United States
SGS North America
15150 Avenue of Science, Suite 300, 92128, San Diego, CA, United States
A2LA|1935.01ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
7
Locations
10
Contact this laboratory
Register record
- A2LACollected
- 1935.01Active
Certificates and scope
1A2LA
ISO/IEC 17025
Active1935.01
Accredited scope, certificate 1935.01
| Discipline | Method | Matrix | Range |
|---|---|---|---|
| electrical | Verizon LTE OTADM Test Plan; Verizon LTE SMS Test Plan; Verizon LTE Multi-Mode_Device-UICC_CSIM_Interaction Test Plan; Verizon MM OTADM Test Plan; Verizon MM SMS Test Plan; Verizon Multiband Supplemental Signaling Test Plan; Verizon AT Command Test Plan; Verizon Class 3 APN Test Cases; Verizon PCO Test Plan; Verizon Wireless Priority Services Test Plan; Verizon Receive Diversity Test Plan; Verizon Rich Communication Services Test Plan; Verizon VoIP and VT Performance; Verizon Safe For Network-Multi Band Device Test Plan; Verizon UICC Activation Using Live Card; Verizon Voice Over WiFi Test Plan; Verizon LTE Multi-Band Data Throughput Test Plan; Verizon LTE Multi-Mode Data Retry Test Plan; Verizon CDMA-Less Multi-Mode Data Retry Test Plan; Verizon CDMA-Less Type 3 Test Plan; Verizon CDMA-Less IMS Roaming; Verizon GSMA TS.35; Verizon RTCP-XR; Verizon Data Retry for IMS-Less; Verizon Supplementary Signaling Conformance for IMS-Less; Verizon 5G Domestic FIT; Verizon Domestic FIT; Verizon Global Fit; Verizon NB-IoT Field Test Plan; Verizon LTE CAT-M1 Field Test Plan; Verizon VoLTE Field Test Plan; Verizon E911 Field Test Plan; CTIA Cybersecurity Certification Test Plan for IoT Devices1 | - | - |
| electrical | PRD TS.35 CONNECTION EFFICIENCY; PRD SGP.23 Remote SIM Provisioning; PRD TS.11 - Device Field and Lab Test Guidelines; PRD TS.40 - MIoT Field and Lab Test Cases; PRD TS.42 - Multi SIM Devices Requirements Test Cases; 5G NR FR2 RFOTA; 5G Protocol Pre-Conformance- FR1 (38.523-1); 5G NR FR1 Supp RF; 5G NR FR1 RF Pre Conformance (38.521-3); 5G NR FR1 Performance/DEMOD Pre Conformance (38.521-4); 5G NR Pre-Conformance RRM FR1 NSA- (38.533); 5G NR SA Data Retry; 5G NR SA Voice Services Fallback; 5G NR SA Voice, Video and Messaging; 5G NR SA System Selection; 5G WEA TP; 5G Test Cases -LTE Voice over WiFi; 5G Iconography; 5G NR NSA SA THERMAL LC TP; 5G Supplemental UICC; 5GNRAPPLAYERDATATHRU; 5G E911; 5GNRSASMS; 5GSASUPSIGCONF; 5G Test Cases- PCO; 5GSAVoiceVideoPerformanceTP; 5G Test Cases -LTE Voice over WiFi; Verizon e911 for LTE Only or MM VoLTE Capable Devices; Verizon ePDG Live Test Plan; Verizon IMS VoIP Test Plan; Verizon LTE 3GPP Band 13 RF and RRM Conformance Test Plan; Verizon LTE 3GPP Band 13 Safe for Network Test Plan; Verizon LTE 3GPP Band 13 Signaling Conformance Test Plan; Verizon LTE Band 13 Data Throughput Test Plan; Verizon LTE Band 13 Lab Conformance Test Plan; Verizon LTE Band 13 Supplemental RRM Test Plan; Verizon LTE Band 13 Supplementary RF Conformance Test Plan; Verizon LTE Band 13 Supplementary Signaling Conformance Test Plan; Verizon LTE Band 2 Supplementary RF Test Plan; Verizon LTE Band 4 Data Throughput Test Plan; Verizon LTE Band 4 Device-UICC USIM-ISIM Interaction Test Plan; Verizon LTE Band 4 Supplementary RF Test Plan; Verizon LTE Band 5 Supplementary RF Test Plan; Verizon LTE CMAS Test Plan; Verizon LTE Data Retry Test Plan; Verizon LTE Device-UICC (USIM, ISIM) Interaction Test Plan; Verizon LTE IMS Registration and Retry Test Plan; Verizon LTE Interband Test Plan | - | - |
| electrical | CTIA Test Plan for Wireless Device Over-the-Air Performance2; CTIA Test Plan for Performance Evaluation of Wi-Fi Mobile Converged Devices1; CTIA-01.20 - Test-Methodology-SISO-Anechoic-Chamber; CTIA Test Plan for RF Performance Evaluation of WiFi Mobile Converged Devices, V4.0.01; Verizon LTE-LBS Performance Test Plan; Verizon OTA Radiated Performance for CDMA and LTE MM Test Plan; Verizon LTE OTA Radiated Performance Test Plan; Verizon Location Determination Test Plan; Verizon 5G_NR_FR1_RFOTA_Test Plan; Verizon 5G NR FR2 RFOTA; Wireless 3GPP TR 25.914; 3GPP TS 34.114; 3GPP TS 37.544; 3GPP TS 38.508-1; 3GPP TS 38.521-1; 3GPP TS 38.521-2; 3GPP TS 38.521-3; 3GPP TS 38.521-4; 3GPP TS 38.533; 3GPP TS 38.561; 47 CFR, FCC Part 15 Subpart B (using ANSI C63.4-2014), Part 18 (using MP-5:1986); ICES-001; ICES-003; KS C 9811; VCCI V-3; CISPR 11; CISPR 32; EN 55011; EN 55032; 47 CFR, FCC Part 15 Subparts C, E, and F (using ANSI C63.10:2013); FCC KDB Publication 905462 D02 v02; 47 CFR, FCC Part 22, 24, 25, and 27 (using ANSI C63.26:2015 or ANSI/TIA-603-E); RSS-130; RSS-132; RSS-133; RSS-139; RSS-140; RSS-198; RSS-199; RSS-210; RSS-216; RSS-220; RSS-247; RSS-248; RSS-GEN | - | to 40 GHz |
| electrical | 3GPP TS 38.521-1; 3GPP TS 38.521-2; 3GPP TS 38.521-3; 3GPP TS 38.521-4; 3GPP TS 38.533; 3GPP TS 38.523-1; 3GPP TS 34.229-5; CTIA 01.22; 3GPP TS 31.121; 3GPP TS 31.124; 3GPP TS 36.521-1; 3GPP TS 36.521-3; 3GPP TS 36.523-1; 3GPP TR 37.901; ETSI EN 301 908-13; PTCRB NAPRD03; PTCRB PPMD; GCF-CC; 3GPP TS 34.121-1/3; 3GPP TS 34.123-1; 3GPP TS 34.229-3; 3GPP TS 37.571-1/2; 3GPP TS 51.010; ETSI TS 102 230 | electronic products | - |
| electrical | - | - | - |
| electrical | ETSI EN 300 220-1; EN 300 220-2; EN 300 328; EN 300 330; EN 300 440; EN 301 893; EN 301 511; EN 301 908-1; 3GPP TS 51.010-1 (Section 12.2); 3GPP TS 34.124 (8.2); 3GPP TS 36.124 (8.2); 3GPP TS 38.124 (8.2); ARIB Standard STD-T66; LP0002 (2020); AS/NZS 4268:2017; FCC KDB Publication 447498 D01; RSS-102 measurement (RF Exposure); EN 62311; ANSI C63.4:2014; FCC MP-5 (February 1986); ANSI C63.10:2013; FCC KDB 905462 D02 (v02); ANSI C63.26-2015; ANSI/TIA-603-E | - | to 40000 MHz |
| - | CTIA 01.01 | - | - |
Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.
Location
Other Locations
9 other sites in this organization
Labs with overlapping accredited scope in United States
- UL LLCNorthbrook, IL · ~2,777 kmA2LAShares 2 accredited test methodsETSI EN 300 220-1ICES-001
- Intertek Testing Services NALake Forest, CA · ~114 kmA2LAShares 1 accredited test methodICES-001
- EUROFINS ELECTRICAL AND ELECTRONIC TESTING NAAustin, TX · ~1,859 kmA2LAShares 1 accredited test methodICES-001
- TUV Rheinland of North AmericaBoxborough, MA · ~4,113 kmA2LAShares 1 accredited test methodETSI EN 300 220-1
Accreditation data collected from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.