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Registers collected 2026-08-22.See collection dates
Japan

Denken Co., Ltd. EMC Test Lab.

2-202, Taisho-machi, Kariya-shi, Aichi-ken, 488-0855, Japan, Kariya-shi, Aichi-ken,, Japan

A2LA|6572.01ISO/IEC 17025Register collected 2026-08-22
Certificates
1
Scope items
3
Locations
1

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hideaki.ueki@dkn.co.jp
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Register record

A2LACollected
6572.01Active

Certificates and scope

1
A2LA

ISO/IEC 17025

Active

6572.01

View scope

Accredited scope, certificate 6572.01

DisciplineMethodMatrixRange
electricalIEC 62132-4; IEC 62132-4:2006; JASO D 019; JASO D 019:2021; JEITA ED-5008--
electrical---
electricalISO 10605; ISO 10605:(2001, 2008); ISO 11452-4; ISO 11452-4:(2005, 2011); CISPR 25; CISPR 25:2016; ISO 11452-2; ISO 11452-2:2019; ISO 7637-2; ISO 7637-2:2011; ISO 7637-3; ISO 7637-3:2016; ISO 16750-2; ISO 16750-2:2012, Sections 4.6.3 and 4.6.4; ISO 11452-8; ISO 11452-8:2015, Section 7.4; ISO 11452-9; ISO 11452-9:2012; IEC 61967-4; IEC 61967-4:2021; JASO D 019; JASO D 019:2021; JEITA ED-5008-80 to 4 MHz to GHz

Ranges are reproduced from the accredited scope document as published. An absent range means the register did not state one.

Location

2-202, Taisho-machi, Kariya-shi, Aichi-ken, 488-0855, Japan, Kariya-shi, Aichi-ken,, JP

34.97468, 137.00279

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Accreditation data collected from the A2LA register on .

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