 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 5 of 15 Parameter/Range Frequency CMC 2,4,5 (±) Comments AC Voltage – Measure & Generate, Fixed Points 1 mV 2 mV 3 mV 10 mV 20 mV 30 mV 100 mV 1 kHz 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 300 kHz 500 kHz 1 MHz 1 kHz 1 kHz 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 300 kHz 500 kHz 1 MHz 1 kHz 1 kHz 0.87 % 1.9 % 1.1 % 0.86 % 0.86 % 0.86 % 1.5 % 2.0 % 3.4 % 5.0 % 6.0 % 0.35 % 0.15 % 0.29 % 0.21 % 0.15 % 0.15 % 0.15 % 0.25 % 0.35 % 0.81 % 1.1 % 1.7 % 79 µV/V 39 µV/V Direct measurement techniques of the Fluke 5730 using a Fluke 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 6 of 15 Parameter/Range Frequency CMC 2, 4, 5 (±) Comments AC Voltage – Measure & Generate, Fixed Points (cont) 200 mV 300 mV 1 V 2 V 2.1 V 20 V 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 300 kHz 500 kHz 1 MHz 1 kHz 1 kHz 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 300 kHz 500 kHz 1 MHz 1 kHz 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 300 kHz 500 kHz 1 MHz 0.18 % 80 µV/V 43 µV/V 38 µV/V 39 µV/V 66 µV/V 0.15 % 0.23 % 0.36 % 0.85 % 30 µV/V 23 µV/V 0.17 % 57 µV/V 26 µV/V 21 µV/V 20 µV/V 37 µV/V 58 µV/V 0.13 % 0.21 % 0.75 % 21 µV/V 0.17 % 63 µV/V 27 µV/V 23 µV/V 23 µV/V 39 µV/V 65 µV/V 0.16 % 0.32 % 0.97 % Direct measurement techniques of the Fluke 5730 using a Fluke 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 7 of 15 Parameter/Range Frequency CMC 2, 4, 5 (±) Comments AC Voltage – Measure & Generate, Fixed Points (cont) 200 V 300 V 600 V 1000 V 10 Hz 20 Hz 40 Hz 1 kHz 20 kHz 50 kHz 100 kHz 20 kHz 50 kHz 100 kHz 40 Hz 50 Hz 300 Hz 1 kHz 20 kHz 30 kHz 0.17 % 59 µV/V 29 µV/V 26 µV/V 26 µV/V 56 µV/V 79 µV/V 37 µV/V 0.11 % 0.40 % 36 µV/V 39 µV/V 34 µV/V 34 µV/V 34 µV/V 0.11 % Direct measurement techniques of the Fluke 5730 using a Fluke 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 8 of 15 Parameter/Range Frequency CMC2, 4, 5 (±) Comments AC Voltage Flatness – Measure, Fixed Points Ref 1 kHz 1 mV 2 mV 20 mV 30 mV 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 0.46 % 0.46 % 0.46 % 0.47 % 1.4 % 1.4 % 2.2 % 3.2 % 7.2 % 0.45 % 0.42 % 0.42 % 0.42 % 0.95 % 0.96 % 1.3 % 1.9 % 3.6 % 0.41 % 0.41 % 0.40 % 0.40 % 0.56 % 0.57 % 0.84 % 1.5 % 3.2 % 0.41 % 0.41 % 0.41 % 0.41 % 0.41 % 0.42 % 0.84 % 1.4 % 3.1 % Direct measurement techniques of the Fluke 5730 using a Fluke 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 9 of 15 Parameter/Range Frequency CMC 2, 4, 5 (±) Comments AC Voltage Flatness – Measure, Fixed Points Ref 1 kHz (cont) 100 mV 300 mV 1 V 3 V 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 30 Hz 100 Hz 10 kHz 100 kHz 500 kHz 1 MHz 10 MHz 20 MHz 30 MHz 0.33 % 0.33 % 0.33 % 0.33 % 0.33 % 0.41 % 0.84 % 1.4 % 3.1 % 0.25 % 0.25 % 0.25 % 0.25 % 0.25 % 0.41 % 0.84 % 1.3 % 3.1 % 0.25 % 0.25 % 0.25 % 0.25 % 0.25 % 0.41 % 0.84 % 1.3 % 3.0 % 0.25 % 0.25 % 0.25 % 0.25 % 0.25 % 0.41 % 0.84 % 1.3 % 3.0 % Direct measurement techniques of the Fluke 5730 using a Fluke 5790B

(A2LA Cert. No. 2418.01) 08/20/2024 Page 11 of 15 Parameter/Range Frequency CMC 2, 5, 6 (±) Comments Power Sensor VSWR (Ratio) 100 kHz to 4.2 GHz 10 MHz to 18 GHz 50 MHz to 26.5 GHz 50 MHz to 50 GHz 100 kHz to 6 GHz 50 MHz to 50 GHz 0.018 VSWR 0.050 VSWR 0.024 VSWR 0.15 VSWR 0.018 VSWR 0.040 VSWR Agilent 8753ES vector analyzer with appropriate calibration kit > 10 MHz – HP 8757 series scalar network analyzer with appropriate directional bridge (HP 85027A, B, C, & D) Agilent 8753ES vector analyzer with appropriate calibration kit Agilent 8510C vector analyzer with 8517B test set, 83651A source, & appropriate calibration kit Attenuation – Measure 10 dB 20 dB 30 dB 40 dB 10 dB 20 dB 30 dB 40 dB 10 dB 20 dB 30 dB 40 dB 50 dB 60 dB 70 dB 80 dB 90 dB 100 dB 110 dB 100 kHz to 6 GHz 100 kHz to 6 GHz 100 kHz to 6 GHz 100 kHz to 6 GHz 50 MHz to 50 GHz 50 MHz to 50 GHz 50 MHz to 50 GHz 50 MHz to 50 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 3 MHz to 1.3 GHz 0.13 dB of rdg 0.13 dB of rdg 0.13 dB of rdg 0.13 dB of rdg 0.42 dB of rdg 0.42 dB of rdg 0.42 dB of rdg 0.42 dB of rdg 0.06 dB of rdg 0.08 dB of rdg 0.10 dB of rdg 0.13 dB of rdg 0.17 dB of rdg 0.22 dB of rdg 0.24 dB of rdg 0.26 dB of rdg 0.33 dB of rdg 0.35 dB of rdg 0.38 dB of rdg Agilent 8753ES vector analyzer with appropriate calibration kit Agilent 8510C vector analyzer with 8517B test set, 83651A source, & appropriate calibration kit Direct measure, HP 8902A measuring receiver, all measurement systems components time based locked N5225A PNA

(A2LA Cert. No. 2418.01) 08/20/2024 Page 12 of 15 Parameter/Range Frequency CMC 2, 5 (±) Comments Attenuation – Measure (cont) 10 dB 20 dB 30 dB 40 dB 50 dB 60 dB 70 dB 80 dB 90 dB 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 10 MHz to 26.5 GHz 0.13 dB of rdg 0.14 dB of rdg 0.15 dB of rdg 0.17 dB of rdg 0.22 dB of rdg 0.24 dB of rdg 0.26 dB of rdg 0.28 dB of rdg 0.35 dB of rdg Direct measure, HP 8902A measuring receiver system with HP 11793A converter, & appropriate local oscillator, all measurement systems components time bases locked III. Mechanical Parameter/Equipment Range CMC2, 4, 7 (±) Comments Vibration3 – Accelerometers (10 to 1000) Hz (1 to 5) kHz (5 to 10) kHz 1.9 % 3.6 % 4.1 % Vibration transducer calibration system Pressure – Generate Up to 50 psi (50 to 100) psi (100 to 1000) psi 0.0033 psi 0.021 psi 0.29 psi Fluke 6270A, 8370A & Fluke PM600 pressure modules

(A2LA Cert. No. 2418.01) 08/20/2024 Page 13 of 15 IV. Thermodynamics Parameter/Equipment Range CMC2,7 (±) Comments Temperature – Measure (- 80 to -50) °C (- 50 to 30) °C (30 to 50) °C (50 to 650) °C 0.034 °C 0.020 °C 0.020 °C 0.33 °C Fluke 1595A, Hart 5628 & Fluke 7381 Liquid bath Fluke 1595A, Hart 5628 & Fluke 9190 Dry well Fluke 1595A, Hart 5628 & Fluke 9144 Dry well Humidity – Measuring Equipment (10 to 90) % RH 0.55 % RH Thunder Scientific 2500 V. Time & Frequency Parameter/Equipment Range CMC2, 7 (±) Comments Frequency Dissemination 10 MHz 10-10 Hz/Hz Fluke 910R GPS- controlled rubidium frequency standard & Symmetricom Xli time & frequency system

(A2LA Cert. No. 2418.01) 08/20/2024 Page 14 of 15 SATELLITE NORTHROP GRUMMAN MISSION SYSTEMS BWI CALIBRATION LAB West Building Metrology Laboratory 7323 Aviation Boulevard, Baltimore, MD 21203 Bob Dodds Phone: 410 689 6972 I. Dimensional Parameter/Equipment Range CMC2 (±) Comments Calipers – Digital, Resolution = 0.0005 in Up to 6 in Up to 12 in Up to 18 in Up to 24 in 330 μin 330 μin 310 μin 380 μin Gage blocks Calipers – Dial, Resolution = 0.001 in Up to 6 in Up to 12 in Up to 18 in Up to 24 in 460 µin 520 µin 460 µin 430 µin Gage blocks Outside Micrometers – Resolution = 0.0001 in Up to 1 in (1 to 2) in (2 to 3) in (3 to 4) in (4 to 5) in (5 to 6) in 30 µin 59 µin 60 µin 61 µin 63 µin 65 µin Gage blocks Indicators – Dial & Digital Resolution = 0.00005 Up to 1 in (1 to 2) in (2 to 3) in (3 to 4) in 130 µin 200 µin 130 µin 260 µin Dial indicator calibrator, Optimar 100 Plain Cylindrical Plug Gages (0.050 to 1.00) in 24 μin Gage blocks with linear length machine ________________ 1 This laboratory is not normally available for commercial calibration service.

(A2LA Cert. No. 2418.01) 08/20/2024 Page 15 of 15 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 In the statement of CMC, CF stands for calibration factor. 4 In the statement of CMC, percentage are percentages of reading. 5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 6 In the statement of CMC, VSWR refers to Voltage Standing Wave Ratio. 7 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter. 8 This scope meets A2LA’s P112 Flexible Scope Policy.