Registers refreshed 2026-11-08.See refresh dates
United States

Cisco Systems

170 West Tasman Drive, Mailstop SJC-P/1, 95134-1706, San Jose, CA, United States

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A2LA 1178.01ISO/IEC 17025Register refreshed 2026-11-06

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Accredited standards
18
A2LA certificate
1
Site in our directory
1
A2LA accredited scope

What this lab is accredited for

Our reading of the A2LA scope: each standard once, with its official name where we have checked it.

Only this lab. Searches the 18 standard numbers and the 10 official names we hold. When no standard matches, it searches the method text of every scope line.

IEC9
IEC 60533Exclusion

Limits written next to it

IEC 60533:2015 (excluding special power distribution zone)

Exclusion. Written next to it on line 7 of A2LA certificate 1178.01.

IEC 60571
IEC 60945Maritime navigation and radiocommunication equipment and systems - General requirements - Methods of testing and required test results
IEC 60950-1Information technology equipment - Safety - Part 1: General requirementsExclusion

Limits written next to it

IEC 60950-1:2005, A1:2009, A2:2013 (excluding: Cl.

Exclusion. Written next to it on line 3 of A2LA certificate 1178.01.

IEC 61010-1Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 1: General requirements
IEC 61850-3
IEC 62368-1Audio/video, information and communication technology equipment - Part 1: Safety requirements
IEC 62498-1
IEC 62498-3
IEC 61000 series8
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection
IEC 61000-3-11Electromagnetic compatibility (EMC) - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - Equipment with rated current ≤ 75 A and subject to conditional connection
IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test
IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields
IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test
IEC 61000-4-10
IEC 61000-4-16
Other standards1
ANSI C63

Read from the A2LA scope document we downloaded on 2025-12-02. Register refreshed 2026-11-06.

Scope as published by A2LA

9 lines
A2LA

ISO/IEC 17025

Active

1178.01

The scope document we hold says it is valid until 2026-11-30.

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Location

170 West Tasman Drive, Mailstop SJC-P/1, San Jose, CA, 95134-1706, US

37.33617, -121.89059

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Accreditation data refreshed from the A2LA register on .

This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.