13 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 61000-4-12 testing. From the accredited scope text: “IEC 61000-4-12, Ed. 2 (2006-09); EN 61000-4-12:2006; IEC 61000-4-12; EN 61000-4-12; KN 61000-4-12; IEEE STD C62.41.2 2002 Electrical Measurements and Simulation AC Voltage / Current (1mV to 5kV) 60 Hz” “IEC 61000-4-12; BS EN IEC 61000-4-12 Conducted Immunity EN 61000-4-6; BS 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity EN 61000-4-8; BS 61000-4-8; IEC 61000-4-8; KS C” “IEC 61000-4-12 Immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz EN 61000-4-16; IEC 61000-4-16 (excluding test levels above 30V) Ripple on D.C. Input Power Port Im” “IEC 61000-4-12; SANS 61000-4-12 Radiated Fields in Close Proximity IEC 61000-4-39 Generic / Product Specific EMC Standards CISPR 24; EN 55024; CISPR 35: EN 55035; SANS 2335; KS C 9835:2019; ISO 11451-”
Lincoln, NE, US
IEC 61000-4-12 Radio Frequency Conducted (0 Hz to 150 kHz, 10Vrms) IEC 61000-4-16 Radio Frequency, Radiated with Stripline (80 MHz to 400 MHz, 200V/m) ISO 11452-5 Transmitters and Receivers (Up to 220 GHz) Unlicensed Transm
Knoxville, TN, US
IEC 61000-4-12:1995, 2006, 2017; IEC 61000-4-12 On the following products or types of products: Instrumentation and Controls (I&C) equipment, including Industrial, Scientific, and Medical (ISM) and Information Technology Equipment (IT
Shenzhen, US
IEC 61000-4-12 Harmonics and Inter-harmonics BS EN 61000-4-13; EN 61000-4-13; IEC 61000-4-13 Voltage Fluctuations BS EN 61000-4-14; EN 61000-4-14; IEC 61000-4-14 Voltage Frequency Variations BS EN 61000-4-28; EN 61000-4-28; IEC
San Diego, CA, US
Parameter/Equipment Range CMC2, 4, 6 () Comments Transient Generators – Front/Rise Time – Open Circuit Short Circuit Fall Time Open Circuit Short Circuit Pulse Width – Open Circuit Pulse Width- Short Circ
Novi, MI, US
IEC 61000-4-12; EN 61000-4-12; KS C IEC 61000-4-12 IEC 61000-4-6; EN 61000-4-6; KS C IEC 61000-4-6 IEC 61000-4-8; EN 61000-4-8; KS C IEC 61000-4-8 EN 61000-4-9; IEC 61000-4-9; KS C IEC 61000-4-9 IEC 61000-4-11; EN 61000-4-
Fremont, CA, US
IEC 61000-4-12 Immunity to conducted, common mode disturbances in the frequency range 0 Hz to 150 kHz EN 61000-4-16; IEC 61000-4-16 (excluding test levels above 30V) Ripple on D.C. Input Power Port Immunity EN 61000-4-17; IEC 6
Kentwood, MI, US
IEC 61000-4-12; EN 61000-4-12 Interharmonics IEC 61000-4-13; EN 61000-4-13 Generic & Product Specific EMC Standards Laboratory IEC/EN 61326-1 (Ed. 2; Ed. 3); IEC/EN 61326-2-1 (Ed. 2; Ed. 3); IEC/EN 61326-2-2 (Ed. 2; Ed. 3);
Middlefield, OH, US
IEC 61000-4-12; BS EN IEC 61000-4-12 Conducted Immunity EN 61000-4-6; BS 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity EN 61000-4-8; BS 61000-4-8; IEC 61000-4-8; KS C 9610-4-8 Voltage Dips, Sho
San Jose, CA, US
IEC 61000-4-12, IEC 61000-4-18 w/ Tektronix TDS7104, Schaffner MD-200A high voltage probe, Pearson 110 current coil Harmonic & Flicker Measure 3 – Voltage Current Perceptibility (Short-Term) (10
Pleasanton, CA, US
IEC 61000-4-12; SANS 61000-4-12 Radiated Fields in Close Proximity IEC 61000-4-39 Generic / Product Specific EMC Standards CISPR 24; EN 55024; CISPR 35: EN 55035; SANS 2335; KS C 9835:2019; ISO 11451-4; EN/IEC 12895;
Downers Grove, IL, US
IEC 61000-4-12, Ed. 2 (2006-09); EN 61000-4-12:2006; IEC 61000-4-12; EN 61000-4-12; KN 61000-4-12; IEEE STD C62.41.2 2002 Electrical Measurements and Simulation AC Voltage / Current (1mV to 5kV) 60 Hz (0.1V to 250V) up to 500 MHz
Boxborough, MA, US
Tests: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC/EN 61000-4-2; KS C 9610-4-2; RTCA/DO-1602 D, E, F, & G (Section 25); MIL-STD-1686; MIL-STD-461G (CS118) Radiated Immunity IEC/EN 61000-4-3; KS C 9610-4-3; RT
San Diego, CA, US
IEC 61000-4-12; SANS 61000-4-12 Harmonics and Interharmonics EN 61000-4-13; IEC 61000-4-13; SANS 61000-4-13 Voltage Fluctuation Immunity EN 61000-4-14; IEC 61000-4-14; SANS 61000-4-14 Common Mode Disturbance – Conducted Imm
This page is a fixed slice of the register: every IEC 61000-4-12 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.