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SIMCO Electronics - San Diego

San Diego, CA, United States

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A2LA 1395.06ISO/IEC 17025Register refreshed 2026-10-23

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A2LA certificate 1395.06 · 16 lines

LineMethodMatrixRange
1ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994-to 5 in
2--
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 2 of 15 Parameter/Equipment Range CMC2, 6 (±) Comments Pin, Plug Gages Up to 1 in (25 + 4.5L) µin Supermicrometer™, gage blocks Digital & Dial Indicators3 Up to 2 in Up to 1 in (7.2 + 10L) µin + 0.6R (33 + 4.5L) µin Gage blocks & surface plates Supermicrometer™ End Standards Up to 5 in (5 to 12) in (32 + 4.5L) µin (38 + 4.5L) µin Gage blocks, Supermicrometer™ Surface Plates3 – Flatness Repeatability Up to 180 in DL Up to 0.002 in (42 + 0.41DL) µin 49 µin Leveling system Repeat-o-meter Thread Plug Gages – Pitch Diameter Major Diameter (4 to 80) TPI (0.3 to 6) mm Up to 1 in Up to 25.4 mm (1 to 4) in (25.4 to 104) mm (65 + 7.4L) µin (1.7 + 0.0074L) µm (46 + 7.4L) µin (1.2 + 0.0074L) µm (54 + 7.4L) µin (1.4 + 0.0074L) µm Supermicrometer™, gage blocks & thread wires Protractors & Inclinometers³ Up to 180° 0.000 35° + 0.58R Surface plate, gage blocks & sine bar
to 180 °
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 3 of 15 II. Electrical – DC/Low Frequency Parameter/Equipment Range CMC2, 4, 5, 7, 8 (±) Comments DC Voltage – Generate3 (0 to 220) mV (0.22 to 2.2) V (2.2 to 11) V (11 to 22) V (22 to 220) V (220 to 1100) V 8 µV/V + 0.7 µV 7 µV/V + 1.6 µV 7 µV/V + 12 µV 7 µV/V + 13 µV 8 µV/V + 140 µV 9 µV/V + 1400 µV Fluke 5700A/EP, 5725A DC Voltage – Measure 3 ± (0 to 100) mV ± (0.1 to 1) V ± (1 to 10) V ± (10 to 100) V ± (100 to 1000) V* (1000 to 10 000) V (10 000 to 60 000) V 5.8 µV/V + 0.000 055 mV 4 µV/V + 0.000 14 mV 4 µV/V + 0.000 78 mV 6 µV/V + 0.018 mV 6 µV/V + 0.58 mV* 0.13 % 0.16 % Agilent 3458A OPT-2 *add 12(V in /1000)2 Parts in 106 to all Vin >100 Ross VD60-6.2-A- KB-AL & HP 34401A DC Current – Generate3 Clamp Meters to 1000 A (20 to 220) µA (0.22 to 2.2) mA (2.2 to 22) mA (22 to 220) mA (0.22 to 2.2) A (2.2 to 11) A (11 to 20.5) A (10 to 100) A (20.5 to 1000) A 50 µA/A + 8.2 nA 50 µA/A + 43 nA 50 µA/A + 420 nA 60 µA/A + 4.4 µA 80 µA/A + 74 µA 0.036 % + 530 µA 0.078 % + 590 µA 0.06 % 0.51 % + 0.75 A Fluke 5700A/EP, 5725A Fluke 5520A/SC1100 L&N 4361 & Agilent 3458A Fluke 5500A/coil & 5520A/SC1100
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 4 of 15 Parameter/Equipment Range CMC2, 5, 7, 8 (±) Comments DC Current – Measure3 (0 to 100) nA (0.1 to 1) µA (1 to 10) µA (10 to 100) µA (0.1 to 1) mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A (1 to 10) A (10 to 100) A 30 µA/A + 70 pA 20 µA/A + 70 pA 20 µA/A + 120 pA 20 µA/A + 0.8 µA 20 µA/A + 5 nA 20 µA/A + 50 nA 35 µA/A + 0.5 µA 110 µA/A + 10 µA 0.05 % 0.07 % Agilent 3458A OPT-2 Valhalla 2575A & Agilent 3458A OPT-2 Resistance – Measure3 (0 to 10) Ω (10 to 100) Ω (0.1 to 1) kΩ (1 to 10) kΩ (10 to 100) kΩ (0.1 to 1) MΩ (1 to 10) MΩ (10 to 100) MΩ (0.1 to 1.0) GΩ 15 µΩ/Ω + 52 µΩ 12 µΩ/Ω + 0.51 mΩ 10 µΩ/Ω + 0.56 mΩ 10 µΩ/Ω + 5.8 mΩ 10 µΩ/Ω + 62 mΩ 15 µΩ/Ω + 2.2 Ω 50 µΩ/Ω + 100 Ω 0.05 % + 1.4 kΩ 0.50 % + 11 kΩ Agilent 3458A OPT-2 Resistance – Generate3, Fixed Points 0 Ω 1 Ω 1.9 Ω 10 Ω 19 Ω 100 Ω 190 Ω 1 kΩ 1.9 kΩ 10 kΩ 19 kΩ 100 kΩ 190 kΩ 1 MΩ 1.9 MΩ 10 MΩ 19 MΩ 100 MΩ 51 µΩ 95 µΩ/Ω + 12 µΩ 95 µΩ/Ω + 20 µΩ 28 µΩ/Ω + 43 µΩ 27 µΩ/Ω + 80 µΩ 17 µΩ/Ω + 290 µΩ 17 µΩ/Ω + 560 µΩ 13 µΩ/Ω + 2300 µΩ 13 µΩ/Ω + 4500 µΩ 12 µΩ/Ω + 36 000 µΩ 12 µΩ/Ω + 43 mΩ 14 µΩ/Ω + 640 mΩ 14 µΩ/Ω + 1200 mΩ 20 µΩ/Ω + 6200 mΩ 21 µΩ/Ω + 12 000 mΩ 40 µΩ/Ω + 190 000 mΩ 47 µΩ/Ω + 360 Ω 0.011 % + 2200 Ω Fluke 5700A/EP
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 5 of 15 Parameter/Equipment Range CMC2, 4, 8 (±) Comments Resistance – Generate3 (0 to 11) Ω (11 to 33) Ω (33 to 110) Ω (110 to 330) Ω (0.33 to 1.1) kΩ (1.1 to 3.3) kΩ (3.3 to 11) kΩ (11 to 33) kΩ (33 to 110) kΩ (110 to 330) kΩ (0.33 to 1.1) MΩ (1.1 to 3.3) MΩ (3.3 to 11) MΩ (11 to 33) MΩ (33 to 110) MΩ (110 to 330) MΩ (0.33 to 1.1) GΩ 31 µΩ/Ω + 1.1 mΩ 23 µΩ/Ω + 1.9 mΩ 22 µΩ/Ω + 2.2 mΩ 22 µΩ/Ω + 4.1 mΩ 22 µΩ/Ω + 18 mΩ 22 µΩ/Ω + 44 mΩ 22 µΩ/Ω + 140 mΩ 22 µΩ/Ω + 430 mΩ 22 µΩ/Ω + 1300 mΩ 25 µΩ/Ω + 7.7 Ω 25 µΩ/Ω + 22 Ω 47 µΩ/Ω + 140 Ω 0.01 % + 770 Ω 0.019 % + 3.7 kΩ 0.039 % + 35 kΩ 0.23 % + 80 kΩ 1.2 % + 2600 kΩ Fluke 5520A/SC1100 Electrical Simulation of Thermocouples Indicating Devices – Generate & Measure 3 Type E Type J Type K Type T (-250 to -100) °C (-100 to -25) °C (-25 to 350) °C (350 to 650) °C (650 to 1000) °C (-210 to -100) °C (-100 to -30) °C (-30 to 150) °C (150 to 760) °C (760 to 1200) °C (-200 to -100) °C (-100 to -25) °C (-25 to 120) °C (120 to 1000) °C (1000 to 1372) °C (-250 to -150) °C (-150 to 0) °C (0 to 120) °C (120 to 400) °C 0.39 °C 0.14 °C 0.12 °C 0.14 °C 0.17 °C 0.22 °C 0.14 °C 0.12 °C 0.14 °C 0.19 °C 0.27 °C 0.16 °C 0.14 °C 0.21 °C 0.32 °C 0.50 °C 0.20 °C 0.14 °C 0.12 °C Fluke 5520A/SC1100
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 6 of 15 Parameter/Equipment Range CMC2, 4 (±) Comments Electrical Simulation of RTD3 – Pt 385, 100 Ω (-200 to -80) °C (-80 to 0) °C (0 to 100) °C (100 to 300) °C (300 to 400) °C (400 to 630) °C (630 to 800) °C 0.13 °C 0.10 °C 0.13 °C 0.11 °C 0.15 °C 0.15 °C 0.25 °C Fluke 5520A/SC1100 Oscilloscopes3 – Leveled Sine Wave: 5 mV to 5.5 V(p-p) Leveled Sine Flatness: 5 mV to 5.5 V(p-p) Relative to 50 kHz Reference DC Signal: 50 Ω, (0.01 to 10) kHz 1 MΩ, (0.01 to 10) kHz Square Wave Signal: 50 Ω, (0.01 to 10) kHz 1 MΩ, (1 to 10) kHz Time Marker Output: Into 50 Ω Pulse Rise Time – Generate: Rep Rate: 1 kHz to 10 MHz 50 kHz reference (0.05 to 100) MHz (100 to 300) MHz (300 to 600) MHz (600 to 1100) MHz (1 to 24.999) mV (25 to 109.99) mV 110 mV to 2.1999 V (2.2 to 10.999) V (1 to 24.999) mV (25 to 109.99) mV 110 mV to 2.1999 V (2.2 to 10.999) V (11 to 130) V 1 mV to 6.599 V(p-p) 1 mV to 130 V(p-p) 2 ns to 20 ms 50 ms to 5 s <350 ps 1.8 % + 250 µV 1.8 % + 110 µV 2 % + 110 µV 3.4 % + 110 µV 4.1 % + 110 µV 0.049 mV + 40 µV 0.21 mV + 40 µV 0.0043 V + 40 µV 0.021 V to 40 µV 0.015 mV + 40 µV 0.047 mV + 40 µV 0.000 89 V + 40 µV 0.0046 V + 40 µV 0.052 V + 40 µV 0.19 % + 40 µV 0.078 % + 40 µV 11 x 10 6 s 120 x 106 s 85 ps Fluke 5520A/SC1100, See RF power/flatness – generate for oscilloscopes above 1 GHz
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 7 of 15 Parameter/Range Frequency CMC2, 4, 5, 7, 8 (±) Comments AC Current – Measure3 (10 to 100) µA (0.1 to 1) mA (1 to 10) mA (10 to 100) mA (0.1 to 1) A (1 to 2) A (>2 to 100) A 45 Hz to 1 kHz (45 to 100) Hz (0.1 to 5) kHz (45 to 100) Hz (0.1 to 5) kHz (45 to 100) Hz (0.1 to 5) kHz (45 to 100) Hz (0.1 to 5) kHz (0.4 to 1) kHz (0.4 to 1) kHz 0.069 % + 0.035 µA 0.069 % + 230 nA 0.035 % + 230 nA 0.069 % + 2.3 µA 0.035 % + 2.3 µA 0.069 % + 23 µA 0.035 % + 23 µA 0.092 % + 240 µA 0.12 % + 240 µA 0.042 % 0.12 % Agilent 3458A OPT-2 Valhalla Scientific 2575A & Agilent 3458A AC Current – Generate3 (0.22 to 2.2) mA (2.2 to 22) mA (22 to 220) mA (0.22 to 2.2) A (2.2 to 11) A (33 to 330) µA (11 to 20.5) A (10 to 100) A (>40 to 1000) Hz (1 to 5) kHz (>40 to 1000) Hz (1 to 5) kHz (>40 to 1000) Hz (1 to 5) kHz (>40 to 1000) Hz (1 to 5) kHz (>40 to 1000) Hz (1 to 5) kHz (5 to 10) kHz (>45 to 1000) Hz (1 to 5) kHz (>0.1 to 1) kHz (1 to 5) kHz (10 to 60) Hz 0.014 % + 53 nA 0.06 % + 400 nA 0.014 % + 810 nA 0.06 % + 4100 nA 0.014 % + 7.9 µA 0.06 % + 41 µA 0.065 % + 87 µA 0.075 % + 110 µA 0.046 % + 710 µA 0.095 % + 780 µA 0.36 % + 1000 µA 0.099 % + 0.078 µA 0.23 % + 0.12 µA 0.12 % + 3.9 mA 2.3 % + 3.9 mA 0.12 % Fluke 5700A/EP, 5725A Fluke 5520A/SC1100 LCOMP OFF Valhalla 2575A, Agilent 3458A
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 8 of 15 Parameter/Range Frequency CMC2, 5, 7 (±) Comments AC Current – Generate3 (cont) Clamp Meters to 1000 A (20.5 to 1000) A (45 to 400) Hz 1.5 % + 0.36 A Fluke 5500A/coil & 5520A/SC1100 LCOMP OFF AC Voltage – Generate3 (0.22 to 2.2) mV (2.2 to 22) mV (22 to 220) mV (0.22 to 2.2) V (2.2 to 22) V (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz (0.5 to 1) MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz (0.5 to 1) MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz (0.5 to 1) MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (300 to 500) kHz (0.5 to 1) MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz 0.055 % + 5 µV 0.021 % + 5 µV 0.011 % + 5 µV 0.037 % + 5.4 µV 0.085 % + 8 µV 0.11 % + 15 µV 0.17 % + 27 µv 0.34 % + 28 µV 0.055 % + 8 µV 0.021 % + 7 µV 0.011 % + 12 µV 0.037 % + 12 µV 0.085 % + 11 µV 0.11 % + 20 µV 0.17 % + 32 µV 0.34 % + 42 µV 0.055 % + 21 µV 0.021 % + 18 µV 0.011 % + 11 µV 0.032 % + 17 µV 0.085 % + 41 µV 0.11 % + 55 µV 0.17 % + 78 µV 0.34 % + 190 µV 0.05 % + 140 µV 0.016 % + 49 µV 0.0075 % + 42 µV 0.012 % + 78 µV 0.025 % + 130 µV 0.043 % + 330 µV 0.11 % + 560 µV 0.22 % + 1700 µV 0.05 % + 1.4 mV 0.016 % + 0.54 mV 0.0075 % + 0.48 mV 0.012 % + 0.8 mV 0.025 % + 1.3 mV 0.05 % + 3.7 mV Fluke 5700A/EP & 5725A
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 9 of 15 Parameter/Range Frequency CMC2, 5, 7 (±) Comments AC Voltage – Generate3 (cont) (2.2 to 22) V (22 to 220) V (220 to 1100) V (250 to 750) V (300 to 500) kHz (0.5 to 1) MHz (10 to 20) Hz (20 to 40) Hz 40 Hz to 20 kHz (20 to 50) kHz (50 to 100) kHz (15 to 50) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 30) kHz (30 to 50) kHz (50 to 100) kHz 0.13 % + 7.7 mV 0.27 % + 21 mV 0.05 % + 14 mV 0.016 % + 6.5 mV 0.008 % + 6.1 mV* 0.022 % + 12 mV 0.05 % + 18 mV 0.04 % + 42 mV 0.008 % + 39 mV 0.017 % + 12 mV 0.06 % + 16 mV 0.06 % + 42 mV 0.23 % + 100 mV Fluke 5700A/EP & 5725A *Subject to 2.2 x 107 V Hz limitation AC Voltage – Measure3 (1 to 10) mV (10 to 100) mV (0.1 to 1) V (1 to 10) V (1 to 40) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (1 to 40) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (0.3 to 1) MHz (1 to 40) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (0.3 to 1) MHz (1 to 40) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (100 to 300) kHz (0.3 to 1) MHz 0.035 % + 3.5 µV 0.023 % + 1.3 µV 0.035 % + 1.3 µV 0.12 % + 1.3 µV 0.58 % + 1.3 µV 4.6 % + 2.3 µV 0.0081 % + 5.2 µV 0.0081 % + 3.3 µV 0.016 % + 3.2 µV 0.035 % + 3.2 µV 0.092 % + 3.2 µV 0.35 % + 12 µV 1.2 % + 13 µV 0.0081 % + 48 µV 0.0081 % + 26 µV 0.016 % + 24 µV 0.035 % + 28 µV 0.092 % + 30 µV 0.35 % + 120 µV 1.2 % + 280 µV 0.0081 % + 0.50 mV 0.0081 % + 0.27 mV 0.016 % + 0.27 mV 0.035 % + 0.31 mV 0.092 % + 0.32 mV 0.35 % + 1.2 mV 1.2 % + 3.1 mV Agilent 3458A OPT-2
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 10 of 15 Parameter/Range Frequency CMC2, 5, 8 (±) Comments AC Voltage – Measure3 (cont) (10 to 100) V (100 to 700) V (700 to 10 000) V (10 000 to 42 000) V (1 to 40) Hz (40 to 1000) Hz (1 to 20) kHz (20 to 50) kHz (50 to 100) kHz (1 to 40) Hz (0.04 to 20) kHz (50 to 60) Hz (50 to 60) Hz 0.023 % + 4.8 mV 0.023 % + 2.7 mV 0.023 % + 2.8 mV 0.04 % + 3.1 mV 0.14 % + 3.7 mV 0.046 % + 48 mV 0.069 % + 27 mV 0.60 % 0.62 % Agilent 3458A OPT-2 Ross VD60-6.2-A- KB-AL & HP 34401A Capacitance – Generate3 2-Wire (0.19 to <3.3) nF (3.3 to <11) nF (11 to 110) nF (110 to <330) nF (0.33 to <1.1) µF (1.1 to <3.3) µF (3.3 to <11) µF (11 to <33) µF (33 to <110) µF (110 to <330) µF (0.33 to <1.1) mF (1.1 to <3.3) mF (3.3 to <11) mF (11 to <33) mF (33 to <110) mF (0.01 to 10) kHz (0.01 to 1) kHz (0.01 to 1) kHz (0.01 to 1) kHz (10 to 600) kHz (10 to 300) kHz (10 to 150) Hz (10 to 120) Hz (10 to 80) Hz (10 to 50) Hz (0 to 20) Hz (0 to 6) Hz (0 to 2) Hz (0 to 0.6) Hz (0 to 0.2) Hz 0.58 % + 13 pF 0.29 % + 13 pF 0.29 % + 150 pF 0.29 % + 510 pF 0.29 % + 1.2 nF 0.29 % + 6.8 nF 0.29 % + 13 nF 0.46 % + 55 nF 0.52 % + 130 nF 0.52 % + 350 nF 0.52 % + 1.2 µF 0.52 % + 3.5 µF 0.52 % + 12 µF 0.87 % + 35 µF 1.3 % + 120 µF Fluke 5520A/ SC1100
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 11 of 15 III. Electrical – RF/Microwave Parameter/Range Frequency CMC2, 10 (±) Comments RF Power3 – Generate (+20 to -100) dBm (<-100 to -127) dBm 9 kHz to 3200 MHz (>3200 to 4000) MHz (9 to <100) kHz (0.1 to 2500) MHz (>2500 to 4000) MHz 1.2 dB 2.3 dB 3.5 dB 1.2 dB 3.5 dB HP 8648D OPT-1E2, 1E5, 1EA HP 8648D OPT-1E2, 1E5, 1EA RF Power/Flatness3 – Generate (+20 to -20) dBm (100 to 300) kHz (0.3 to 1) MHz (0.001 to 4.2) GHz 0.2 dB 0.19 dB 0.19 dB HP 8648D, 11667B, 8482A & E4419B RF Power3 – Measure (+20 to -20) dBm (100 to 300) kHz (0.3 to 1) MHz (0.001 to 4.2) GHz 0.083 dB 0.068 dB 0.067 dB HP 8482A & E4419B Distortion3 – Measure ≤ -80 dB ≤ -65 dB 20 Hz to 20 kHz (20 to 100) kHz 1.2 dB 2.3 dB HP 8903B IV. Mechanical Parameter/Equipment Range CMC2, 6, 8 (±) Comments Scales & Balances3 (1 to 50) mg 2 g 20 g 50 g 100 g (0.2 to 10) kg (10 to 20) kg (20 to 35) kg Up to 500 lb 0.0059 mg + 0.58R 0.04 mg + 0.58R 0.052 mg + 0.58R 0.086 mg + 0.58R 0.15 mg + 0.58R 0.000 29 % + 0.58R 83 mg + 0.58R 88 mg + 0.58R 0.18 % + 0.58R Ultra Class weights Class 1 weights Class F weights
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 12 of 15 Parameter/Equipment Range CMC2, 6, 8, 10 (±) Comments Torque Wrenches & Screwdrivers3 – Measure (5 to 50) ozfꞏin (1 to 10) lbfꞏin (10 to 50) lbfꞏin (50 to 250) lbfꞏin (15 to 150) lbfꞏft (150 to 1000) lbfꞏft 0.75 % + 0.58R 0.6 % + 0.58R 0.65 % + 0.58R 0.68 % + 0.58R 0.67 % + 0.58R 0.64 % + 0.58R AWS torque system Torque Transducers & Analyzers – Measuring Equipment3 (0 to 250) lbf∙in 0.11 % + 0.58R Class F weights & torque wheels Force3 – Measuring Equipment, Tension & Compression (0 to 300) lbf 0.031 % + 0.58R Class F weights Pressure & Vacuum3 – Measuring Equipment (0.9 to 3.16) psia (3.16 to 7.53) psia (7.53 to 23) psia (23 to 97) psia (97 to 300) psia (-14.7 to -12.3) psig (-12.3 to -7.9) psig (-7.9 to 8) psig (8 to 86.7) psig (86.7 to 300) psig (300 to 1000) psig (1000 to 10 000) psig (2 to 10 000) psi 0.000 38 psia + 0.58R 0.011 % + 0.58R 0.012 % + 0.58R 0.01 psia + 0.58R 0.011 % + 0.58R 0.001 psig + 0.58R 0.011 % + 0.58R 0.012 % + 0.58R 0.01 psig + 0.58R 0.012 % + 0.58R 1.2 psig + 0.58R 6.3 psig + 0.58R 0.039 % + 0.58R Fluke PPC4 Druck DPI705 Pressurements M2200-3-P Pipettes (2 to 10) µL (10 to 100) µL (100 to 500) µL (500 to 1000) µL (1000 to 5000) µL 0.099 µL 0.37 µL 0.55 µL 1.6 µL 2 µL Gravimetric calibration using A&D AD-4212B-PT & Mettler AT200
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 13 of 15 V. Thermodynamic Parameter/Equipment Range CMC2, 6, 10 (±) Comments Temperature – Measuring Equipment3 (-70 to 100) oC (100 to 175) oC (-5 to 100) oC (100 to 125) oC (-15 to 350) oC 0.028 oC + 0.58R 0.026 oC + 0.58R 0.035 oC + 0.58R 0.068 oC + 0.58R 0.12 oC + 0.58R Hart Scientific 1502A, 5628 w/ environmental chamber Hart Scientific 1502A, 5628 w/ oil bath Hart Scientific 1502A, 5628 w/ drywell Temperature – Measure3 (-196 to 0) oC (0 to 100) oC (100 to 500) oC 0.025 oC 0.013 oC 0.024 oC Hart Scientific 1502A, 5628 Relative Humidity – Measuring Equipment 3 (10 to 76) % RH (0 to 40) oC 1.9 % RH Vaisala HM40/HM46 w/ humidity chamber Relative Humidity – Measure3 (10 to 90) % RH (90 to 95) % RH 1.9 % RH 3.0 % RH Vaisala HM40/HM46 VI. Time & Frequency Parameter/Equipment Range CMC2, 6, 10 (±) Comments Timers & Stopwatches3 Up to 86 400 s Totalize Stopwatch to Stopwatch (0 to 19.99) s/day 64 ms 84 ms 0.038 s/day HP 53132A, HP 33220A phase locked to GPS Stopwatch comparison Timometer Frequency Reference 10 MHz 1.5 pHz/Hz + 0.58R Fluke 910R GPS Frequency – Measuring Equipment3 0.01 Hz to 600 MHz 9 kHz to 4 GHz 1.5 pHz/Hz + 0.58R 30 pHz/Hz + 0.58R Fluke 910R GPS & HP 53132A HP 8648D phase locked to GPS
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(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 14 of 15 Parameter/Equipment Range CMC2, 6, 8,. 10 (±) Comments Frequency3 – Measure 0.1 Hz to 3 GHz 1.5 pHz/Hz + 0.58R Fluke 910R GPS & HP 53132A RPM – Measure (0 to 100 000) rpm 0.012 % + 0.58R Monarch PLT200 Tachometers (10 to 200 000) rpm 1.9 µrpm/rpm + 0.58R HP 33220A phase locked to GPS ________________________________________________________________ 1 This laboratory offers commercial calibration service and field calibration service. 2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement that a laboratory can achieve within its scope of accreditation when performing more or less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device and to influences from the circumstances of the specific calibration. 3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA Scope. Allowance must be made for aspects su ch as the environment at the place of calibration and for other possible adverse effects such as those caused by transportation of the calibration equipment. The usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must also be considered and this, on its own, could result in the actual measurement uncertainty achievable on a customer’s site being larger than the CMC. 4 Based on using the standard at the temperature the Fluke 5520A with SC1100 was calibrated (tcal ± 5 oC) and assuming the instrument is zeroed at least every seven days or when the ambient temperature changes more than 5 oC. For resistance, a zero calibration is performed at least every 12 hours within ± 1 oC of use. For AC Current, CMC are determined with LCOMP Off. CMC is based upon 1-year specifications and is read as ppm (parts per million) or percent output plus floor specification where defined. 5 Based on using the standard at the temperature the Agilent 3458A was calibrated (tcal ± 5 oC) and an auto- calibration (ACAL) was performed within the previous 24 hours (± 1 oC of ambient temperature). CMC is based upon 1- year specifications and is read as ppm (parts per million) or percent output plus floor specification where defined. 6 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches; R is the numerical value of the resolution of the device , DL is the diagonal length of the surface plate measured in inches. 7 Based on using the Fluke 5700A/5725A within 5 oC of the temperature noted at the time of cal (tcal ± 5 oC) and assuming the zero calibrat ion is performed every 30 days. CMC is based upon 1- year specifications and is read as ppm (parts per million, µV/V) or percent of output plus floor specification where defined. Includes stability. Resistance specifications apply only to the displayed resistance value using 4-wire configuration (except for 100 MΩ). Uncertainty specifications for 220 mA and 2.2 mA ranges are increased by a factor of 1.3 when supplied through 5725A terminals.
15

Extracted from the scope document; tables may not line up. View scope for the original.

(A2LA Cert. No. 1395.06) Revised 04/16/2025 Page 15 of 15 8 When percent (%) is present in the statement of CMC; the value is defined as the percentage of reading unless otherwise noted. 9 This scope meets A2LA’s P112 Flexible Scope Policy. 10 The type of instrument or material being calibrated is defined by the parameter. This indicates the laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated for the listed measurement parameter.
16ISO/IEC 17025:2017; ANSI/NCSL Z540-1-1994--

Ranges are reproduced from the accredited scope document as published, and only where we found that range printed in the document for the line. Otherwise the cell reads “See scope document”. An absent range means the register did not state one. Line numbers are ours, for cross-reference; they follow the order of the scope document.

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