Dell Inc.
48 Constitution Blvd., 02038, Franklin, MA, United States
Visit website- Accredited standards
- 13
- A2LA certificate
- 1
- Site in our directory
- 1
What this lab is accredited for
Our reading of the A2LA scope: each standard once, with its official name where we have checked it.
Only this lab. Searches the 13 standard numbers and the 13 official names we hold. When no standard matches, it searches the method text of every scope line.
IEC 61000 series9
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection
IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test+1 national
National versions in the same scope
KS C 9610-4-2national version with changes
IEC 61000-4-3Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test+1 national
National versions in the same scope
KS C 9610-4-3national version with changes
IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test+1 national
National versions in the same scope
KS C 9610-4-4national version with changes
IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test+1 national
National versions in the same scope
KS C 9610-4-5national version with changes
IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields+1 national
National versions in the same scope
KS C 9610-4-6national version with changes
IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test+1 national
National versions in the same scope
KS C 9610-4-8national version with changes
IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase+1 national
National versions in the same scope
KS C 9610-4-11probably the same standard; matched by number only
Other standards4
ANSI C63.4American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz
CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements+4 national
National versions in the same scope
AS/NZS CISPR 32identical to it
CNS 15936identical to it
KS C 9832national version with changes
VCCI-CISPR 32probably the same standard; matched by number only
CISPR 35Electromagnetic compatibility of multimedia equipment - Immunity requirements+1 national
National versions in the same scope
KS C 9835national version with changes
FCC PART 15Radio Frequency Devices
47 CFR, FCC Part 15, Subpart B; ANSI C63.4:2014; KS C 9832:2024; AS/NZS CISPR 32; CISPR 32; EN 55032; CNS 15936:2016; ICES-003; VCCI-CISPR 32; VCCI 32-1; QCVN 118:2018/BTTTT; EN 61000-3-3; EN 61000-3-2; EN 61000-4-2; IEC 61000-4-2; KS C 9610-4-2:2017; EN 61000-4-3; IEC 61000-4-3; KS C 9610-4-3:2017; EN 61000-4-4; IEC 61000-4-4; KS C 9610-4-4:2020; EN 61000-4-5; IEC 61000-4-5; KS C 9610-4-5:2024; EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6:2020; EN 61000-4-8; IEC 61000-4-8; KS C 9610-4-8:2017; ISO/IEC 17025:2017
EN 61000-4-11; IEC 61000-4-11; KS C 9610-4-11:2020; CISPR 24:2010; EN 55035:2017; CISPR 35:2016; KS C 9835:2019; ANSI C63.4:2014
Read from the A2LA scope document we downloaded on 2026-03-14. Register refreshed 2026-11-06.
Scope as published by A2LA
3 lines
ISO/IEC 17025
Active1469.01
The scope document we hold says it is valid until 2028-02-29.
Accredited scope, certificate 1469.01
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | 47 CFR, FCC Part 15, Subpart B; ANSI C63.4:2014; KS C 9832:2024; AS/NZS CISPR 32; CISPR 32; EN 55032; CNS 15936:2016; ICES-003; VCCI-CISPR 32; VCCI 32-1; QCVN 118:2018/BTTTT; EN 61000-3-3; EN 61000-3-2; EN 61000-4-2; IEC 61000-4-2; KS C 9610-4-2:2017; EN 61000-4-3; IEC 61000-4-3; KS C 9610-4-3:2017; EN 61000-4-4; IEC 61000-4-4; KS C 9610-4-4:2020; EN 61000-4-5; IEC 61000-4-5; KS C 9610-4-5:2024; EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6:2020; EN 61000-4-8; IEC 61000-4-8; KS C 9610-4-8:2017; ISO/IEC 17025:2017 | - | to 6 GHz |
| 2 | EN 61000-4-11; IEC 61000-4-11; KS C 9610-4-11:2020; CISPR 24:2010; EN 55035:2017; CISPR 35:2016; KS C 9835:2019; ANSI C63.4:2014 | materials and products related to the following: Information Technology Equipment (ITE), Multimedia Equipment (MME) | to 40000 MHz |
| 3 | Extracted from the scope document; tables may not line up. View scope for the original. For the tests to which this accreditation applies, please refer to the laboratory’s Electrical Scope of Accreditation.
Accredited Laboratory
A2LA has accredited
DELL INC.
Franklin, MA
for technical competence in the field of
Electrical Testing
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
Presented this 19th day of February 2026.
_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1469.01
Valid to February 29, 2028 | ||
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
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Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.