The EMC Shop
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments EFT Burst Generators – Peak Voltage Repetition Frequency Rise Time: Burst Duration: 5 kHz 100 kHz Burst Period Residual Voltage Pulse Width (0.2
32 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 61000-4-4 testing. From the accredited scope text: “IEC 61000-4-4; EN 61000-4-4; BS EN 61000-4-4; KS C 9610-4-4; JIS C 61000-4-4; SANS 61000-4-4 Surge IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; JIS C 61000-4-5; BS EN 61000-4-5; SANS 61000-4-5 Conducte” “IEC 61000-4-4” “IEC 61000-4-4; KS C 9610-4-4 Surge Immunity EN 61000-4-5; IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Voltage Dips and Interrupts EN 61000-4-11; IEC 6100” “IEC 61000-4-4:2012 2; IEC 61000-4-4 2; KS C 9610-4-4; EN 61000-4-4:2012 2; EN 61000-4-4 2 Surge Immunity IEC 61000-4-5:2014 2; IEC 61000-4-5 2; KS C 9610-4-5; EN 61000-4-5:2014 2; EN 61000-4-5 2 Condu”
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments EFT Burst Generators – Peak Voltage Repetition Frequency Rise Time: Burst Duration: 5 kHz 100 kHz Burst Period Residual Voltage Pulse Width (0.2
Longmont, CO, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4
Hudson, NH, US
IEC 61000-4-4; AS/NZS 61000-4-4; KS C 9610-4-4 Surge Immunity EN 61000-4-5; IEC 61000-4-5; AS/NZS 61000-4-5; AS IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; AS/NZS 61000-4-6; AS IEC 61000-4-6; KS
Lincoln, NE, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4; AS/NZS 61000.4.4; SANS 61000-4-4 Surge Immunity IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; AS/NZS 61000.4.5; SANS 61000-4-5 Radio Frequency, Conducted IEC 61000-4-6; EN 61000-4-6; KS C
Sandown, NH, US
Test Technology: Test Method(s)2: Immunity (continued) Radiated Immunity (up to 6 GHz) IEC/EN 61000-4-3; KS C 9610-4-3 Electrical Fast Transient/Burst IEC/EN 61000-4-4; KS C 9610-4-4 Surge Immunity IEC/EN 61000-
Knoxville, TN, US
IEC 61000-4-4:1995, 2012; IEC 61000-4-4 Surge Withstand Capability (SWC) MIL-STD 461 E, F, & G, Method CS116; IEEE C62.41:1991, 2002; IEEE C62.45-1992, 2002; IEC 61000-4-5:1995, 2014, 2014 + Amd.1:2017; IEC 61000-4-5; IEC 61000-4-12:
Shenzhen, US
IEC 61000-4-4 Surge BS EN 61000-4-5; EN 61000-4-5; IEC 61000-4-5 Conducted Immunity BS EN IEC 61000-4-6; EN IEC 61000-4-6; IEC 61000-4-6
Duluth, GA, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4 Surge Immunity IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6; IEC 61000-4-16; EN 61000-4-16 (16 to 37 A) Power Frequency
Shirley, MA, US
IEC 61000-4-4, IEC 61000-4-5, IEC 61000-4-8, IEC 61000-4-9, IEC 61000-4-11, IEC 61000-4-18, GR-1089 PQF Generator3 Output Voltage 3 Voltage Pulse Rise/ Fall Time3 Up to 480 V AC (1 to 5
Middlebury, VT, US
IEC 61000-4-4; EN/IEC 60945, Section 10.5 Surge Immunity EN/IEC 61000-4-5; EN/IEC 60945, Section 10.6
Marlboro, MA, US
IEC 61000-4-4; EN 61000-4-4; AS/NZS 61000.4.4; KS C 9610-4-4 Surge Immunity IEC 61000-4-5; EN 61000-4-5; AS/NZS 61000.4.5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; AS/NZS 61000.4.6; KS C 9610-4-6 Magneti
Novi, MI, US
IEC 61000-4-4; EN 61000-4-4; KS C IEC 61000-4-4 IEC 61000-4-5; EN 61000-4-5; KS C IEC 61000-4-5 IEC 61000-4-12; EN 61000-4-12; KS C IEC 61000-4-12 IEC 61000-4-6; EN 61000-4-6; KS C IEC 61000-4-6 IEC 61000-4-8; EN 61000-4-8
San Jose, CA, US
IEC 61000-4-4:2012 2; IEC 61000-4-4 2; KS C 9610-4-4; EN 61000-4-4:2012 2; EN 61000-4-4 2 Surge Immunity IEC 61000-4-5:2014 2; IEC 61000-4-5 2; KS C 9610-4-5; EN 61000-4-5:2014 2; EN 61000-4-5 2 Conducted Immunity IEC 61000-4-6:2013
Fremont, CA, US
IEC 61000-4-4; KS C 9610-4-4 Surge Immunity EN 61000-4-5; IEC 61000-4-5; KS C 9610-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KS C 9610-4-6 Voltage Dips and Interrupts EN 61000-4-11; IEC 61000-4-11; KS C 9610-4-11 Gener
Suite A Irvine, CA, US
IEC 61000-4-4; KS C 9610-4-4; EN/IEC 61000-4-5; KS C 9610-4-5; EN/IEC 61000-4-6; KS C 9610-4-6; EN/IEC 61000-4-8; KS C 9610-4-8; EN/IEC 61000-4-11; KS C 9610-4-11
Milpitas, CA, US
IEC 61000-4-4, EN 61000-4-4; IEC 61000-4-5, EN 61000-4-5; IEC 61000-4-6, EN 61000-4-6; IEC 61000-4-8, EN 61000-4-8; IEC 61000-4-11, EN 61000-4-11; IEC 61000-4-39, EN 61000-4-39 (9kHz to 26 MHz); IEC 60601-1-2, EN 60601-1-2 UK-
Kentwood, MI, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4 Surge Immunity IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity IEC 61000-4-8; EN 6100
Middlefield, OH, US
IEC 61000-4-4
San Jose, CA, US
IEC 61000-4-4 w/ Tek TDS7104 & Haefely PAT 50/1000 Surge Generators3 – Front Time (±) Rise Time (±) Duration (±) Peak Voltage (±) Peak Current (±) AC Mains Sync (0.5 to 13) µs (0.5 to 13) µs (5 to
Pleasanton, CA, US
IEC 61000-4-4; EN 61000-4-4; SANS 61000-4-4 Surge IEC 61000-4-5; EN 61000-4-5; SANS 61000-4-5 Conducted IEC 61000-4-6; EN 61000-4-6; SANS 61000-4-6 Power Frequency Magnetic Field IEC 61000-4-8; EN 61000-4-8; SANS 61000-4-8 Vol
Downers Grove, IL, US
IEC 61000-4-4, Ed. 2.0 (2004-07); IEC 61000-4-4, Ed. 2.1 (2011); IEC 61000-4-4 (1995) + A1(2000) + A2(2001); KN 61000-4-4 (2008-5); RRL Notice No. 2008-5 (May 20, 2008); IEC 61000-4-4; EN 61000-4-4; KN 61000-4-4; KS C 9610-4-4; ECE
Milpitas, CA, US
IEC 61000-4-4; EN 61000-4-4; BS EN 61000-4-4; KS C 9610-4-4; JIS C 61000-4-4; SANS 61000-4-4 Surge IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; JIS C 61000-4-5; BS EN 61000-4-5; SANS 61000-4-5 Conducted Immunity IEC 61000-4-6; EN 61
Shenzhen,Guangdong, US
IEC 61000-4-4; EN 61000-4-4; BS EN 61000-4-4 Surge (Power Ports only) IEC 61000-4-5; EN 61000-4-5; BS EN 61000-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; BS EN 61000-4-6 Voltage Dips/Short Interruptions IEC 61000-4-11;
Oak Creek, WI, US
IEC 61000-4-4:2012; Surge Immunity IEC 61000-4-5:2014 + A1:2017; Conducted Immunity IEC 61000-4-6:2013; Power Frequency Magnetic Field Immunity IEC 61000-4-8:2009; Voltage Dips & Interrupts IEC 61000-4-11:2004 + A1:2017; Immunit
San Clemente, CA, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4
Romeoville, IL, US
IEC 61000-4-4:2012 Surge Immunity & Voltage Spikes IEC 61000-4-5:2005; IEC 61000-4-5:2014; RTCA/DO-160E:2004 (Section 17); RTCA/DO-160F:2007 (Section 17); RTCA/DO-160G:2010 (Section 17) Induced Signal Susceptibility RTCA/DO-160E
Sterling, VA, US
IEC 61000-4-4:2012+A1:2021; IEC 61000-4-4; IEC 61000-4-4:2012+AMD1:2021 ; SANS 61000-4-4; KS C 9610-4-4; KS C 9610-4-4:2023 Surge Immunity2 EN 61000-4-5; EN IEC 61000-4-5:2014+A1:2017; IEC 61000-4-5; IEC 61000-4-5:2014+AMD1:2017; SA
Westfield, IN, US
IEC 61000-4-4 (2012) 1When the date, edition, version, etc. is not identified in the scope of accreditation, laboratories may use the version that immediately precedes the current version for a period of one year from the date of publica
Boxborough, MA, US
Tests: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC/EN 61000-4-2; KS C 9610-4-2; RTCA/DO-1602 D, E, F, & G (Section 25); MIL-STD-1686; MIL-STD-461G (CS118) Radiated Immunity IEC/EN 61000-4-3; KS C 9610-4-3; RT
Neenah, WI, US
IEC 61000-4-4; IEC 61000-4-4:2004 Electrical Surge IEC 61000-4-5; IEC 61000-1-3:2005 Conducted Immunity IEC 61000-4-6; IEC 61000-4-6:2008 Power Frequency and Magnetic Field IEC 61000-4-8 (Excluding Short Duration Mode) Volta
San Diego, CA, US
IEC 61000-4-4; KN 61000-4-4; KS C 9610-4-4; SANS 61000-4-4 Surge Immunity EN 61000-4-5; IEC 61000-4-5; KN 61000-4-5; KS C 9610-4-25; SANS 61000-4-5 Conducted Immunity EN 61000-4-6; IEC 61000-4-6; KN 61000-4-6; KS C 9610-4-6; SANS 6
Hillsboro, OR, US
IEC 61000-4-4; EN 61000-4-4; KS C 9610-4-4 Surge IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5 Conducted Immunity IEC 61000-4-6; EN 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field IEC 61000-4-8; EN 61000-4-8; KS C 9610-4-
This page is a fixed slice of the register: every IEC 61000-4-4 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.