Japan

Sony Global Manufacturing & Operations Corporation EMC/RF Test Laboratory, Kohda Branch

Name: Sony Global Manufacturing & Operations Corporation EMC/RF Test Laboratory, Kohda Branch
Address: 1, Suzumegairi Sakazaki Kohta-cho Nukata-gun, Aichi-ken, 444-0194, Japan, Aichi-ken, JP

1, Suzumegairi Sakazaki Kohta-cho Nukata-gun, Aichi-ken, 444-0194, Japan, Aichi-ken, Japan

A2LA 3203.02ISO/IEC 17025Register refreshed 2026-11-06

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Accredited standards: 10
A2LA certificate: 1
Site in our directory: 1

A2LA accredited scope

What this lab is accredited for

Our reading of the A2LA scope: each standard once, with its official name where we have checked it.

Search this lab’s scope for a standard or test

Only this lab. Searches the 10 standard numbers and the 10 official names we hold. When no standard matches, it searches the method text of every scope line.

ANSI C63.4American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz

CISPR 22Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement

CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements+2 national

National versions in the same scope

AS/NZS CISPR 32identical to it

VCCI-CISPR 32probably the same standard; matched by number only

Identical and changed are as the national standards body lists them; we read that on 2026-10-06. The others are matched by number only.

Certificate says EN 55032. Probably the same standard; not checked against the EN document.

FCC PART 15Radio Frequency Devices

IEC 60601-1Medical electrical equipment - Part 1: General requirements for basic safety and essential performance

IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

IEC 61000-4-39Electromagnetic compatibility (EMC) - Part 4-39: Testing and measurement techniques - Radiated fields in close proximity - Immunity test

Read from the A2LA scope document we downloaded on 2026-03-14. Register refreshed 2026-11-06.

Scope as published by A2LA

6 lines

A2LA

ISO/IEC 17025

Active

3203.02

The scope document we hold says it is valid until 2027-10-31.

View scope

Accredited scope, certificate 3203.02

Line	Method	Matrix	Range
1	47 CFR, FCC Part 15B (using ANSI C63.4:2014); CISPR 22; AS/NZS CISPR 32; ICES-003; CISPR 32; CISPR 32:2012; CISPR 32:2015; CISPR 32:2015＋A1:2019; EN 55032; EN 55032:2015; EN 55032:2015+A1:2020; EN 55032:2015+A11:2020; EN 55032:2012; VCCI-CISPR 32:2016; CISPRJ 32:2017; SANS 2332; SANS 2332:2017; BETS-7	-	to 40 GHz
2	Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 3203.02) Revised 11/26/2025 Page 2 of 5 Test Technology Test Method(s) 1,2: Radio Communications (900MHz, 2.4GHz and 5 GHz) (Only Radiated Spurious Emissions) EN 300 328; EN 300 328 V2.2.2 (2019-07); EN 301 893; EN 301 893 V2.1.1 (2017-05); EN 301 893 V2.2.1 (2024-11); EN 300 220-1 V3.1.1 (2017-02); EN 300 220-2 V3.1.1 (2017-02); EN 300 440; EN 300 440 V2.1.1 (2017-03); EN 300 440-1; EN 300 440-2 Wireless (RFID) (13.56 MHz) (Only Radiated Spurious Emissions) EN 300 330; EN 300 330 V2.1.1 (2017-02); EN 300 330-1; EN 300 330-2 GNSS (Only Radiated Spurious Emissions) EN 300 440; EN 300 440 V2.1.1 (2017-03); EN 300 440-1; EN 300 440-2; EN 303 413; EN 303 413 V1.2.1 (2021-04) Generic and/or Product Family Standards (excluding CPE with xDSL Ports and equipment with telephony capabilities) CISPR 11 (Group 1); CISPR 11:2009+A1:2010 (Group 1); CISPR 11:2015+A1:2016 (Group 1); CISPR 11:2015+A1:2016+A2:2019 (Group 1); CISPR 11:2024 (Group 1); EN 55011 (Group 1); EN 55011:2009+A1:2010 (Group 1); EN 55011:2007 (Group 1); EN 55011:2016+A1:2017 (Group 1); EN 55011:2016+A1:2017＋A11:2020 (Group 1); EN 55011:2016+A1:2017＋A2:2021 (Group 1); EN 301 489-1; EN 301 489-1 V2.1.1 (2017-02); EN 301 489-1 V2.2.3 (2019-11); EN 301 489-3; EN 301 489-3 V 2.1.1 (2019-03); EN 301 489-9; EN 301 489-9 V2.1.1 (2019-04); EN 301 489-17; EN 301 489-17 V3.2.4 (2020-09); EN 301 489-19; EN 301 489-19 V2.1.1 (2019-04); CISPR 35; CISPR 35:2016; EN 55035; EN 55035:2017; SANS 2335; SANS 2335:2018; IEC 61000-6-1; IEC 61000-6-1:2016; EN 61000-6-1; EN IEC 61000-6-1:2019; IEC 61000-6-2; IEC 61000-6-2:2016; EN 61000-6-2; EN IEC 61000-6-2:2019; IEC 61000-6-3; IEC 61000-6-3:2020; EN 61000-6-3; EN 61000-6-3:2021; IEC 61000-6-4; IEC 61000-6-4:2018; EN 61000-6-4; EN IEC 61000-6-4:2019; IEC 61326-1; IEC 61326-1:2020; EN 61326-1; EN IEC 61326-1:2021
3	Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 3203.02) Revised 11/26/2025 Page 3 of 5 Test Technology Test Method(s) 1,2: Medical 3 (excluding life-supporting equipment) IEC 60601-1-2 Ed. 4:2014+A1:2020; EN 60601-1-2 Ed. 4:2015+A1:2021; JIS T 0601-1-2:2023; IEC 60601-1-2 Ed. 4:2014; IEC 60601-1-2 Ed. 3:2007; EN 60601-1-2 Ed. 4:2015; EN 60601-1-2:2007; JIS T 0601-1-2:2012; JIS T 0601-1-2:2018; IEC 60601-2-18:2009 (Clause 202); EN 60601-2-18:2015 (Clause 202); IEC 60601-2-37:2007 (Clause 202.6); EN 60601-2-37:2008 (Clause 202.6) Current Harmonics IEC 61000-3-2; IEC 61000-3-2:2018; IEC 61000-3-2:2018+A1:2020; IEC 61000-3-2:2018+A1:2020+A2:2024; IEC 61000-3-2:2005+A1:2008+A2:2009; EN 61000-3-2; EN IEC 61000-3-2:2019; EN 61000-3-2:2014; EN 61000-3-2:2006+A1:2009+A2:2009; EN IEC 61000-3-2:2019∔A1:2021; EN IEC 61000-3-2:2019＋A1:2021+A2:2024; SANS 61000-3-2:2009 Voltage Fluctuations and Flicker IEC 61000-3-3; IEC 61000-3-3:2008; IEC 61000-3-3:2013; IEC 61000-3-3:2013+A1:2017; IEC 61000-3-3:2013+A1:2017+A2:2021; EN 61000-3-3; EN 61000-3-3:2008; EN 61000-3-3:2013; EN 61000-3-3:2013+A1:2019; EN 61000-3-3:1995+A1:2001; SANS 61000-3-3:2009; EN 61000-3-3:2013+A1:2019+A2:2021 Electrostatic Discharge IEC 61000-4-2; EN 61000-4-2; EN 61000-4-2:2009; JIS C 61000-4-2; IEC 61000-4-2:2008; JIS C 61000-4-2:2012 Radiated Immunity IEC 61000-4-3; IEC 61000-4-3:2020; IEC 61000-4-3:2006+A1:2007+A2:2010; EN 61000-4-3; EN IEC 61000-4-3:2020; EN 61000-4-3:2006+A1:2008+A2:2010; JIS C 61000-4-3; JIS C 61000-4-3:2012; JIS C 61000-4-3:2022 Electrical Fast Transient/Burst IEC 61000-4-4; EN 61000-4-4; EN 61000-4-4:2012; EN 61000-4-4:2004; EN 61000-4-4:2004+A1:2010; JIS C 61000-4-4; IEC 61000-4-4:2004+A1:2010; JIS C 61000-4-4:2015
4	IEC 61000-4-5; IEC 61000-4-5:2014+A1:2017; IEC 61000-4-5:2005; EN 61000-4-5; EN 61000-4-5:2014+A1:2017; EN 61000-4-5:2014; EN 61000-4-5:2006; JIS C 61000-4-5; JIS C 61000-4-5:2018; IEC 61000-4-6; IEC 61000-4-6:2003+A1:2004+A2:2006; IEC 61000-4-6:2008; EN 61000-4-6; EN 61000-4-6:2014; EN 61000-4-6:2009; EN 61000-4-6:2007; JIS C 61000-4-6; JIS C 61000-4-6:2006; IEC 61000-4-8; IEC 61000-4-8:2009; EN 61000-4-8; EN 61000-4-8:2010; EN 61000-4-8:1994+A1:2001; JIS C 61000-4-8; JIS C 61000-4-8:2016; IEC 61000-4-11; IEC 61000-4-11:2020; IEC 61000-4-11:2004+A1:2017; EN 61000-4-11; EN IEC 61000-4-11:2020; EN 61000-4-11: 2004+A1:2017; EN 61000-4-11:2004; JIS C 61000-4-11; JIS C 61000-4-11:2008; JIS C 61000-4-11:2021; IEC 61000-4-39; IEC 61000-4-39:2017; EN 61000-4-39; EN 61000-4-39:2017; IEC 60601-1:2005 + A1:2012 (Ed. 3.1) + A2:2020 (Ed. 3.2)	-	-
5	ANSI C63.4:2014	-	to 40000 MHz
6	Extracted from the scope document; tables may not line up. View scope for the original. For the tests to which this accreditation applies, please refer to the laboratory’s Electrical Scope of Accreditation. Accredited Laboratory A2LA has accredited SONY GLOBAL MANUFACTURING & OPERATIONS CORPORATION EMC/RF TEST LABORATORY, KOHDA BRANCH Aichi-ken, Japan for technical competence in the field of Electrical Testing This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates technical competence for a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated April 2017). Presented this 15th day of October 2025. _______________________ Mr. Trace McInturff, Vice President, Accreditation Services For the Accreditation Council Certificate Number 3203.02 Valid to October 31, 2027

Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

1, Suzumegairi Sakazaki Kohta-cho Nukata-gun, Aichi-ken, 444-0194, Japan, Aichi-ken, JP

34.99916, 137.25457

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