Kimball Electronic
6801 University Blvd., Suite #4, 32792, Winter Park, FL, United States
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What this lab is accredited for
We found no published test standard numbers in this lab’s scope. The full scope as published is below.
Only this lab. Searches the method, matrix and range of each of the 8 scope lines.
A2LA certificate 2178.03 · 8 lines
| Line | Method | Matrix | Range |
|---|---|---|---|
| 1 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994 | - | See scope document |
| 2 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 2 of 7
Parameter/Equipment
Range CMC2, 4, 5 (±) Comments
DC Current – Generate
(0.3 to 3.29) mA
(3.3 to 32.9) mA
(33 to 329.9) mA
330 mA to 1 A
(1 to 10) A
0.013 % + 0.052 µA
0.010 % + 0.25 µA
0.010 % + 3.3 µA
0.031 % + 43 µA
0.069 % + 250 µA
Fluke 5500A
DC Current – Measure
(10 to 100) µA
100 µA to 1 mA
(1 to 10) mA
(10 to 100) mA
100 mA to 1 A
22 µA/A + 0.83 nA
18 µA/A + 0.017 µA
18 µA/A + 0.17 µA
28 µA/A + 2.3 µA
0.010 % + 44 µA
HP 3458A
Electrical Calibration of
Thermocouple Indicating
Equipment –
Type J
Type K
Type T
(-210 to -100)
oC
(-100 to -30) oC
(-30 to 150) oC
(150 to 760) oC
(-200 to -100) oC
(-100 to -25) oC
(-25 to 120) oC
(120 to 1000) oC
(1000 to 1372) oC
(-250 to -150) oC
(-150 to 0) oC
(0 to 120) oC
(120 to 400) oC
0.29
oC
0.19 oC
0.17 oC
0.20 oC
0.34 oC
0.21 oC
0.19 oC
0.28 oC
0.41 oC
0.64
oC
0.26 oC
0.19 oC
0.17 oC
Fluke 5500A
Resistance – Generate
(0 to 11) Ω
(11 to 33) Ω
(33 to 110) Ω
(110 to 330) Ω
(330 to 1100) Ω
(1.1 to 3.3) kΩ
(3.3 to 11) kΩ
(11 to 33) kΩ
(33 to 110) kΩ
(110 to 330) kΩ
(330 to 1100) kΩ
(1.1 to 3.3) MΩ
(3.3 to 11) MΩ
(11 to 33) MΩ
(33 to 110) MΩ
(110 to 330) MΩ
0.012 % + 8 mΩ
0.012 % + 15 mΩ
0.009 % + 15 mΩ
0.009 % + 15 mΩ
0.010 % + 56 mΩ
0.009 % + 60 mΩ
0.009 % + 600 mΩ
0.009 % + 600 mΩ
0.011 % + 6 Ω
0.012 % + 6 Ω
0.015 % + 55 Ω
0.015 % + 55 Ω
0.06 % + 540 Ω
0.10 % + 540 Ω
0.50 % + 5.1 kΩ
0.50 % + 16 kΩ
Fluke 5500A | ||
| 3 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 3 of 7
Parameter/Equipment
Range CMC2, 4, 5 (±) Comments
Resistance – Measure
(0 to 10) Ω
(10 to 100) Ω
(0.1 to 1) kΩ
(1 to 10) kΩ
(10 to 100) kΩ
(0.1 to 1) MΩ
(1 to 10) MΩ
(10 to 100) MΩ
0.0010 % + 0.6 mΩ
0.0011 % + 2.4 mΩ
0.0014 % + 5.0 mΩ
0.0018 % + 9.3 mΩ
0.0018 % + 93 mΩ
0.0023 % + 3.8 Ω
0.008 % + 97 Ω
0.10 % + 690 Ω
HP 3458A
Parameter/Range Frequency
CMC2, 4 (±)
Comments
AC Voltage – Generate
(1 to 33) mV
(33 to 330) mV
330 mV to 3.3 V
(3.3 to 33) V
(33 to 330) V
(330 to 1000) V
(10 to 45) Hz
45 Hz to 10 kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 500) kHz
(10 to 45) Hz
45 Hz to 10 kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 500) kHz
(10 to 45) Hz
45 Hz to 10 kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(10 to 45) Hz
45 Hz to 10 kHz
(10 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
45 Hz to 1 kHz
(1 to 10) kHz
(10 to 20) kHz
45 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
0.35 % + 20 µV
0.15 % + 20 µV
0.21 % + 20 µV
0.25 % + 20 µV
0.35 % + 33 µV
1.0 % + 60 µV
0.25 % + 50 µV
0.05 % + 21 µV
0.10 % + 20 µV
0.16 % + 40 µV
0.24 % + 170 µV
0.70 % + 330 µV
0.15 % + 250 µV
0.03 % + 60 µV
0.08 % + 60 µV
0.12 % + 300 µV
0.24 % + 1700 µV
0.15 % + 2600 µV
0.04 % + 580 µV
0.08 % + 2.6 mV
0.19 % + 5 mV
0.24 % + 17 mV
0.05 % + 6.5 mV
0.08 % + 15 mV
0.09 % + 33 mV
0.05 % + 69 mV
0.21 % + 76 mV
0.21 % + 470 mV
Fluke 5500A | ||
| 4 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 4 of 7
Parameter/Range Frequency
CMC2, 5 (±)
Comments
AC Voltage – Measure
(1 to 10) mV
(10 to 100) mV
100 mV to 1 V
(1 to 10) V
(10 to 100) V
(100 to 700) V
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
(100 to 300) kHz
(1 to 40) Hz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
40 Hz to 1 kHz
(1 to 20) kHz
(20 to 50) kHz
(50 to 100) kHz
40 Hz to 1 kHz
0.022 % + 4.5 µV
0.011 % + 3.2 µV
0.020 % + 3.1 µV
0.050 % + 9.3 µV
0.041 % + 11 µV
3.3 % + 75 µV
0.009 % + 4.7 µV
0.012 % + 2.8 µV
0.018 % + 2.8 µV
0.044 % + 5.9 µV
0.085 % + 4.9 µV
0.27 % + 50 µV
0.008 % + 39 µV
0.008 % + 21 µV
0.015 % + 21 µV
0.031 % + 32 µV
0.082 % + 25 µV
0.31 % + 0.1 mV
0.008 % + 0.39 mV
0.008 % + 0.19 mV
0.016 % + 0.19 mV
0.033 % + 0.19 mV
0.082 % + 0.21 mV
0.023 % + 1.8 mV
0.023 % + 1.8 mV
0.038 % + 1.9 mV
0.13 % + 1.6 mV
0.042 % + 20 mV
HP 3458A | ||
| 5 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 5 of 7
Parameter/Range Frequency
CMC2, 4 (±)
Comments
AC Current – Generate
(30 to 330) µA
(0.33 to 3.3) mA
(3.3 to 33) mA
(33 to 330) mA
(0.33 to 1) A
(1 to 10) A
(10 to 20) Hz
(20 to 45) Hz
45 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
(10 to 20) Hz
(20 to 45) Hz
45 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
(10 to 20) Hz
(20 to 45) Hz
45 Hz to 1 kHz
(1 to 5) kHz
(5 to 10) kHz
(10 to 20) Hz
(20 to 45) Hz
45 Hz to 1 kHz
(1 to 5) kHz
(10 to 45) Hz
45 Hz to 1 kHz
(1 to 5) kHz
(45 to 65) Hz
(65 to 500) Hz
500 Hz to 1 kHz
0.25 % + 0.15 µA
0.13 % + 0.15 µA
0.13 % + 0.25 µA
0.40 % + 0.15 µA
1.3 % + 0.15 µA
0.20 % + 0.3 µA
0.10 % + 0.3 µA
0.10 % + 0.3 µA
0.20 % + 0.3 µA
0.60 % + 0.3 µA
0.20 % + 3 µA
0.10 % + 3 µA
0.09 % + 3 µA
0.20 % + 3 µA
0.60 % + 3 µA
0.20 % + 30 µA
0.10 % + 30 µA
0.09 % + 30 µA
0.20 % + 30 µA
0.22 % + 0.25 mA
0.13 % + 0.21 mA
0.81 % + 0.10 mA
0.07 % + 2.1 mA
0.10 % + 2.1 mA
0.33 % + 2.1 mA
Fluke 5500A | ||
| 6 | - | -Show page textExtracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 6 of 7
Parameter/Range Frequency
CMC2, 5 (±)
Comments
AC Current – Measure
Up to 100 µA
100 µA to 1 mA
(1 to 10) mA
(10 to 100) mA
100 mA to 1A
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
(10 to 20) Hz
(20 to 45) Hz
(45 to 100) Hz
100 Hz to 5 kHz
0.40 % + 0.04 µA
0.15 % + 0.03 µA
0.06 % + 0.03 µA
0.06 % + 0.03 µA
0.41 % + 0.21 µA
0.15 % + 0.22 µA
0.06 % + 0.20 µA
0.03 % + 0.20 µA
0.40 % + 2 µA
0.15 % + 2 µA
0.06 % + 2 µA
0.03 % + 2 µA
0.40 % + 20 µA
0.15 % + 20 µA
0.06 % + 20 µA
0.03 % + 20 µA
0.40 % + 200 µA
0.16 % + 200 µA
0.08 % + 200 µA
0.10 % + 200 µA
HP 3458A
Parameter/Equipment Range
CMC2, 4 (±)
Comments
Capacitance – Generate
(0.5 to 1.1) nF
(1.1 to 3.3) nF
(3.3 to 11) nF
(11 to 33) nF
(33 to 110) nF
(110 to 330) nF
(0.33 to 1.1) µF
(1.1 to 3.3) µF
(3.3 to 11) µF
(11 to 33) µF
(33 to 110) µF
(110 to 330) µF
330 µF to 1.1 mF
0.45 % + 11 pF
0.51 % + 10 pF
0.50 % + 11 pF
0.26 % + 100 pF
0.26 % + 100 pF
0.26 % + 290 pF
0.23 % + 1.1 nF
0.36 % + 3 nF
0.36 % + 9.9 nF
0.41 % + 30 nF
0.79 % + 13 nF
0.67 % + 490 nF
1.0 % + 370 nF
Fluke 5500A | to 1 mF |
| 7 | Extracted from the scope document; tables may not line up. View scope for the original. (A2LA Cert. No. 2178.03) Revised 7/30/2025 Page 7 of 7
III. Mechanical
Parameter/Equipment
Range CMC2, 6 (±) Comments
Pressure Gauges &
Transducers
(0 to 400) psi
(400 to 4000) psi
(2000 to 15 000) psi
0.005 % + 0.14 psi
0.0022 % + 0.65 psi
0.11 % + 2.1 psi
Mensor
Crystal XP2I
Torque – Measuring
Equipment
(0 to 50) in·lbf
(30 to 400) in·lbf
(100 to 1000) in·lbf
(20 to 250) ft·lbf
(60 to 600) ft·lbf
0.17 % + 0.11 in·lbf
0.28 % + 0.17 in·lbf
0.31 % + 0.03 in·lbf
0.26 % + 0.16 ft·lbf
0.30 % + 0.10 ft·lbf
CDI 2000-400-02
CDI 2000-12-02
____________________________________________
1 This laboratory offers commercial calibration service.
2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration. Where ranges are not specified, the best measurement
uncertainty stated is for the cardinal points only.
3 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches.
4 The measurands stated are generated with the Fluke 5500A. This capability is suitable for the calibration
of the devices intended to measure the stated measurand in the ranges indicated. CMCs are expressed as
either a specific value that covers the full range or as a fraction of the reading plus a fixed floor
specification.
5 The measurands stated are measured with the HP 3458A. This capability is suitable for the calibration of
the devices intended to generate the measurand in the ranges indicated. CMCs are expressed as either a
specific value that covers the full range or as a combination of the fraction of the reading/output plus a
range specification.
6 In the statement of CMC, percentages are percentage of reading, unless otherwise indicated. | ||
| 8 | ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994 | - | - |
Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.
Location
Other Locations
2 other sites in this organization
Labs with overlapping accredited scope in United States
- LDS Vacuum ProductsLongwood, FL · ~11 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Applied Technical Services , LLC.Sanford, FL · ~23 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- TrescalMelbourne, FL · ~93 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- Trescal, Inc - Tampa, FLTampa, FL · ~130 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
- CIH Equipment CompanyClearwater, FL · ~157 kmA2LAShares 1 accredited test methodANSI/NCSL Z540-1-1994
Accreditation data refreshed from the A2LA register on .
This page mirrors a public register. For a purchasing, audit or regulatory decision, confirm against the A2LA entry linked above.