Lexmark International
EMC Laboratory, 740 New Circle Road NW, Bldg. 032-2, 40511-1876, Lexington, KY, United States
- Accredited standards
- 7
- A2LA certificate
- 1
- Site in our directory
- 1
What this lab is accredited for
Our reading of the A2LA scope: each standard once, with its official name where we have checked it.
Only this lab. Searches the 7 standard numbers and the 7 official names we hold. When no standard matches, it searches the method text of every scope line.
ANSI C63.4American National Standard for Methods of Measurement of Radio-Noise Emissions from Low-Voltage Electrical and Electronic Equipment in the Range of 9 kHz to 40 GHz
CISPR 22Information technology equipment - Radio disturbance characteristics - Limits and methods of measurement
CISPR 32Electromagnetic compatibility of multimedia equipment - Emission requirements+2 national
National versions in the same scope
CNS 15936identical to it
VCCI-CISPR 32probably the same standard; matched by number only
FCC PART 15Radio Frequency Devices
ICES-001Industrial, Scientific and Medical (ISM) Equipment
IEC 61000-3-2Electromagnetic compatibility (EMC) - Part 3-2: Limits - Limits for harmonic current emissions (equipment input current ≤ 16 A per phase)
IEC 61000-3-3Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤ 16 A per phase and not subject to conditional connection
ANSI C63.4:2014; ANSI C63.10:2013; ANSI C63.10:2020
47 CFR, FCC Part 15, Subpart B (using ANSI C63.4:2014); ICES-001; ICES-003; VCCI-CISPR 32:2016 (up to 6 GHz); CNS 13438:2006 (up to 6 GHz); CNS 13438 (up to 6 GHz); CNS 15936:2016; CNS 15936; CISPR 22:2008; CISPR 22; EN 55022:2010; EN 55022; CISPR 32:2012; CISPR 32:2015; CISPR 32; EN 55032:2012; EN 55032:2015; EN 55032; GB/T 9254:2008; GB/T 9254; GB/T 9254.1-2021; GB/T 9254.1; SANS 2332:2017; SANS 2332; IEC 61000-3-2:2014; IEC 61000-3-2:2018; IEC 61000-3-2; EN 61000-3-2:2014; EN 61000-3-2:2019; EN 61000-3-2; GB 17625.1-2012; GB17625.1; SANS 61000-3-2:2009; SANS 61000-3-2; IEC 61000-3-3:2013; IEC 61000-3-3; EN 61000-3-3:2013; EN 61000-3-3; SANS 61000-3-3:2009; SANS 61000-3-3; ISO/IEC 17025:2017
Read from the A2LA scope document we downloaded on 2026-03-14. Register refreshed 2026-11-06.
Scope as published by A2LA
4 lines
ISO/IEC 17025
Active872.01
The scope document we hold says it is valid until 2027-12-31.
Accredited scope, certificate 872.01
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | 47 CFR, FCC Part 15, Subpart B (using ANSI C63.4:2014); ICES-001; ICES-003; VCCI-CISPR 32:2016 (up to 6 GHz); CNS 13438:2006 (up to 6 GHz); CNS 13438 (up to 6 GHz); CNS 15936:2016; CNS 15936; CISPR 22:2008; CISPR 22; EN 55022:2010; EN 55022; CISPR 32:2012; CISPR 32:2015; CISPR 32; EN 55032:2012; EN 55032:2015; EN 55032; GB/T 9254:2008; GB/T 9254; GB/T 9254.1-2021; GB/T 9254.1; SANS 2332:2017; SANS 2332; IEC 61000-3-2:2014; IEC 61000-3-2:2018; IEC 61000-3-2; EN 61000-3-2:2014; EN 61000-3-2:2019; EN 61000-3-2; GB 17625.1-2012; GB17625.1; SANS 61000-3-2:2009; SANS 61000-3-2; IEC 61000-3-3:2013; IEC 61000-3-3; EN 61000-3-3:2013; EN 61000-3-3; SANS 61000-3-3:2009; SANS 61000-3-3; ISO/IEC 17025:2017 | Information Technology Equipment | to 6 GHz |
| 2 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 0872.01) 11/10/2025 Page 2 of 3
Test Technology:
Test Method(s) 1:
Intentional Emissions
47 CFR, FCC Part 15, Subpart C (using ANSI C63.10:2013
and ANSI C63.10:2020);
RSS-GEN; RSS-210 (≤ 40 GHz); RSS-247 (without DFS);
ETSI 301 489-1 V2.2.0; ETSI 301 489-1 V2.2.3;
ETSI 301 489-1 V1.9.2; ETSI 301 489-1 V1.9.2;
ETSI 301 489-3 V2.1.1; ETSI EN 301 489-3 V2.1.1;
ETSI 301 489-17 V3.2.4; ETSI EN 301 489-17 V3.2.4;
ETSI 301 489-17 V2.2.1; ETSI EN 301 489-17 V2.2.1;
ETSI 301 489-1; ETSI 301 489-3; ETSI 301 489-17;
ETSI EN 301 489-1; ETSI EN 301 489-3; ETSI EN 301 489-17;
ETSI EN 300 330 V2.1.1; ETSI EN 300 330
Immunity
Electrostatic Discharge
(ESD)
IEC 61000-4-2:2008; IEC 61000-4-2;
EN 61000-4-2:2009; EN 61000-4-2;
SANS 61000-4-2:2009; SANS 61000-4-2
Radiated Immunity IEC 61000-4-3:2006; IEC 61000-4-3:2020; IEC 61000-4-3;
EN 61000-4-3:2006; EN 61000-4-3:2020; EN 61000-4-3;
SANS 61000-4-3:2008; SANS 61000-4-3
Burst IEC 61000-4-4:2004; IEC 61000-4-4:2012; IEC 61000-4-4;
EN 61000-4-4:2004; EN 61000-4-4:2012; EN 61000-4-4;
SANS 61000-4-4:2011; SANS 61000-4-4
Surge IEC 61000 4-5:2005; IEC 61000-4-5:2014; IEC 61000-4-5;
EN 61000-4-5:2006; EN 61000-4-5:2014; EN 61000-4-5;
SANS 61000-4-5:2006; SANS 61000-4-5
Conducted Immunity IEC 61000-4-6:2008; IEC 61000-4-6:2013; IEC 61000-4-6;
EN 61000-4-6:2009; EN 61000-4-6:2014; EN 61000-4-6;
SANS 61000-4-6:2017; SANS 61000-4-6
Magnetic Field IEC 61000-4-8:2009; IEC 61000-4-8;
EN 61000-4-8:2010; EN 61000-4-8;
SANS 61000-4-8:2009; SANS 61000-4-8
Voltage Dips and
Interruptions
IEC 61000-4-11:2004; IEC 61000-4-11:2020; IEC 61000-4-11;
EN 61000-4-11:2004; EN 61000-4-11:2020; EN 61000-4-11;
SANS 61000-4-11:2005; SANS 61000-4-11
Product Family Standards CISPR 35:2016; CISPR 35; EN 55035:2017; EN 55035;
CISPR 24:2010; CISPR 24; EN 55024:2010; EN 55024;
SANS 2335:2018; SANS 2335;
EN 60945:2002 Clause 9 [Section 9]; EN 60945 [Section 9];
IACS UR E10:2021 [Sections 19 & 20];
IACS UR E10 [Sections 19 & 20] | ||
| 3 | ANSI C63.4:2014; ANSI C63.10:2013; ANSI C63.10:2020 | - | to 40000 MHz |
| 4 | Extracted from the scope document; tables may not line up. View scope for the original. For the tests to which this accreditation applies, please refer to the laboratory’s Electrical Scope of Accreditation.
Accredited Laboratory
A2LA has accredited
LEXMARK INTERNATIONAL
Lexington, KY
for technical competence in the field of
Electrical Testing
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017
General requirements for the competence of testing and calibration laboratories. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).
Presented this 10th day of November 2025.
_______________________
Mr. Trace McInturff, Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 0872.01
Valid to December 31, 2027 | ||
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
EMC Laboratory, 740 New Circle Road NW, Bldg. 032-2, Lexington, KY, 40511-1876, US
38.04641, -84.49704
Open in MapsLabs with overlapping accredited scope in United States
- UL LLCNorthbrook, IL · ~535 kmA2LAShares 2 accredited test methodsANSI C63.4:2014ICES-001
- EUROFINS ELECTRICAL AND ELECTRONIC TESTING NAAustin, TX · ~1,492 kmA2LAShares 2 accredited test methodsANSI C63.4:2014ICES-001
- Intertek Testing Services NALake Forest, CA · ~3,015 kmA2LAShares 2 accredited test methodsANSI C63.4:2014ICES-001
- Intertek Testing Services NALexington, KY · under 1 kmA2LAShares 1 accredited test methodANSI C63.4:2014
- TUV SUD AmericaAlpharetta, GA · ~442 kmA2LAShares 1 accredited test methodANSI C63.4:2014
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.