PCB Piezotronics
3425 Walden Avenue, 14043, Depew, NY, United States
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- A2LA certificate
- 1
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What this lab is accredited for
We found no published test standard numbers in this lab’s scope. The full scope as published is below.
Only this lab. Searches the method, matrix and range of each of the 6 scope lines.
A2LA certificate 1862.01 · 6 lines
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994; ANSI/NCSL Z540.3-2006 | - | See scope document |
| 2 | - | -Show page textExtracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 1862.01) Revised 02/25/2026 Page 2 of 5
II. Mechanical
Parameter/Equipment
Range
CMC2, 5 (±)
Comments
Acoustic Pressure –
Measuring Equipment
114.0 dB SPL
@ 250 Hz
0.2 dB reading (rdg)
Acoustic calibrator and
pre-amplifiers
Dynamic Force
(Compression/Tension) –
Measure
(0 to 100 000) lbf
1 % full scale (FS)
Reference load cell
Impulse Force –
Sensitivity
(Voltage/Force) Measure
Up to 5000 lbf
Up to 1000 Hz
3.8 % rdg
Quartz reference
accelerometer
Static Pressure – Measure
(0 to 30) psia
(0 to 60) psia
(0 to 15) psig
(0 to 50) psig
(0 to 100) psia or psig
(0 to 300) psia or psig
(0 to 600) psia or psig
(0 to 1000) psia or psig
(0 to 3000) psia or psig
(0 to 6000) psia or psig
(0 to 10 000) psia or psig
0.015 % FS
0.015 % FS
0.015 % FS
0.015 % FS
0.015 % FS
0.015 % FS
0.015 % FS
0.015 % FS
0.021 % FS
0.021 % FS
0.021 % FS
DHI pressure
controller/calibrator
Static Medium Pressure –
Measure
(0 to 15 000) psig
1 % FS
Dead weight reference
(hydraulic)
Static High Pressure –
Measure
(0 to 100 000) psig
1.7 % FS
Reference pressure
transducer
Dynamic Low Pressure –
Measure
(0 to 100) psig
124.0 dB @ 250 Hz
1 % FS
0.45 dB
Digital Heise reference
pressure meter
(pneumatic)
Piston phone reference | 0 to 100000 psig |
| 3 | - | -Show page textExtracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 1862.01) Revised 02/25/2026 Page 3 of 5
Parameter/Equipment
Range
CMC2, 4, 5 (±)
Comments
Dynamic Medium
Pressure – Measure
(0 to 1000) psig
1.3 % FS
Digital Heise reference
pressure meter
(pneumatic)
Dynamic High
Pressure – Measure
(0 to 15 000) psig
3.0 % FS
Reference pressure sensor
(hydraulic)
Vibration General
Purpose – Sensitivity
Magnitude
Accelerometers
Low Frequency –
Sensors
(5 to 9) Hz
(10 to 99) Hz
(100 to 1999) Hz
(2000 to 10 000) Hz
(10 001 to 15 000) Hz
(15 001 to 20 000) Hz
(0.5 to 0.99) Hz
(1 to 30) Hz
(30.01 to 199) Hz
(200 to 1000) Hz
2 % rdg
1.5 % rdg
1 % rdg
2.5 % rdg
5 % rdg
9 % rdg
1.8 % rdg
1 % rdg
1.5 % rdg
3 % rdg
Reference accelerometer,
back-to-back comparison
method
Reference accelerometer
with long stroke shaker,
back-to-back comparison
method
Vibration General
Purpose – Acceleration
Level
Portable Shakers
(79.6 to 159.2) Hz
1.5 % rdg
Accelerometer, back-to-
back comparison method | 0 to 1000 psig |
| 4 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 1862.01) Revised 02/25/2026 Page 4 of 5
Parameter/Equipment
Range7
CMC2, 5 (±)
Comments
Vibration General
Purpose – Sensitivity
Phase
Accelerometers
Low Frequency –
Sensors
(≥5 to <10) Hz
≥10 Hz to <5 kHz
(≥5 to <11) kHz
(≥11 to <16) kHz
(≥16 to ≤20) kHz
(≥0.5 to <10) Hz
(≥10 to <200) Hz
≥200 Hz to ≤1 kHz
1°
0.75°
1.5°
2°
3°
2.5°
0.75°
1.5°
Reference accelerometer,
back-to-back comparison
method
Reference accelerometer
with long stroke shaker,
back-to-back comparison
method
Primary Vibration –
Sensitivity Magnitude
– Measure
Mid to High
Frequency
Low Frequency
5 Hz
5 Hz < f <100 Hz
100 Hz< f ≤ 160 Hz
160 Hz < f ≤ 1000 Hz
1000 Hz < f ≤ 5000 Hz
5000 Hz < f ≤ 15 kHz
15 kHz < f ≤ 20 kHz
0.5 Hz ≤ f <10 Hz
1 % rdg
0.5 % rdg
0.2 % rdg
0.5 % rdg
1 % rdg
1.5 % rdg
2.0 % rdg
0.3 % rdg
Laser interferometry and
shaker
Laser interferometry and
long stroke shaker
Primary Vibration –
Sensitivity Phase –
Measure
Mid to High
Frequency
Low Frequency
5 Hz ≤ f <5000 Hz
5000 Hz < f ≤ 20 kHz
0.5 Hz ≤ f <10 Hz
0.5°
1°
0.5°
Laser interferometry and
shaker
Laser interferometry and
long stroke shaker
Acceleration
Amplitude Linearity,
Shock – Measure
(100 to 2000) g:
(0.5 to 2) ms
(>2000 to 10 000) g:
(0.1 to 0.5) ms
1.9 % rdg
2.6 % rdg
Reference accelerometer
with pneumatic shock
tower, back-to-back
comparison method | ||
| 5 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 1862.01) Revised 02/25/2026 Page 5 of 5
SATELLITE FACILITY
PCB PIEZOTRONICS INC.
15801 Camino Vecinal
Vesta Park Mega Region, Tijuana, MEXICO 22643
Julio Lopez Phone: +52 6646153859
CALIBRATION
I. Mechanical
Parameter/Equipment
Range
CMC2 (±)
Comments
Vibration General
Purpose – Sensitivity
Magnitude
Accelerometers
(5 to 9) Hz
(10 to 99) Hz
(100 to 1999) Hz
(2000 to 10 000) Hz
(10 001 to 15 000) Hz
(15 001 to 20 000) Hz
2 %
1.5 %
1 %
2.5 %
5 %
9 %
Reference
accelerometer, back-
to-back comparison
method
___________________
1 This laboratory offers commercial calibration service.
2 Calibration and Measurement Capability uncertainty (CMC) is the smallest uncertainty of measurement that
a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations
of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded
uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of
k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be
greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances
of the specific calibration.
3 CMCs are expressed as either a specific value that covers the full range or as a fraction of the reading plus
a fixed floor specification.
4 CMCs for Vibration parameters are for Sensitivity (accelerometers/sensors) or Acceleration level (shakers).
5 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory
is capable of calibrating instruments that measure or generate the values in the ranges indicated for the
listed measurement parameter.
6 This scope meets A2LA’s P112 Flexible Scope Policy.
7 In the statement of range, f is frequency. | ||
| 6 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994; ANSI/NCSL Z540.3-2006; R205 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
Labs with overlapping accredited scope in United States
- Empire Scale Corporation d.b.a Precision Scale & BalanceLancaster, NY · ~6 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- West Caldwell CalibrationVictor, NY · ~105 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Hapeman ElectronicsStoneboro, PA · ~209 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Cleveland Specialty Inspection ServicesMentor, OH · ~256 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Micro Laboratories, Inc.Mentor, OH · ~257 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.