Japan

JEL Limited

2971 Nakabyo, 270-1121, Abiko, Japan

DAKKS D-PL-12156-01-00ISO/IEC 17025Register refreshed 2026-11-06

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Accredited standards: 22
DAKKS certificate: 1
Sites in our directory: 2

DAKKS accredited scope

What this lab is accredited for

Our reading of the DAKKS scope: each standard once, with its official name where we have checked it.

Search this lab’s scope for a standard or test

Only this lab. Searches the 22 standard numbers and the 22 official names we hold. When no standard matches, it searches the method text of every scope line.

IEC 61000 series15

IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)

IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection

IEC 61000-3-11Electromagnetic compatibility (EMC) - Part 3-11: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems - Equipment with rated current ≤ 75 A and subject to conditional connection

IEC 61000-3-12Electromagnetic compatibility (EMC) - Part 3-12: Limits - Limits for harmonic currents produced by equipment connected to public low-voltage systems with input current >16 A and ≤ 75 A per phase

Certificate says EN 61000-3-12. Probably the same standard; not checked against the EN document.

IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

Certificate says EN 61000-4-2. Probably the same standard; not checked against the EN document.

IEC 61000-4-3Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test

Certificate says EN 61000-4-3. Probably the same standard; not checked against the EN document.

IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

IEC 61000-4-39Electromagnetic compatibility (EMC) - Part 4-39: Testing and measurement techniques - Radiated fields in close proximity - Immunity test

IEC 61000-6-1Electromagnetic compatibility (EMC) - Part 6-1: Generic standards - Immunity standard for residential, commercial and light-industrial environments

IEC 61000-6-2Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity standard for industrial environments

IEC 61000-6-3Electromagnetic compatibility (EMC) - Part 6-3: Generic standards - Emission standard for equipment in residential environments

Certificate says EN 61000-6-3. Probably the same standard; not checked against the EN document.

IEC 61000-6-4Electromagnetic compatibility (EMC) - Part 6-4: Generic standards - Emission standard for industrial environments

IEC 61326 series4

IEC 61326-1Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 1: General requirements

IEC 61326-2-1Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-1: Particular requirements - Test configurations, operational conditions and performance criteria for sensitive test and measurement equipment for EMC unprotected applications

IEC 61326-2-2Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-2: Particular requirements - Test configurations, operational conditions and performance criteria for portable testing, measuring and monitoring equipment used in low-voltage distribution systems

IEC 61326-2-3Electrical equipment for measurement, control and laboratory use - EMC requirements - Part 2-3: Particular requirements - Test configuration, operational conditions and performance criteria for transducers with integrated or remote signal conditioning

Other standards3

CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements

Certificate says EN 55032. Probably the same standard; not checked against the EN document.

CISPR 35Electromagnetic compatibility of multimedia equipment - Immunity requirements

Certificate says EN 55035. Probably the same standard; not checked against the EN document.

IEC 60601-1-2Medical electrical equipment - Part 1-2: General requirements for basic safety and essential performance - Collateral Standard: Electromagnetic disturbances - Requirements and tests

Read from the scope as published by DAKKS. Register refreshed 2026-11-06.

Scope as published by DAKKS

8 lines

DAKKS

ISO/IEC 17025

Active

D-PL-12156-01-00

View scope

Accredited scope, certificate D-PL-12156-01-00

Line	Method	Matrix	Range
1	DIN EN ISO/IEC 17025:2018	-	-
2	IEC 61000-6-1; IEC 61000-6-2; IEC 61000-6-3	-	-
3	EN 61000-4-2; IEC 61000-6-4; IEC 61000-4-2; IEC 61000-4-3; IEC 61000-4-4	-	-
4	IEC 61000-4-6; IEC 61000-4-8; IEC 61000-4-11; IEC 61000-4-39; IEC 61000-3-2	-	-
5	IEC 61000-3-3; IEC 61000-3-11; IEC 61000-3-12	-	to 75 A
6	IEC 60601-1-2; IEC 61326-1	-	-
7	EN 55032; IEC 61326-2-1; IEC 61326-2-2; IEC 61326-2-3	-	to 6 GHz
8	EN 55032; EN 55035	-	to 6 GHz

Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

2971 Nakabyo, Abiko, 270-1121, JP

35.86400, 140.02807

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Other Locations

1 other site in this organization

Chiba, JP

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Labs with overlapping accredited scope in Japan

Accreditation data refreshed from the DAKKS register on 2026-11-06.

This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the DAKKS entry linked above.