The EMC Shop
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments CDNs (Coupling & De- Coupling Network) – Insertion Loss Impedance Phase 150 kHz to 400 MHz 150 kHz to 400 MHz 150 kHz to 400 MHz 0.11 dB 0.
53 laboratories in United States are accredited by A2LA under ISO/IEC 17025 to perform IEC 61000-3-2 testing. Most frequently tested analytes via this method in United States: Current Harmonics. From the accredited scope text: “IEC 61000-3-2; BS EN 61000-3-3; EN IEC 61000-3-3 Immunity Generic or Product Specific IEC 60601-1-2 1; EN 60601-1-2:2015; BS 60601-1-2 2015; EN 60601-1-2:2007/AC:2010; BS 60601-1-2:2007/AC:2010; EN 14” “IEC 61000-3-2; EN 61000-3-2; IEC 61000-3-12; EN 61000-3-12; SANS 61000-3-2; JIS C 61000-3-2” “IEC 61000-3-2; EN 61000-3-2; KS C 9610-3-2; IEC 61000-3-3; EN 61000-3-3; JIS C 61000-3-2; KS C 9610-3-3 Intentional Emissions Unlicensed Transmitters U.S. (FCC) Intentional Radiators 47 CFR, FCC Part” “IEC 61000-3-2; JIS C 61000-3-2 (2011); Flicker AS/NZS 2279.3; AS/NZS 61000-3-3; EN 61000-3-3; IEC 61000-3-3; AS/NZS 61000-3-11; EN 61000-3-11; IEC 61000-3-11; Immunity Electrostatic Discharge (ESD) EN”
Rocklin, CA, US
Parameter/Equipment Range CMC2, 3 (±) Comments CDNs (Coupling & De- Coupling Network) – Insertion Loss Impedance Phase 150 kHz to 400 MHz 150 kHz to 400 MHz 150 kHz to 400 MHz 0.11 dB 0.
Bothell, WA, US
Test Technology: Test Method(s) 1, 2, 3: Generic / Product Family / Product Specific Standards (cont.) ISO 80601-2-56, clause 202; ISO 80601-2-61 (2017), clause 202; ISO 80601-2-61 (2011), clause 202; ISO 9919 Ed. 2.0 (2005), clau
Longmont, CO, US
(A2LA Cert No. 214.43) Revised 2/16/2026 Page 2 of 3 Test Technology Test Methods 1: Surge IEC 61000-4-5; EN 61000-4-5; KS C 9610-4-5; IEEE C62.41.1 (2002); IEEE C62.41.2 (2002); IEEE C62.45 (2002) Conducted Immunity IEC 61000-4-6;
Pottstown, PA, US
Test Technology: Test Methods 1, 2: Conducted Immunity EN 61000-4-6; IEC 61000-4-6 Magnetic Field Immunity EN 61000-4-8; IEC 61000-4-8 Voltage Dips, Short Interruptions, and Voltage Variations EN 61000-4-11; IEC 61000-4-11 Pr
Hillsboro, OR, US
Test Technology: Test Method(s) 1, 2: Generic / Product Family / Product Specific Standards (cont.) EN 60601-2-37 (2008) + A1 (2015), clause 202; IEC 60601-2-47 Ed. 2.0 (2012-02), clause 202; IEC 60601-2-49 (2011), clause 202; E
Hudson, NH, US
Test Technology: Test Method(s) 1: Voltage Fluctuations and Flicker (International) EN 61000-3-3; IEC 61000-3-3; AS/NZS 61000-3-3; KS C 9610-3-3 Immunity Electrostatic Discharge (ESD) EN 61000-4-2; IEC 61000-4-2; AS/NZS 61000-4-2
Lincoln, NE, US
IEC 61000-3-2; EN 61000-3-2; AS/NZS 61000.3.2; KS 9610-3-2; SANS 61000-3-2 Voltage Fluctuations and Flicker IEC 61000-3-3; EN 61000-3-3; AS/NZS 61000.3.3; KS 9610-3-2; SANS 61000-3-3 Magnetic Fields IATA DGR Section 3.9.2.2 and P
Torrance, CA, US
Parameter/Range Frequency CMC2, 3 (±) Comments Current Probe/Injection Probe Calibration Fixture – VSWR (Linear) Insertion Loss (dB) ∆ Insertion Loss (dB) 10 Hz to 10 MHz (>10 to 400)
Sandown, NH, US
IEC 61000-3-2; EN 61000-3-2; KS C 9610-3-2; IEC 61000-3-3; EN 61000-3-3; JIS C 61000-3-2; KS C 9610-3-3 Intentional Emissions Unlicensed Transmitters U.S. (FCC) Intentional Radiators 47 CFR, FCC Part 15, Subpart C (using ANS
Irvine, CA, US
(A2LA Certificate No. 3310.04) Revised 07/28/2025 Page 5 of 13 Test Technology: Test Method(s) 2: Generic / Product Family / Product Specific EMC Standards (con
Knoxville, TN, US
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 ANALYSIS AND MEASUREMENT SERVICES CORPORATION (AMS) AMS Technology Center 9119 Cross Park Drive Knoxville, TN 37923 Eternity Perry Phone 865 691 1756 Ext: 168 Email: eternity@ams-c
Alpharetta, GA, US
IEC 61000-3-2; JIS C 61000-3-2 Voltage Fluctuations & Flicker (single phase only) EN 61000-3-3; IEC 61000-3-3 Intentional Emissions Unlicensed Transmitters U.S. (FCC) Intentional Radiators 47 CFR, FCC Part 15 C Unl
Shenzhen, US
Test Technology: Test Method(s): Power Frequency Magnetic Fields BS EN 61000-4-8; EN 61000-4-8; IEC 61000-4-8 Voltage Dips and Interrupts BS EN IEC 61000-4-11; EN IEC 61000-4-11; IEC 61000-4-11 Ring Wave
San Diego, CA, US
IEC 61000-3-2; IEC 61000-3-11; IEC 61000-4-7; CNS-HFC-III Agilent 3458A-001 Tektronix TDS5104B Yokogawa WT3000 w/ CT
Duluth, GA, US
Tests: Standard(s) 2: Generic and Product Specific EMC Standards Laboratory IEC/EN 61326-1 (Ed. 2, Ed. 3); IEC/EN 61326-2-1 (Ed. 2, Ed. 3); IEC/EN 61326-2-2 (Ed. 2, Ed. 3); IEC/EN 61326-2-3 (Ed. 2, Ed. 3); IEC/EN 61326-2-4 (Ed. 2,
Shirley, MA, US
Parameter/Equipment Range CMC2, 4 (±) Comments Transient Surge Generator3 – Open Circuit Voltage: Rise/Front Time Time to Half-Value Short Circuit Current: Rise/Front Time Time to Half-Value Ring Wav
Middlebury, VT, US
IEC 61000-3-2; EN/IEC 61000-3-3 Immunity Electrostatic Discharge (ESD) EN/IEC 61000-4-2; IEC 60945, Section 10.9 Radiated Immunity EN/IEC 61000-4-3; IEC 60945, Section 10.4 Electrical Fast Transient EN/IEC 61000-4-4; EN/IEC 60
Marlboro, MA, US
Test Technology: Test Method(s)1: Conducted (continued) CNS 13438; CNS 15936 (2016); VCCI V-2, V-3, V-4; VCCI 32-1; VCCI-CISPR 32 (2016); TCVN 7189; QCVN 118:2018/BTTTT; EN 60947-5-2 (Section 7.2.6.3); EN 61326-3-1 Immunity
Novi, MI, US
IEC 61000-3-2; KS C IEC 61000-3-2; IEC 61000-3-12; AS/NZS 61000.3.12; EN 61000-3-12; KS C IEC 61000-3-12
Plymouth, MI, US
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 DEKRA CERTIFICATION INC. 47603 Halyard Dr. Plymouth, MI 48170 Daniel Sigouin Phone: 734-496-5116 ELECTRICAL Valid To: November 30, 2027
Plymouth, MI, US
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 TUV SUD AMERICA – PLYMOUTH 47523 Clipper Street Plymouth, MI 48170 William (Mac) Elliott Phone: 813 284 2736 ELECTRICAL Valid to: June 30, 2026 Certificate Number:
San Jose, CA, US
Test Technology: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC 61000-4-2:2008 2; IEC 61000-4-2 2; KS C 9610-4-2; EN 61000-4-2:2009 2; EN 61000-4-2 2 Radiated Immunity IEC 61000-4-3:2006; IEC 61000-4-3; KS C 9610-4
Fremont, CA, US
Test: Test Method(s) 1: Emissions (cont.) Voltage Fluctuations EN 61000-3-3; IEC 61000-3-3; KS C 9610-3-3; BS EN IEC 61000-3-3; IEC 61000-3-12; EN 61000-3-12; KS C 9610-3-12 Immunity Electrostatic Discharge (ESD) EN 61000-4-2;
Suite A Irvine, CA, US
Test Technology: Test Method(s) 1, 2: Family Product or Industry Specific Specifications IEC/EN 61000-6-13; IEC/EN 61000-6-23; IEC/EN 61000-6-33; IEC/EN 61000-6-43; KS C 9610-6-1; KS C 9610-6-2; KS C 9610-6-3; KS C 9610-6-4;
Milpitas, CA, US
Test Test Method(s) Annex No.86 Annex No.87 (LTE Land mobile station, Femtocell Base Station, Base Station) Article 2 paragraph 1 item (11)-19; Article 2 paragraph 1 item (11)-20; Article 2 paragraph 1 item (11)-20-2; Article 2
Glencoe, MN, US
IEC 61000-3-2; IEC 61000-3-2; EN 61000-3-2; EN IEC 61000-3-2; JIS C 61000-3-2; KS C 9610-3-2 Flicker BS EN IEC 61000-3-3; IEC 61000-3-3; EN 61000-3-3; KS C 9610-3-3 Immunity Electrostatic Discharge (ESD) BS EN 61000-4-2; IEC 610
Woburn, MA, US
IEC 61000-3-2 (2009, 2014, 2018 + A1:2021); AS/NZS 61000.3.2; KN 61000-3-2; KS C 9610-3-2 Voltage Fluctuations and Flicker EN 61000-3-3 (2008, 2013 + A1:2021); IEC 61000-3-3 (2008, 2013 + A1:2021); AS/NZS 61000.3.3; KN 61000-3-3
Fullerton, CA, US
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 ELEMENT U.S. SPACE & DEFENSE 1536 East Valencia Drive Fullerton, California 92831 Vanessa Garcia Phone: (714) 879-6110 E-mail: vanessa.garcia@elementdefense.com Website: www.eleme
Kentwood, MI, US
Test: Test Method(s) 1,2 : Laboratory (cont.) IEC 61010-2-051; IEC 61010-2-061; IEC 61010-2-081; IEC 61010-2-101; IEC 61010-2-201; UL 61010-1; CAN/CSA C22.2 No. 1010.1; CAN/CSA C22.2 No. 61010-1; AS/NZS 61010; UL 61010-2-010; CS
San Jose, CA, US
18855 Adams Court Building AM1, AM2 Morgan Hill, CA 95037 Test Technology: Test Method(s): Emissions Radiated and Conducted (3m semi-anechoic chambers) CFR 47 FCC Part 15, Subpart B (using ANSI C63.4:2014); CFR 47 FCC Part 18 (
Middlefield, OH, US
IEC 61000-3-2; BS EN 61000-3-3; EN IEC 61000-3-3 Immunity Generic or Product Specific IEC 60601-1-2 1; EN 60601-1-2:2015; BS 60601-1-2 2015; EN 60601-1-2:2007/AC:2010; BS 60601-1-2:2007/AC:2010; EN 14982; BS 14982; ISO 14982; IEC 6
San Jose, CA, US
SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017 & ANSI/NCSL Z540-1-1994 & ANSI/NCSL Z540-3-2006 TRESCAL, INC 625 River Oaks Pkwy San Jose, CA 95134 Eddison Wong Phone: 408 444 9998 CALIBRATION Valid To: August 31
Pleasanton, CA, US
IEC 61000-3-2; EN 61000-3-2; IEC 61000-3-12; EN 61000-3-12; SANS 61000-3-2; JIS C 61000-3-2
Cedar Park, TX, US
Parameter/Range Frequency CMC2 () Comments E-Field Probe – Frequency Response, Linearity Up to 30 dBV/m (Up to 20 V/m) Frequency Response, Linearity Up to 30 dBV/m (Up to 20 V/m) Isotropicity (10 to -60
Littleton, MA, US
Test Technology: Test Method(s) 1,2: Product Family and Industry Specific Standards (includes Emissions and Immunity Tests and EN and IEC equivalents) ANSI C62.41; ANSI T1.315:2007; ANSI C63.27:2021; AS
Downers Grove, IL, US
Test Technology: Test Method(s)2: EN 61000-4-6; KN 61000-4-6; KS C 9610-4-6 Power Frequency Magnetic Field Immunity (Down to 3 A/m) IEC 61000-4-8 (1993) + A1(2000); IEC 61000-4-8 (2009); EN 61000-4-8 (1994) + A1(2000); KN 61000-4
Milpitas, CA, US
(A2LA Certificate No. 4201.01) Revised 01/17/2026 Page 10 of 12 1177 Comstock Road Hollister, CA 95023 Test Technology: Test Methods(s): Emissions Radiated (10m OATS, up to 1 GHz) 47 CFR, FCC Part 15 Subpart B (using ANSI C63
Fremont, CA, US
IEC 61000-3-2; KS C 9610-3-2; BS EN 61000-3-12; EN 61000-3-12; IEC 61000-3-12; KS C 9610-3-12; AS/NZS 61000-3-12 Flicker BS EN 61000-3-3; EN 61000-3-3; IEC 61000-3-3; KS C 9610-3-3; BS EN 61000-3-11; EN 61000-3-11; IEC 61000-3-11; KS C
Shenzhen,Guangdong, US
IEC 61000-3-2; EN 61000-3-2; JIS C61000-3-2; EN IEC 61000-3-2; BS EN IEC 61000-3-2; BS EN 61000-3-2 Voltage Changes, Voltage Fluctuations, and Flicker IEC 61000-3-3; EN 61000-3-3; BS EN 61000-3-3
Oak Creek, WI, US
IEC 61000-3-2:2014 Voltage changes, fluctuations & flicker IEC 61000-3-3:2013 ESD Immunity IEC 61000-4-2:2008; Immunity to radiated, radio-frequency electromagnetic fields IEC 61000-4-3:2020 EFT / Burst Immunity IEC 61000-4-4:20
San Clemente, CA, US
IEC 61000-3-2; EN 61000-3-2; IEC 61000-3-3; EN 61000-3-3; AS/NZS 61000.3.2; AS/NZS 61000.3.3; GB17625.1; KS C 9610-3-2:2020/KS C9610-3-12:2020; KS C 9610-3-3:2020/KS C9610-3-11:2017 Immunity Electrostatic Discharge (ESD) IEC 61000
Jefferson Hills, PA, US
IEC 61000-3-2 Immunity ESD IEC/EN 61000-4-2 Radiated, Radio-frequency, Electromagnetic Field Immunity (80 MHz to 6000 MHz) IEC/EN 61000-4-3 Electrical Fast Transient / Burst Immunity IEC/EN 61000-4-4 Surge Immunity I
Romeoville, IL, US
Technology: Test Method(s): Radiated Emissions Measurements (H-field 30Hz to 30 MHz) CFR 47, FCC Part 15C (using ANSI C63.10-2013); CFR 47, FCC Part 18 (using FCC MP-5:1986); MIL-STD 461E:1999 (Method RE101); MIL-STD 461F:2007 (Meth
Sunnyvale, CA, US
IEC 61000-3-2; JIS C 61000-3-2 (2011); Flicker AS/NZS 2279.3; AS/NZS 61000-3-3; EN 61000-3-3; IEC 61000-3-3; AS/NZS 61000-3-11; EN 61000-3-11; IEC 61000-3-11; Immunity Electrostatic Discharge (ESD) EN 61000-4-2; IEC 61000-4-
Auburn Hills, MI, US
Test Technology: Test Method(s)1: Electrical Loads ISO-16750-2 ( excluding sections 4.11 & 4.12); GMW 3172 Sections 8.2 & 9.2 (excluding section 9.2.16) Electrical Testing ISO 21498-2; ISO 21780 Automotive & Vehicle Product S
Sterling, VA, US
IEC 61000-3-2:2019+A1:2021+A2:2024 ; IEC 61000-3-2; IEC 61000-3-2:2018+AMD1:2020+AMD2:2024 (CSV) SANS 61000-3-2; SANS 61000-3-2:2009 (Edition 3.2) KS C 9610-3-2; KS C 9610-3-2:2023 Voltage Fluctuation and Flicker EN 61000-3-3; EN IEC
Westfield, IN, US
Test Technology: Test Method(s)1: Surge Transient Immunity IEC 61000-4-5 (2005, Cor1:2009, 2014 + Amd1:2017) EFT/Burst Transient Immunity IEC 61000-4-4 (2012) 1When the date, edition, version, etc. is not identified in the scope of accre
Howell, MI, US
Parameter/Range Frequency CMC2, 4, 6, 7 (±) Comments Absolute Power3 – Measure (+10 to +20) dBm (-30 to +10) dBm (-70 to -20) dBm (-10 to 0) dBm (-60 to -10) dBm 100 kHz to 4.2 GHz (4.
Boxborough, MA, US
Tests: Test Method(s) 1: Immunity Electrostatic Discharge (ESD) IEC/EN 61000-4-2; KS C 9610-4-2; RTCA/DO-1602 D, E, F, & G (Section 25); MIL-STD-1686; MIL-STD-461G (CS118) Radiated Immunity IEC/EN 61000-4-3; KS C 9610-4-3; RT
Neenah, WI, US
IEC 61000-3-2; EN 61000-3-2 Voltage Fluctuations and Flicker IEC 61000-3-3; EN 61000-3-3 Immunity Electrostatic Discharge (ESD) IEC 61000-4-2 Radiated Immunity IEC 61000-4-3 (up to 6 GHz & 10V/m) Electrical Fast Transients
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This page is a fixed slice of the register: every IEC 61000-3-2 scope we hold for United States. Search narrows it further by city, accreditation body, or a term from the scope text itself.
Search labs in United StatesAmerican Association for Laboratory Accreditation (A2LA) is the primary accreditation body issuing ISO/IEC 17025 accreditation for testing laboratories in United States.
ISO/IEC 17025 is the international standard for the competence of testing and calibration laboratories. Accreditation to this standard provides independent confirmation that a laboratory operates a quality management system and is technically competent to produce valid results within its declared scope.