1 laboratory in United States is accredited by A2LA under ISO/IEC 17025 to perform IEC 60079-10-1 testing. From the accredited scope text: “IEC 60079-10-1 Semiconductor and other high technology fabrication equipment – semiconductor, solar, disk drive, and related industries NFPA 790, NFPA 791; SEMI S2, SEMI S6, SEMI S8, SEMI S22; IEC 602”
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See all accredited labs in United States or browse other methods such as ANSI/NCSL Z540-1-1994, ASTM E18, ASTM E10.
See all 3 labs in United States for IEC 60079 (any part)
Part 10-1: 1 lab · Part 25: 1 lab · Part 29-1: 1 lab · Part 29-4: 1 lab · Part 31: 1 lab
This page is a fixed slice of the register: every IEC 60079-10-1 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.