Tektronix, Inc. - Beaverton

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 2 of 10 Parameter/Equipment Range CMC 2, 4, 5 (±) Comments DC Voltage – Measure3, Fixed Points (cont) 0.6 V 1.9 V 2.3 V 5 V 6 V 19 V 23 V 50 V 60 V 190 V 22 μV 74 μV 73 μV 170 μV 570 μV 720 μV 970 μV 1.9 mV 2.3 mV 6.5 mV Agilent / HP 3458A Oscilloscope Probe DC Gain – Measure (0 to 100) mV 100 mV to 1 V (1 to 10) V 4.8 mV/V + 0.23 µV 0.6 mV/V + 0.23 µV 0.3 mV/V + 0.39 µV Keithley 2700 & Keithley 2400 AC Voltage – Generate3, Sinewave (Vrms) 500 Hz 320 mV to 3.2 V (3.2 to 32) V (32 to 320) V (320 to 800) V 0.14 % 0.13 % 0.10 % 0.10 % Wavetek 9100 AC Voltage – Generate3, Squarewave (Vp-p) 1 kHz 1 mV to 5.0 V, 50 Ω 1 mV to 200 V, 1 MΩ 0.79 mV/V + 7.8 µV 0.79 mV/V + 7.8 µV Wavetek 9500, Fluke 9500/B w/ 9530 Parameter/Range Frequency CMC 2, 5 (±) Comments AC Voltage – Measure3 (0 to 10) mV (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz 100 kHz to 1 MHz (1 to 4) MHz (4 to 8) MHz 0.27 µV/V + 2.3 µV 0.18 µV/V + 0.85 µV 0.25 µV/V + 0.85 µV 0.78 µV/V + 0.85 µV 3.9 µV/V + 0.85 µV 31 µV/V + 3.9 µV 54 µV/V + 5.4 µV 0.16 mV/V + 6.2 µV Keysight 3458A

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 3 of 10 Parameter/Range Frequency CMC2, 5 (±) Comments AC Voltage – Measure3 (cont) (10 to 100) mV (0.1 to 1) V (1 to 10) V (10 to 100) V (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 4) MHz (4 to 8) MHz (8 to 10) MHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 4) MHz (4 to 8) MHz (8 to 10) MHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz (1 to 4) MHz (4 to 8) MHz (8 to 10) MHz (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 300 kHz to 1 MHz 0.13 µV/V + 3.1 µV 71 nV/V + 1.6 µV 0.11 µV/V + 1.6 µV 0.23 µV/V + 1.6 µV 0.62 µV/V + 1.6 µV 2.3 µV/V + 7.8 µV 7.8 µV/V + 7.8 µV 31 µV/V + 54 µV 31 µV/V + 62 µV 0.12 V/V + 78 µV 0.28 mV/V + 31 µV 98 µV/V + 16 µV 0.14 mV/V + 16 µV 0.25 mV/V + 16 µV 0.63 mV/V + 16 µV 2.9 mV/V + 78 µV 7.9 mV/V + 78 µV 31 mV/V + 0.54 mV 31 mV/V + 0.62 mV 0.12 V/V + 0.78 mV 0.28 mV/V + 0.31 mV 97 µV/V + 0.16 mV 0.13 mV/V + 0.16 mV 0.25 mV/V + 0.16 mV 0.63 mV/V + 0.16 mV 2.9 mV/V + 0.78 mV 7.9 mV/V + 0.78 mV 31 mV/V + 5.4 mV 31 mV/V + 6.2 mV 0.12 V/V + 7.8 mV 0.31 mV/V + 3.1 mV 0.17 mV/V + 1.6 mV 0.17 mV/V + 1.6 mV 0.28 mV/V + 1.6 mV 0.93 mV/V + 1.6 mV 3.5 mV/V + 7.8 mV 12 mV/V + 7.8 mV Keysight 3458A

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 4 of 10 Parameter/Range Frequency CMC2, 5 (±) Comments AC Voltage – Measure3 (cont) (100 to 700) V (1 to 40) Hz 40 Hz to 1 kHz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz 0.42 mV/V + 31 mV 0.32 mV/V + 16 mV 0.47 mV/V + 16 mV 0.93 mV/V + 16 mV 2.3 mV/V + 16 mV Keysight 3458A Parameter/Equipment Range CMC2, 4, 5 (±) Comments Resistance – Generate 3 Fixed Points (40 to 400) Ω 400 Ω to 4 kΩ (4 to 40) kΩ (40 to 400) kΩ 400 kΩ to 4 MΩ (4 to 40) MΩ 50 Ω 1 MΩ 0.076 % 0.055 % 0.056 % 0.11 % 0.15 % 0.32 % 0.018 Ω 420 Ω Wavetek 9100 ESI DB877

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 7 of 10 Parameter/Equipment Range CMC2, 5 (±) Comments Oscilloscopes 3 – (cont) RMS Noise – Measure Risetime – Generate Jitter Timeout Trigger Accuracy 20 MHz BW 175 MHz BW (0.2 to 10) GHz BW (15 to 19) ps 0.03 ns 0.05 ns 62.5 ps 0.08 ns 83.3 ps 0.1 ns 166.7 ps 200 ps (0.3 to 2) ns 400 ps 500 ps 1000 ps 2 ns 5 ns 10 ns (2 to 14) ns 18 ns to 100 µs 100 MHz 0.18 µV 2.2 µV 1.1 µV 5.3 ps 0.021 ps 0.016 ps 0.0041 ps 0.025 ns 0.0015 ps 0.033 ns 0.0015 ps 0.0016 ps 0.03 ps 0.0017 ps 0.0018 ps 0.0065 ps 0.000 019 ns 0.000 026 ns 0.031 ps 0.14 ps 0.014 ps 1.1 ns Tektronix MSO series 067133800 Anritsu MG3694C Fluke 9500/B w/ 9530

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 9 of 10 Parameter/Range Frequency CMC2, 4, 5 (±) Comments RF Flatness – Measure 3 100 mV 100 mV 100 mV 300 mV 300 mV 1 V 1 V 1 V 3 V 3 V (10 to 550) MHz 550 MHz to 1.5 GHz (1.5 to 3) GHz 10 MHz to 1.5 GHz (1.5 to 3) GHz (10 to 550) MHz 550 MHz to 1.5 GHz (1.5 to 3 GHz) 10 MHz to 2 GHz 2.5 GHz 1.4 % 2.1 % 2.7 % 1.4 % 2.6 % 1.4 % 2.0 % 2.6 % 1.7 % 2.0 % Rhode & Schwarz NRVS and NRV-Z5 III. Time & Frequency Parameter/Equipment Range CMC2, 7 (±) Comments Frequency & Period – Measuring Equipment 12 kHz to 3.2 GHz (3.2 to 40) GHz 1.3 parts in 10 9 1.4 parts in 10 6 Fluke 9500/B w/ 9530, Fluke 910 Anritsu MG3694C, Fluke 910 Frequency – Measure 0.001 Hz to 1 kHz (1 to 1000) kHz (1 to 225) MHz 0.12 mHz/Hz 0.3 nHz/Hz 0.12 nHz/Hz Keysight 53131A, Fluke 910 (Delta Time Accuracy) Time Measurement Up to 1 GHz (1 to 2) GHz (2 to 16) GHz (14.28 to 43.47) GHz 2.8 ps 0.14 ps 0.0015 ps 0.12 ps Anritsu MG3694C Agilent E8257D _________________________________________

(A2LA Cert. No. 2357.01) Revised 01/13/2026 Page 10 of 10 1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (C MC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC Uncertainty due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects such as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC. 4 In the statement of the CMC, the given percentages are percent of reading. 5 The stated measured values are determined using the indicated instrument (see Comments). This capability is suitable for the calibration of the devices intended to measure or generate the measured value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range or as a percent or fraction of the reading plus a fixed floor specification. 6 This scope meets A2LA’s P112 Flexible Scope Policy. 7 The type of instrument or material being calibra ted is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.