Contech Research
Rumford, RI, US
IEC 60512-22-1; USB 2.0, 3.0 Detection Parameters 1ns, 10 ns, 50ns, .1μs, 1 μs, 10μs Low Nanosecond Event Detection EIA 364 TP 87 Discontinuity Event Detection EIA 364 TP 46; MIL-STD-202, Method 310; IEC 60512-2-5; IEEE 1394;