The EMC Shop
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments EFT Burst Generators – Peak Voltage Repetition Frequency Rise Time: Burst Duration: 5 kHz 100 kHz Burst Period Residual Voltage Pulse Width (0.2
31 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 61000-4-5 testing. From the accredited scope text: “IEC 61000-4-5; KS C 9610-4-5; CNS 14676-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6; CNS 14676-6 Power Frequency Magnetic Immunity EN 61000-4-8; IEC 61000-4-8; KS C 9610-4-8; CNS 1” “IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; JIS C 61000-4-5; BS EN 61000-4-5; SANS 61000-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; BS EN 61000-4-6; KS C 9610-4-6 JIS C 61000-4-6; SANS 61000-” “IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; IEEE C62.41.1 (2002); IEEE C62.41.2 (2002); IEEE C62.45 (2002) Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Magnetic Field Immunity IEC 610” “IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Voltage Dips and Interrupts EN 61000-4-11; IEC 61000-4-11; KS C 9610-4-11 Generic and Product Family Standard”
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments EFT Burst Generators – Peak Voltage Repetition Frequency Rise Time: Burst Duration: 5 kHz 100 kHz Burst Period Residual Voltage Pulse Width (0.2
Longmont, CO, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; IEEE C62.41.1 (2002); IEEE C62.41.2 (2002); IEEE C62.45 (2002) Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Magnetic Field Immunity IEC 61000-4-8 (excluding short duration
Hudson, NH, US
IEC 61000-4-5; AS/NZS 61000-4-5; AS IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; AS/NZS 61000-4-6; AS IEC 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity EN 61000-4-8; IEC 61000-4
Lincoln, NE, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; AS/NZS 61000.4.5; SANS 61000-4-5 Radio Frequency, Conducted IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6; AS/NZS 61000.4.6; SANS 61000-4-6; ISO 11452-4 Power Line Magnetic Field IEC 61000
Knoxville, TN, US
IEC 61000-4-5:1995, 2014, 2014 + Amd.1:2017; IEC 61000-4-5; IEC 61000-4-12:1995, 2006, 2017; IEC 61000-4-12 On the following products or types of products: Instrumentation and Controls (I&C) equipment, including Industrial, Scientifi
Shenzhen, US
IEC 61000-4-5 Conducted Immunity BS EN IEC 61000-4-6; EN IEC 61000-4-6; IEC 61000-4-6
Duluth, GA, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6; IEC 61000-4-16; EN 61000-4-16 (16 to 37 A) Power Frequency Magnetic Field Immunity IEC 61000-4-8; EN 61000-4-8; KS C 961
Shirley, MA, US
IEC 61000-4-5, IEC 61000-4-8, IEC 61000-4-9, IEC 61000-4-11, IEC 61000-4-18, GR-1089 PQF Generator3 Output Voltage 3 Voltage Pulse Rise/ Fall Time3 Up to 480 V AC (1 to 5) µs 1.
Middlebury, VT, US
IEC 61000-4-5; EN/IEC 60945, Section 10.6
Marlboro, MA, US
IEC 61000-4-5; EN 61000-4-5; AS/NZS 61000.4.5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; AS/NZS 61000.4.6; KS C 9610-4-6 Magnetic Field Immunity IEC 61000-4-8; EN 61000-4-8; AS/NZS 61000.4.8; KS C 9610-4-8
Novi, MI, US
IEC 61000-4-5; EN 61000-4-5; KS C IEC 61000-4-5 IEC 61000-4-12; EN 61000-4-12; KS C IEC 61000-4-12 IEC 61000-4-6; EN 61000-4-6; KS C IEC 61000-4-6 IEC 61000-4-8; EN 61000-4-8; KS C IEC 61000-4-8 EN 61000-4-9; IEC 61000-4-9
San Jose, CA, US
IEC 61000-4-5:2014 2; IEC 61000-4-5 2; KS C 9610-4-5; EN 61000-4-5:2014 2; EN 61000-4-5 2 Conducted Immunity IEC 61000-4-6:2013 2; IEC 61000-4-6 2; KS C 9610-4-6; EN 61000-4-6:2014 2; EN 61000-4-6 2 Power Frequency Magnetic Field
Fremont, CA, US
IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Voltage Dips and Interrupts EN 61000-4-11; IEC 61000-4-11; KS C 9610-4-11 Generic and Product Family Standards CISPR 35 (only Annexe
Suite A Irvine, CA, US
IEC 61000-4-5; KS C 9610-4-5; EN/IEC 61000-4-6; KS C 9610-4-6; EN/IEC 61000-4-8; KS C 9610-4-8; EN/IEC 61000-4-11; KS C 9610-4-11
Milpitas, CA, US
IEC 61000-4-5, EN 61000-4-5; IEC 61000-4-6, EN 61000-4-6; IEC 61000-4-8, EN 61000-4-8; IEC 61000-4-11, EN 61000-4-11; IEC 61000-4-39, EN 61000-4-39 (9kHz to 26 MHz); IEC 60601-1-2, EN 60601-1-2 UK- Emissions & Immunity BS EN 550
Kentwood, MI, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity IEC 61000-4-8; EN 61000-4-8; KS C 9610-4-8 Pulse Magnetic Field Immunity IEC
Middlefield, OH, US
IEC 61000-4-5; KS C 9610-4-5 EN IEC 61000-4-12; BS EN IEC 61000-4-12 Conducted Immunity EN 61000-4-6; BS 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity EN 61000-4-8; BS 61000-4-8; IEC 61000-4-8;
San Jose, CA, US
IEC 61000-4-5 w/ GR 1089 CORE TIA-968-B Tektronix TDS7104, Schaffner MD-200A high voltage probe, Pearson 110 current coil
Pleasanton, CA, US
IEC 61000-4-5; EN 61000-4-5; SANS 61000-4-5 Conducted IEC 61000-4-6; EN 61000-4-6; SANS 61000-4-6 Power Frequency Magnetic Field IEC 61000-4-8; EN 61000-4-8; SANS 61000-4-8 Voltage Dips, Short Interrupts, and Voltage Variations
Downers Grove, IL, US
IEC 61000-4-5 (1995) + A1(2000); IEC 61000-4-5, Ed 1.1 (2005-11); EN 61000-4-5 (1995) + A1(2001); KN 61000-4-5 (2008-5); RRL Notice No. 2008-4 (May 20, 2008); IEC 61000-4-5; EN 61000-4-5; KN 61000-4-5; KS C 9610-4-5; IEEE C37.90.1
Milpitas, CA, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; JIS C 61000-4-5; BS EN 61000-4-5; SANS 61000-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; BS EN 61000-4-6; KS C 9610-4-6 JIS C 61000-4-6; SANS 61000-4-6 Magnetic Field Immunity IE
Shenzhen,Guangdong, US
IEC 61000-4-5; EN 61000-4-5; BS EN 61000-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; BS EN 61000-4-6 Voltage Dips/Short Interruptions IEC 61000-4-11; EN 61000-4-11; EN IEC 61000-4-11; BS EN 61000-4-11; BS EN IEC 61000-4-11
Oak Creek, WI, US
IEC 61000-4-5:2014 + A1:2017; Conducted Immunity IEC 61000-4-6:2013; Power Frequency Magnetic Field Immunity IEC 61000-4-8:2009; Voltage Dips & Interrupts IEC 61000-4-11:2004 + A1:2017; Immunity to radiated fields in close proxim
Romeoville, IL, US
IEC 61000-4-5:2005; IEC 61000-4-5:2014; RTCA/DO-160E:2004 (Section 17); RTCA/DO-160F:2007 (Section 17); RTCA/DO-160G:2010 (Section 17) Induced Signal Susceptibility RTCA/DO-160E:2004 (Section 19); RTCA/DO-160F:2007 (Section 19); R
Sterling, VA, US
IEC 61000-4-5:2014+A1:2017; IEC 61000-4-5; IEC 61000-4-5:2014+AMD1:2017; SANS 61000-4-5; KS C 9610-4-5;KS C 9610-4-5:2023; Conducted Immunity2 EN 61000-4-6; EN IEC 61000-4-6:2014+A1:2017; IEC 61000-4-6; IEC 61000-4-6:2013+AMD1:2
Westfield, IN, US
IEC 61000-4-5 (2005, Cor1:2009, 2014 + Amd1:2017) EFT/Burst Transient Immunity IEC 61000-4-4 (2012) 1When the date, edition, version, etc. is not identified in the scope of accreditation, laboratories may use the version that immediately
Boxborough, MA, US
IEC 61000-4-5 (excluding 6.2); IEC/EN 61000-4-12; KS C 9610-4-12; RTCA/DO-1602 C, D, E, F & G (Sections 17, 19, & 22) Conducted Immunity IEC/EN 61000-4-39; IEC/EN 61000-4-6; KS C 9610-4-6; IEC/EN 61000-4-16; RTCA/DO
Neenah, WI, US
IEC 61000-4-5; IEC 61000-1-3:2005 Conducted Immunity IEC 61000-4-6; IEC 61000-4-6:2008 Power Frequency and Magnetic Field IEC 61000-4-8 (Excluding Short Duration Mode) Voltage Dip, Interruptions, and Variations IEC 61000-4-11
San Diego, CA, US
IEC 61000-4-5; KN 61000-4-5; KS C 9610-4-25; SANS 61000-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KN 61000-4-6; KS C 9610-4-6; SANS 61000-4-6 Power Frequency Magnetic Field Immunity EN 61000-4-8; IEC 61000-4-8; KN 6100
Hillsboro, OR, US
IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field IEC 61000-4-8; EN 61000-4-8; KS C 9610-4-8 Voltage Dips, Short Interrupts, and Line Volt
Milpitas, CA, US
IEC 61000-4-5; KS C 9610-4-5; CNS 14676-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6; CNS 14676-6 Power Frequency Magnetic Immunity EN 61000-4-8; IEC 61000-4-8; KS C 9610-4-8; CNS 14676-8 Voltage Dips, Short I
This page is a fixed slice of the register: every IEC 61000-4-5 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.