Vitrek
900 N. State Street, 60441, Lockport, IL, United States
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- A2LA certificate
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What this lab is accredited for
We could not match the method references in this lab’s scope to published test standard numbers. The full scope as published is below.
Only this lab. Searches the method, matrix and range of each of the 5 scope lines.
A2LA certificate 3678.01 · 5 lines
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994 | - | See scope document |
| 2 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 3678.01) 2/7/2025 Page 2 of 4
Parameter/Equipment
Range
CMC2, 3 (±)
Comments
DC Current – Measure
(0 to 0.1) mA
(0.1 to 1) mA
(1 to 10) mA
(10 to 100) mA
(100 to 1000) mA
33 µA/A + 900 pA
31 µA/A + 6 nA
31 µA/A + 60 nA
48 µA/A + 600 nA
0.013 % + 12 µA
HP 3458A
Resistance – Generate,
Fixed Points
0.05 Ω
0.100 Ω
1.0 Ω
10.0 Ω
100.0 Ω
1.0 kΩ
10.0 kΩ
100.0 kΩ
1.0 MΩ
5.0 MΩ
10.0 MΩ
100.0 MΩ
1.0 GΩ
0.066 %
0.072 %
0.066 %
37 µΩ/Ω
28 µΩ/Ω
24 µΩ/Ω
0.018 %
84 µΩ/Ω
38 µΩ/Ω
63 µΩ/Ω
0.014 %
0.021 %
0.06 %
(IET HARS-LX-1)
Decade BOC)
Vitrek 0.05 Ω
Vitrek SR502
Vitrek SR502
Vitrek 10 Ω
ESI R925C
Vitrek 1 kΩ
Vitrek 10 k
Vitrek 4610
Vitrek 4610
Vitrek CAL 5M
Vitrek 4610
Vitrek 4610
Vitrek 4610
Resistance – Measure
Up to 10 Ω
(10 to 100) Ω
100 Ω to 1 kΩ
(1 to 10) kΩ
(10 to 100) kΩ
100 kΩ to 1 MΩ
(1 to 10) MΩ
(10 to 100) MΩ
100 MΩ to 1 GΩ
0.015 % + 50 µΩ
21 µΩ/Ω + 500 µΩ
14 µΩ/Ω + 500 µΩ
14 µΩ/Ω + 5 mΩ
14 µΩ/Ω + 50 mΩ
20 µΩ/Ω + 2.0 Ω
90 µΩ/Ω + 100 Ω
0.073 % + 1 kΩ
0.62 % + 10 kΩ
HP 3458A | ||
| 3 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 3678.01) 2/7/2025 Page 3 of 4
Parameter/Range
Frequency
CMC2, 3 (±)
Comments
AC Voltage – Generate
Up to 23 V
(23 to 45) V
(45 to 90) V
(90 to 180) V
(180 to 360) V
(360 to 650) V
(650 to 1008) V
50 Hz
50, 100 or 400 Hz
1.7 mV
4.0 mV
6.5 mV
13 mV
33 mV
61 mV
95 mV
Fluke 6105A
AC Voltage – Measure
(0 to 100) mV
(0.1 to 1) V
(1 to 10) V
(10 to 100) V
(1 to 10) kV
(10 to 30) kV
(30 to 50) kV
(50 to 70) kV
40 Hz to 1 kHz
40 Hz to 20 kHz
(20 to 50) kHz
(50 to 100) kHz
(50 to 60) Hz
83 µV/V + 2.0 µV
83 µV/V + 20 µV
83 µV/V + 2.0 mV
0.024 % + 2.0 mV
0.041 % + 2.0 mV
0.14 % + 2.0 mV
0.028 %
0.019 %
0.016 %
0.022 %
HP 3458A
Vitrek 4710 ratiometric
transfer standard with
HP3458A
AC Current – Generate
Up to 0.1 A
(0.1 to 1.0) A
(1.0 to 10.0) A
(10.0 to 20.0) A
(20.0 to 40.0) A
(50 to 60) Hz
71 µA/A + 2.5 µA
69 µA/A + 10 µA
74 µA/A + 100 µA
73 µA/A + 200 µA
73 µA/A + 500 µA
Fluke 6105A | ||
| 4 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 3678.01) 2/7/2025 Page 4 of 4
Parameter/Range
Frequency
CMC2, 3 (±)
Comments
AC Current – Measure
(0 to 0.1) mA
(0.1 to 1.0) mA
(1.0 to 10.0) mA
(10.0 to 100.0) mA
(100.0 to 1000.0) mA
(1 to 20) A
(20 to 40) A
(45 to 100) Hz
(45 to 100) Hz
0.14 % + 0.03 µA
0.07 % + 0.2 µA
0.072 % + 2.0 µA
0.072 % + 20 µA
0.095 % + 200 µA
0.26 %
0.78 %
HP 3458A
HP 3458A
with 50 mΩ shunt
_____________________________
1 This laboratory offers commercial calibration service.
2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3 The measurands stated are generated using the indicated instrument (see Comments). This capability is
suitable for the calibration of the devices intended to measure the measuran d in the ranges indicated.
CMCs are expressed as either a specific value that covers the full range or as a fraction /percent of the
reading plus a fixed floor specification.
4
This scope meets A2LA’s P112 Flexible Scope Policy. | ||
| 5 | ISO/IEC 17025:2017; ANSI/NCSLI Z540-1-1994 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
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- SIMCO Electronics - ChicagoNaperville, IL · ~22 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
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- Florida Metrology, LLC d/b/a Acme MetrologyVilla Park, IL · ~34 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- DicksonAddison, IL · ~38 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Martin Calibration, Inc dba Great Lakes Calibration,Suite E Addison, IL · ~38 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
Accreditation data refreshed from the A2LA register on .
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