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Registers collected 2026-08-04 to 2026-08-05.See collection dates

IEC 62369-1 Accredited Testing Labs Worldwide

26 accredited laboratories in 4 countries hold IEC 62369-1 in their ISO/IEC 17025 scope. Primary accreditors include American Association for Laboratory Accreditation, Deutsche Akkreditierungsstelle.

Total labs
26
Countries
4

Available in 4 Countries

China
13 labs
Germany
9 labs
United States
4 labs
Italy
1 lab

Top analytes for IEC 62369-1

  • Specific Absorption Rate (Sar) (4)
  • Specific Absorption Rate (3)
  • Electromagnetic Fields (2)
  • Rf Exposure (1)

Sample labs

LabSure Testing Services (Tianjin) Co.,Ltd.
Tianjin, CN

Test(s): Test Method(s): Intentional Radiators ANSI C63.10 (2020); ANSI C63.10 (2020) +Cor1(2023); ANSI C63.26 (2015); IEC/CISPR 11 ED. 7.0 (2024-02); AS/NZS CISPR 11 (2011); CISPR 13 (2009)

CTC Laboratories, Inc.
Shenzhen, Guangdong, CN

Test(s): Test Method(s) 1: European Union (EU) EN 300 220-1; EN 300 220-2; EN 300 220-3-1; EN 300 220-3-2; EN 300 220-4; EN 300 330; EN 300 440; EN 303 372-1; EN 303 372-2; EN 303 340; EN 303 345-1; EN 303 345-2; EN 303 345-3; EN

C.E.I.A. Spa a socio unico Sez. LACE Laboratorio di Compatibilità Elettromagnetica
Civitella in Valdichiana, IT

IEC 62369-1:2008 _ Il simbolo (1), se presente, indica: "Materiale/Prodotto/Matrice" non previsto dal metodo ma assimilabile/The symbol (1), if present, means: Material/Product/Matrix not provided for by the method but acceptable Per la

Sporton International Inc. (Kunshan)
Jiangsu Province, CN

IEC 62369-1; IEC/IEEE 62209-1528; EN IEC/IEEE 62209-1528; AS/NZS IEC/IEEE 62209.1528 Specific Absorption Rate (SAR) IEEE Std 1528-2013; IEC/IEEE 62209-1528; EN IEC/IEEE 62209-1528; BS EN/EN 50360; BS EN/EN 50566; BS EN/EN 62209-

TÜV Technische Überwachung Hessen GmbH EMV-Labor
Kassel, DE

IEC 62369-1:2008 Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz – Part 1: Fields produced by devices used for electronic article

VDE Prüf- und Zertifizierungsinstitut
Offenbach am Main, DE

IEC 62369-1:2008); Deutsche Fassung EN 62369-1:2009 eigenständig oder in Verbindung mit: DIN EN 50364 (VDE 0848-364):2010-11, Begrenzung der Exposition von Personen gegenüber elektromagnetischen Feldern von Geräten, die im Frequenzber

CSA Group Bayern
Plattling, DE

Fach- bereich Norm oder Prüfverfahren / Ausgabestand Titel der Norm oder des Prüfverfahrens Einschränkung zum Prüfverfahren 1.4 EMV im TK-Bereich EMV ETSI EN 300 386: V1.6.1 Electromagnetic compatibility and Radio spectrum Ma

MRT Technology (Suzhou) Co.,
Suzhou, Jiangsu, CN

Test Technology: Test Method(s) 2,3: Radio (excluding HAC) PERMEN KOMINFO NO 10 TAHUN 2019; PERMEN KOMINFO NO 13 TAHUN 2021; PERMEN KOMINFO NO 27 TAHUN 2015; PERMEN KOMINFO NO 44 TAHUN 2012; PERDIRJEN SDPPI NO 02 TAHUN 2019;

7layers
Ratingen, DE

Bereich Norm / Hausverfahren / Version Titel der Norm oder des Hausverfahrens Prüfbereich / Einschränkung TK EN 62369 -1 2009 (2009-04-30) Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) i

UL LLC
Novi, MI, US

(A2LA Certificate No. 0751.06) 03/06/2026 Page 11 of 12 1When the date, edition, version, etc. is not identified in the scope of accreditation, laboratories may use the version that immediately precedes the current version for a period

Compliance Certification Services (Kunshan) Inc. Shenzhen Branch
Shenzhen, CN

IEC 62369-1; EN 50566; BS EN 50566; EN 50385; BS EN 50385; EN 62232; IEC 62232; BS EN 62232; EN 50364; BS EN 50364; EN 50663; BS EN 50663; EN 50665; BS EN 50665; EN IEC/IEEE 62209-1528; IEEE Std. 1528; IEEE Std. C95.1; IEEE Std. C95

Element Materials Technology Straubing GmbH Element Materials Technology Straubing
Straubing, DE

IEC 62369-1:2008-08 Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic arti

Element Materials Technology Minneapolis - Brooklyn Park
Brooklyn Park, MN, US

(A2LA Certificate No. 3310.05) Revised 07/28/2025 Page 9 of 11 Test Technology: Test Method(s) 1, 2, 3: Singapore Japan IMDA TS CMT (September 2020); IMDA TS CMT (December 2024); IMDA TS LMR Issue 1 (October 2016); IMDA

Sporton International Inc. (Shenzhen)
Shenzhen, CN

IEC 62369-1; IEC 62209-3; IEC/IEEE 62209-1528; AS/NZS IEC/IEEE 62209.1528; AS/NZS 2772.2; ACMA Radio Communications Standards Article 14-2 of the Ordinance Regulating Radio Equipment Annex 79 of MIC Notification No.88 Specific Abso

Intertek Deutschland
Kaufbeuren, DE

IEC 62369-1:2008 Evaluation of human exposure t o electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300 GHz - Part 1: Fields produced by devices used for electronic article

SGS-CSTC Standards Technical Services Co., Ltd. Shenzhen Branch
Shenzhen, Guangdong, CN

IEC 62369-1; EN 50566; BS EN 50566; EN 50385; BS EN 50385; EN 50383; EN 62232; IEC 62232; BS EN 62232; EN IEC 62232; BS EN IEC 62232; EN 50364; BS EN 50364; EN 50663;BS EN 50663; EN 50665; BS EN 50665; EN 5038

Shenzhen CTB Testing Technology Co.,
Shenzhen, Guangdong, CN

Test Technology: Test Method(s) 1: RF Exposure EMF, MPE calculation Accessibility Common Charger Product Safety 3 47 CFR§1.1310; 47 CFR§1.1307; ANSI C95.1; IEEE Std. 1528; IEEE Std. C95.1; IEC/I

Intertek Testing Services NA
Kentwood, MI, US

Test Technology: Test Method(s): 1, 2 US / FCC (up to 40 GHz) CFR 47, FCC Part 15C (using ANSI C63.10-2013 or ANSI C63.10-2020); CFR 47, FCC Part 15E (using ANSI C63.10-2013 or ANSI C63.10-2020, without DFS testing)

SGS Germany
Puchheim, DE

Bereich Norm / Hausverfahren /Version Titel der Norm oder des Hausverfahrens (ggf. Abweichungen / Modifizierungen von Normverfahren angeben) Prüfbereich / Einschränkung EMV (EMF) DIN EN 62369-1:2010 (EN 62369-1:2009) Ermittlung de

cetecom advanced
Saarbrücken, DE

IEC 62369-1:2008); German version EN 62369-1:2009 ☐ ESS ☒ SB TC IEC 62369 -1:2008 Evaluation of human exposure to electromagnetic fields from short range devices (SRDs) in various applications over the frequency range 0 GHz to 300

Shenzhen Morlab Communications Technology
Shenzhen, CN

(A2LA Cert No. 4267.01) 7/15/2025 Page 8 of 13 Test Technology: Test Method(s)1: Radio Communications (Cont.) Article 2 Paragraph 1 of Item 11-21-2; Article 2 Paragraph 1 of Item 11-22; Article 2 Paragraph

Shenzhen UnionTrust Quality and Technology Co.,
Shenzhen,Guangdong, US

IEC 62369-1; EN 62369-1; BS EN 62369-1; IEC 62209-1; IEC 62209-2; IEC 62209-3; IEC/IEEE 62209-1528; EN IEC/IEEE 62209-1528; BS EN IEC/IEEE 62209-1528; EN 62209-1; EN 62209-2; BS EN 62209-1; BS EN 62209-2; Council Recommendation 1

Eurofins TA Technology (Shanghai) Co.,
Shanghai 201201, CN

(A2LA Certificate No. 3857.01) 11/13/2025 Page 6 of 9 Test Technology: Test Method(s)1,2: RF Exposure & Specific Absorption Rate (SAR) (Cont.) IEC 62311; EN 62311; EN 50664; EN 50665; IEC 62369; EN 62369; IEC 62479; EN 6247

TÜV NORD Hochfrequenztechnik GmbH & Co. KG
Köln, DE

Bereich Norm oder Prüfverfahren Titel der Norm oder des Prüfverfahrens Prüfbereich / Einschränkungen 1 Telekommunikation (TK) 1.1 Telekommunikation (TK) [Flex A] TK DIN EN 50364:2010 -11 Begren zun g der Ex po sit io n vo n P

SHENZHEN STS TEST SERVICES CO.,LTD.
Shenzhen, CN

Test Technology: Test Method(s): Radio Communication (Cont’d) ETSI TS 138 101-1/-2/-3/-4; 3GPP TS 38.101-1/-2/-3/-4; ETSI TS 138 113; 3GPP TS 38.113; ETSI TS 138 124; 3GPP TS 38.124; ETSI TS 138 521-1/-2/-3/-4; 3GPP TS 38.521-1/-2/-3/

TUV Rheinland (Shenzhen) Co.,
Shenzhen, CN

Test Technology: Test Method(s) 2: Zigbee Zigbee 3.0 Tests for BDB and Clusters using ZUTH; Zigbee IEEE 802.15.4 PHY/MAC Test; Zigbee PRO Compliant Platform Test Specific Absorption Rate (SAR) and RF Exposure (SAR: 600 MHz to 6