Keithley Primary Standards

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 5 of 37 Parameter/Equipment Range CMC2, 4, 5 (±) Comments DC Current – Measure (cont) Fixed Points 50 mA 0.5 A 4 mA 1A 16 µA 64 µA 84 µA 0.52 mA Keithley DMM7510 & shunts Tektronix MDO32 & shunts Keithley DMM7510 & shunts, regulation measurement DC Current – Measure 3 Up to 1 pA (1 to 10) pA (10 to 100) pA (0.1 to 1) nA (1 to 10) nA (10 to 100) nA (0.1 to 1) µA (1 to 10) µA (10 to 100) µA (0.1 to 1) mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A 0.049 % + 2 fA 0.049 % + 5.9 fA 0.012 % + 16 fA 0.010 % + 82 fA 75 µA/A + 0.73 pA 65 µA/A + 2.6 pA 50 µA/A + 21 pA 45 µA/A + 0.14 nA 30 µA/A + 1.1 nA 28 µA/A + 12 nA 63 µA/A + 0.12 µA 97 µA/A + 1.4 µA 0.046 % + 19 µA Keithley 2002, Keithley 7177 DC Resistance – Generate Fixed Points (0 to 1000) Ω 0.1 Ω 1 Ω 1.9 Ω 10 Ω 100 Ω 1 kΩ 10 kΩ 19 kΩ 100 kΩ 1 MΩ 10 MΩ 19 MΩ 100 MΩ 100 MΩ 900 MΩ 1 GΩ 10 GΩ 100 GΩ 1 TΩ 10 TΩ 16 µΩ/Ω + 45 mΩ 0.78 µΩ/Ω 0.28 µΩ/Ω 0.37 µΩ/Ω 0.56 µΩ/Ω 0.85 µΩ/Ω 0.30 µΩ/Ω 0.18 µΩ/Ω 0.40 µΩ/Ω 0.95 µΩ/Ω 1.2 µΩ/Ω 3.1 µΩ/Ω 6.5 µΩ/Ω 36 µΩ/Ω 74 µΩ/Ω 0.014 % 97 µΩ/Ω 0.013 % 0.018 % 0.07 % 0.57 % Resistors characterized with Agilent 3458A MI 6010B system with standard resistors MI 6000B system with standard resistors Keithley high resistance transfer system

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 11 of 37 Parameter/Range Frequency CMC2, 4, 5 (±) Comments AC Voltage – Generate (cont) 220 mV to 2.2 V (2.2 to 22) V (22 to 220) V (Limited to 2.2 x 10 7 VꞏHz) For the 1100 V Range: (220 to 250) V (220 to 1100) V (220 to 750) V (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (15 to 40) Hz (40 to 50) Hz 50 Hz to 1 kHz (1 to 20) kHz (20 to 30) kHz (30 to 50) kHz (50 to 100) kHz 0.011 % + 30 µV 0.034 % + 80 µV 0.09 % + 0.2 mV 0.15 % + 0.3 mV 0.022 % + 0.4 mV 80 µV/V + 0.16 mV 40 µV/V + 50 µV 70 µV/V + 0.1 mV 95 µV/V + 0.2 mV 0.026 % + 0.6 mV 0.09 % + 2 mV 0.13 % + 3.2 mV 0.022 % + 4 mV 80 µV/V + 1.7 mV 47 µV/V + 0.6 mV 75 µV/V + 1 mV 0.013 % + 2.5 mV 0.08 % + 16 mV 0.42 % + 40 mV 0.7 % + 80 mV 0.026 % + 16 mV 80 µV/V + 4 mV 60 µV/V + 3.5 mV 0.013 % + 6 mV 0.036 % + 11 mV 0.036 % + 11 mV 0.13 % + 45 mV Fluke 5720A Fluke 5720A, Fluke 5725A AC Voltage – Measure Up to 2.2 mV (2.2 to 7) mV (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz 500 kHz to 1 MHz 0.13 % + 1 µV 0.057 % + 1 µV 0.033 % + 1 µV 0.063 % + 1.6 µV 0.093 % + 1.9 µV 0.18 % + 3.1 µV 0.19 % + 6.2 µV 0.27 % + 6.3 µV 0.066 % + 1 µV 0.029 % + 1 µV 0.016 % + 1 µV 0.031 % + 1.6 µV 0.047 % + 1.9 µV 0.093 % + 3.1 µV 0.1 % + 6.2 µV 0.18 % + 6.2 µV Fluke 5790A

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 16 of 37 Parameter/Range Frequency CMC2, 4, 5 (±) Comments 4 Terminal Parallel Capacitance – Generate (cont) 1000 pF 10 nF 100 nF 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 1 kHz 10 kHz 100 kHz 1 kHz 10 kHz 0.65 pF 0.20 pF 0.19 pF 0.20 pF 2.2 pF 2.2 pF 1.9 pF 2.0 pF 22 pF 23 pF Set of standard capacitors from 1 pF to 100 nF 4 Terminal Parallel Conductance – Generate 1 pF, (1 to 17) nS 1 pF, (5 to 200) nS 10 pF, (0.1 to 1.4) nS 10 pF, (2.2 to 17) nS 10 pF, (2 to 3) µS 100 pF, (1 to 22) nS 100 pF, (7.1 to 19.2) nS 100 pF, (0.26 to 122) nS 100 pF, (13 to 30) µS 1000 pF, (1.4 to 2.8) nS 1000 pF, (8 to 31) nS 1000 pF, (122 to 535) nS 1000 pF, 1.7 nS to 14.2 µS 1000 pF, (68 to 695) nS 10 nF, (0.07 to 9.6) nS 10 nF, (1.4 to 40) nS 10 nF, (67 to 324) nS 100 nF, (34.4 to 68) nS 100 nF, (111 to 404) nS 1 MHz 10 MHz 100 kHz 1 MHz 10 MHz 10 kHz 100 kHz 1 MHz 10 MHz 1 kHz 10 kHz 100 kHz 1 MHz 10 MHz 1 kHz 10 kHz 100 kHz 1 kHz 10 kHz 1.8 nS 89 nS 1.0 nS 2.5 nS 0.36 µS 0.72 nS 2.5 nS 21 nS 1.5 µS 2.7 nS 2.9 nS 23 nS 0.31 µS 45 µS 5.9 nS 27 nS 0.35 µS 39 nS 0.42 µS Keithley 4200-CVU- CAL-KIT, 5880-SRU

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 24 of 37 Parameter/Range Frequency CMC2, 4, 5 (±) Comments AC Voltage – Generate (cont) Fixed Points 200 V 300 V 700 V 740 V 300 V 20 Hz 1 kHz 50 Hz 1 kHz 50 kHz 100 kHz 20 Hz 1 kHz 50 kHz 100 kHz 50 kHz 100 kHz 22 mV 27 mV 58 mV 62 mV 0.27 V 1.2 V 61 mV 65 mV 0.32 V 1.2 V 0.12 V 0.44 V Fluke 5730A (based on 90-day specs) Fluke 5730A & 5725A (based on 90-day specs) Parameter/Equipment Range CMC2, 4, 5 (±) Comments Capacitance – Generate, Fixed Points 0.1 nF 0.7 nF 1 nF 10 nF 100 nF 1 µF 1 µF 10 µF 100 µF 0.68 pF 1.7 pF 3.0 pF 8.0 pF 63 pF 0.64 nF 0.82 nF 5.8 nF 58 nF IET 1423-A IET HACS-Z-A-3E- 1μF II. Time & Frequency Parameter/Equipment Range CMC2, 4, 5 (±) Comments Frequency – Generate 10 Hz to 500 kHz 2.0 µHz/Hz Keysight 33250A

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 29 of 37 Parameter/Equipment Range CMC2, 4, 5 (±) Comments DC Current – Measure Pulse Fixed Point – Pulse Fixed Points (0 to 20) pA (20 to 200) pA 200 pA to 2 nA (2 to 20) nA (20 to 200) nA 200 nA to 2 µA (2 to 20) µA (20 to 200) µA 200 µA to 2 mA (2 to 20) mA (20 to 200) mA 200 mA to 2 A (2 to 20) A (0 to 100) nA 100 nA to 1 µA 100 mA to 1 A (1 to 10) A (10 to 100) A (1 to 10) µA (10 to 100) µA 100 µA to 1 mA (1 to 10) mA (10 to 100) mA (1 to 10) A 100 mA to 1 A (1 to 10) A 50A 4 mA 50 mA 0.5 A 1 A 0.071 % + 0.34 fA 0.016 % + 3.1 fA 99 µA/A + 2.7 fA 0.010 % + 7.7 fA 0.010 % + 65 fA 0.010 % + 0.48 pA 0.010 % + 4.1 pA 71 µA/A + 59 pA 71 µA/A + 0.59 nA 81 µA/A + 5.1 nA 0.010 % + 42 nA 0.017 % + 2.8 µA 0.023 % + 0.91 µA 50 µA/A + 7.5 pA 0.010 % + 10 pA 0.024 % + 36 µA 0.013 % + 5.6 µA 0.030 % + 7.5 µA 29 µA/A + 0.20 nA 28 µA/A + 1.8 nA 28 µA/A + 14 nA 22 µA/A + 0.19 µA 47 µA/A + 1.3 µA 0.55 mA 54 µA/A + 17 µA 0.018 % + 0.10 mA 20 mA 84 µA 16 µA 64 µA 0.52 mA Source characterized by Keithley 2002 & shunts Source characterized by Keysight 3458A & shunts Source characterized by Keysight 3458A Keithley DMM7510 & shunts Source characterized by Keysight 3458A & shunts Tektronix MDO32 & shunts Keithley DMM7510 & shunts Keithley DMM7510 & shunts, regulation measurement DC Current – Measure 9 Up to 1 pA (1 to 10) pA (10 to 100) pA (0.1 to 1) nA (1 to 10) nA (10 to 100) nA (0.1 to 1) µA (1 to 10) µA (10 to 100) µA (0.1 to 1) mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A 0.049 % + 2 fA 0.049 % + 5.9 fA 0.012 % + 16 fA 0.010 % + 82 fA 75 µA/A + 0.73 pA 65 µA/A + 2.6 pA 50 µA/A + 21 pA 45 µA/A + 0.14 nA 30 µA/A + 1.1 nA 28 µA/A + 12 nA 63 µA/A + 0.12 µA 97 µA/A + 1.4 µA 0.046 % + 19 µA Keithley 2002, Keithley 7177

(A2LA Cert. No. 2462.01) Revised 10/22/2025 Page 37 of 37 II. Time & Frequency Parameter/Equipment Range CMC2, 4, 5 (±) Comments Frequency – Generate 1 Hz to 15 MHz 2.0 µHz/Hz Keysight 33250A Time Interval – Measure 500 ns 13 ns Oscilloscopes Tektronix DPO7x54, TDS5054B _________________________________ 1 This laboratory offers commercial calibration service and field calibration services. 2 Calibration and Measurement Capability Uncertainty (C MC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC. 4 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 5 CMC is [µX/X of Reading] + offset (where listed) for the ranges indicated in the Parameter/Equipment column of table, where “X” equals V, Ω, A or Hz, percentages are percentages of reading, unless otherwise indicated 6 Electrically simulated thermocouple temperatures. CM C is expressed as a specific value relative to the indicated value. 7 This scope meets A2LA’s P112 Flexible Scope Policy. 8 The type of instrument or material being calibra ted is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter. 9 For 42xx-SMU only.