3 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 60079 testing. From the accredited scope text: “IEC 60079-10-1 Semiconductor and other high technology fabrication equipment – semiconductor, solar, disk drive, and related industries NFPA 790, NFPA 791; SEMI S2, SEMI S6, SEMI S8, SEMI S22; IEC 602” “IEC 60079-29-1, Section 5.4.13; IEC 60079-29-4, Section 5.4.8; ASTM D4728; ASTM D999; MIL-STD-167; GR-326-CORE; GR-3120-CORE; GR-3121-CORE; GR-3123-CORE; GR-3125-CORE Acceleration1 Range: (0 to 110) G”
Minneapolis, MN, US
IEC 60079-29-1, Section 5.4.13; IEC 60079-29-4, Section 5.4.8; ASTM D4728; ASTM D999; MIL-STD-167; GR-326-CORE; GR-3120-CORE; GR-3121-CORE; GR-3123-CORE; GR-3125-CORE Acceleration1 Range: (0 to 110) Gs MIL-STD-810, Metho
Plano, TX, US
(A2LA Certificate No. 0591.10) 12/10/2025 Page 3 of 3 Test Technology: Test Method(s) 1: Ordinary Locations (continued) UL 50 Ed.14 (excluding 8.10 [crushing test]); CSA C22.2 No. 94.1 Ed.3 (excluding 8.10 [crushing test]);
SANTA CLARA, CA, US
IEC 60079-10-1 Semiconductor and other high technology fabrication equipment – semiconductor, solar, disk drive, and related industries NFPA 790, NFPA 791; SEMI S2, SEMI S6, SEMI S8, SEMI S22; IEC 60204-33; EN 60204-33; ISO 12100
This page is a fixed slice of the register: every IEC 60079 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.