United States

Snap One

1355 W. Innovation Way, Suite 125, 84043, Lehi, UT, United States

A2LA 7438.01ISO/IEC 17025Register refreshed 2026-11-06

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Accredited standards: 18
A2LA certificate: 1
Sites in our directory: 2

A2LA accredited scope

What this lab is accredited for

Our reading of the A2LA scope: each standard once, with its official name where we have checked it.

Search this lab’s scope for a standard or test

Only this lab. Searches the 18 standard numbers and the 13 official names we hold. When no standard matches, it searches the method text of every scope line.

IEC 61000 series9

IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)

IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection

IEC 61000-4-2Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test

IEC 61000-4-3Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test

Certificate says EN 61000-4-3. Probably the same standard; not checked against the EN document.

IEC 61000-4-4Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test

IEC 61000-4-5Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test

IEC 61000-4-6Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio-frequency fields

IEC 61000-4-8Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test

IEC 61000-4-11Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase

ETSI5

ETSI EN 300 220-1

ETSI EN 300 328Wideband transmission systems; Data transmission equipment operating in the 2,4 GHz band; Harmonised Standard for access to radio spectrum

ETSI EN 300 440

ETSI EN 301 489-1

ETSI EN 301 489-17

Other standards4

ANSI C63.4American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz

CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements

Certificate says EN 55032. Probably the same standard; not checked against the EN document.

FCC PART 15Radio Frequency Devices

ICES-003

Read from the A2LA scope document we downloaded on 2026-08-05. Register refreshed 2026-11-06.

Scope as published by A2LA

4 lines

A2LA

ISO/IEC 17025

Active

7438.01

The scope document we hold says it is valid until 2027-05-31.

View scope

Accredited scope, certificate 7438.01

Line	Method	Matrix	Range
1	CFR 47, FCC Part 15 (Subpart B) using ANSI C63.4:2014; ICES-003; RSS-GEN; CISPR 32; EN 55032; EN/IEC 61000-3-2; EN/IEC 61000-3-3; EN/IEC 61000-4-2; IEC 61000-4-2; EN/IEC 61000-4-3; IEC 61000-4-3; EN/IEC 61000-4-4; IEC 61000-4-4; EN/IEC 61000-4-5; IEC 61000-4-5; EN/IEC 61000-4-6; IEC 61000-4-6; EN/IEC 61000-4-8; IEC 61000-4-8; EN 61000-4-11; IEC 61000-4-11; ETSI EN 300 328	-	150000 to 26000000000 Hz
2	ETSI EN 300 220; ETSI EN 300 440; ETSI EN 301 489-1; ETSI EN 301 489-17; AS/NZS 4268; RSS-247; RSS-Gen; FCC Part 15 Subpart C	-	See scope document
3	ANSI C63.4:2014; ANSI C63.10: 2020 + COR 1:2023	-	to 26000 MHz
4	ISO/IEC 17025:2017	-	-

Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

Location

1355 W. Innovation Way, Suite 125, Lehi, UT, 84043, US

40.43089, -111.87027

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Other Locations

1 other site in this organization

Lehi, UT, US

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Accreditation data refreshed from the A2LA register on 2026-11-06.

This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.